JPH0381297B2 - - Google Patents
Info
- Publication number
- JPH0381297B2 JPH0381297B2 JP62032504A JP3250487A JPH0381297B2 JP H0381297 B2 JPH0381297 B2 JP H0381297B2 JP 62032504 A JP62032504 A JP 62032504A JP 3250487 A JP3250487 A JP 3250487A JP H0381297 B2 JPH0381297 B2 JP H0381297B2
- Authority
- JP
- Japan
- Prior art keywords
- groove
- film
- trench
- polycrystalline silicon
- coating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 31
- 239000000758 substrate Substances 0.000 claims description 22
- 239000004065 semiconductor Substances 0.000 claims description 21
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 20
- 150000002500 ions Chemical class 0.000 claims description 20
- 239000011248 coating agent Substances 0.000 claims description 18
- 238000000576 coating method Methods 0.000 claims description 18
- 238000000034 method Methods 0.000 claims description 17
- 238000004519 manufacturing process Methods 0.000 claims description 12
- 235000012239 silicon dioxide Nutrition 0.000 claims description 9
- 239000000377 silicon dioxide Substances 0.000 claims description 9
- 230000001590 oxidative effect Effects 0.000 claims 1
- 239000012535 impurity Substances 0.000 description 31
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 14
- 229910052710 silicon Inorganic materials 0.000 description 14
- 239000010703 silicon Substances 0.000 description 14
- 239000003990 capacitor Substances 0.000 description 10
- 238000005468 ion implantation Methods 0.000 description 10
- 229920002120 photoresistant polymer Polymers 0.000 description 10
- 229910052581 Si3N4 Inorganic materials 0.000 description 8
- 230000007423 decrease Effects 0.000 description 8
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 8
- 238000000206 photolithography Methods 0.000 description 6
- 230000015556 catabolic process Effects 0.000 description 5
- 238000005530 etching Methods 0.000 description 5
- 238000002955 isolation Methods 0.000 description 4
- UMVBXBACMIOFDO-UHFFFAOYSA-N [N].[Si] Chemical compound [N].[Si] UMVBXBACMIOFDO-UHFFFAOYSA-N 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 230000005684 electric field Effects 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000002513 implantation Methods 0.000 description 2
- 230000002265 prevention Effects 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 238000000151 deposition Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000007943 implant Substances 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000015654 memory Effects 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62032504A JPS63200528A (ja) | 1987-02-17 | 1987-02-17 | 半導体装置の製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62032504A JPS63200528A (ja) | 1987-02-17 | 1987-02-17 | 半導体装置の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63200528A JPS63200528A (ja) | 1988-08-18 |
JPH0381297B2 true JPH0381297B2 (de) | 1991-12-27 |
Family
ID=12360818
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62032504A Granted JPS63200528A (ja) | 1987-02-17 | 1987-02-17 | 半導体装置の製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63200528A (de) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5874346A (en) * | 1996-05-23 | 1999-02-23 | Advanced Micro Devices, Inc. | Subtrench conductor formation with large tilt angle implant |
US5767000A (en) * | 1996-06-05 | 1998-06-16 | Advanced Micro Devices, Inc. | Method of manufacturing subfield conductive layer |
WO2010051266A2 (en) * | 2008-10-31 | 2010-05-06 | Applied Materials, Inc. | Improving the conformal doping in p3i chamber |
-
1987
- 1987-02-17 JP JP62032504A patent/JPS63200528A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS63200528A (ja) | 1988-08-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |