JPH0376846B2 - - Google Patents
Info
- Publication number
- JPH0376846B2 JPH0376846B2 JP14879785A JP14879785A JPH0376846B2 JP H0376846 B2 JPH0376846 B2 JP H0376846B2 JP 14879785 A JP14879785 A JP 14879785A JP 14879785 A JP14879785 A JP 14879785A JP H0376846 B2 JPH0376846 B2 JP H0376846B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- hologram
- optical system
- spherical wave
- illuminates
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003287 optical effect Effects 0.000 claims description 26
- 238000005286 illumination Methods 0.000 claims description 15
- 238000000034 method Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 4
- 239000007788 liquid Substances 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000007654 immersion Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000004556 laser interferometry Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- XKRFYHLGVUSROY-UHFFFAOYSA-N argon Substances [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14879785A JPS629203A (ja) | 1985-07-05 | 1985-07-05 | 楕円面鏡の表面形状測定用ホログラム干渉計 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14879785A JPS629203A (ja) | 1985-07-05 | 1985-07-05 | 楕円面鏡の表面形状測定用ホログラム干渉計 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS629203A JPS629203A (ja) | 1987-01-17 |
JPH0376846B2 true JPH0376846B2 (enrdf_load_stackoverflow) | 1991-12-06 |
Family
ID=15460918
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14879785A Granted JPS629203A (ja) | 1985-07-05 | 1985-07-05 | 楕円面鏡の表面形状測定用ホログラム干渉計 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS629203A (enrdf_load_stackoverflow) |
-
1985
- 1985-07-05 JP JP14879785A patent/JPS629203A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS629203A (ja) | 1987-01-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6806965B2 (en) | Wavefront and intensity analyzer for collimated beams | |
JP2000501508A (ja) | 半導体ウエファの厚さ誤差測定用干渉計 | |
JPH0324432A (ja) | 光学系、特に眼鏡用レンズの位相検出検査用光学装置 | |
US6909510B2 (en) | Application of the phase shifting diffraction interferometer for measuring convex mirrors and negative lenses | |
JPH0250411B2 (enrdf_load_stackoverflow) | ||
RU168564U1 (ru) | Голографический интерферометр | |
US3764216A (en) | Interferometric apparatus | |
JP3851160B2 (ja) | 測長装置 | |
JPH0376846B2 (enrdf_load_stackoverflow) | ||
JPH0575246B2 (enrdf_load_stackoverflow) | ||
JPH0223802B2 (enrdf_load_stackoverflow) | ||
JPH0437362B2 (enrdf_load_stackoverflow) | ||
US3833301A (en) | Testing of spherical surfaces by holographic interference | |
JPH0552881B2 (enrdf_load_stackoverflow) | ||
Patorski | Moiré methods in interferometry | |
CN118999378B (zh) | 一种数字全息显微同步测量方法及装置 | |
JPH116784A (ja) | 非球面形状測定装置および測定方法 | |
Feng et al. | Research on simulation model of two-wavelength digital holography for measuring microstructures based on Zemax | |
JPH05157532A (ja) | 測定用計算機ホログラム及びそれを用いた計測方法 | |
JP2899688B2 (ja) | 円筒面検査用ホログラム干渉計 | |
JPS6067834A (ja) | レンズ横収差測定用ホログラムシアリング干渉計 | |
JPH11325848A (ja) | 非球面形状測定装置 | |
JPH0140285B2 (enrdf_load_stackoverflow) | ||
JPH0140284B2 (enrdf_load_stackoverflow) | ||
Matsuda et al. | A differential interference contrast system incorporating a Murty interferometer and holographic correction |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |