JPH0376406B2 - - Google Patents
Info
- Publication number
- JPH0376406B2 JPH0376406B2 JP5675282A JP5675282A JPH0376406B2 JP H0376406 B2 JPH0376406 B2 JP H0376406B2 JP 5675282 A JP5675282 A JP 5675282A JP 5675282 A JP5675282 A JP 5675282A JP H0376406 B2 JPH0376406 B2 JP H0376406B2
- Authority
- JP
- Japan
- Prior art keywords
- brightness
- laser spot
- video signal
- distribution
- peak value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000034 method Methods 0.000 claims description 9
- 238000007689 inspection Methods 0.000 claims description 6
- 238000000926 separation method Methods 0.000 description 7
- 238000003705 background correction Methods 0.000 description 6
- 239000002131 composite material Substances 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5675282A JPS58174820A (ja) | 1982-04-07 | 1982-04-07 | レ−ザスポツト検査方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5675282A JPS58174820A (ja) | 1982-04-07 | 1982-04-07 | レ−ザスポツト検査方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58174820A JPS58174820A (ja) | 1983-10-13 |
JPH0376406B2 true JPH0376406B2 (enrdf_load_stackoverflow) | 1991-12-05 |
Family
ID=13036249
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5675282A Granted JPS58174820A (ja) | 1982-04-07 | 1982-04-07 | レ−ザスポツト検査方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58174820A (enrdf_load_stackoverflow) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3246021B2 (ja) * | 1993-01-06 | 2002-01-15 | ミノルタ株式会社 | 二次元測色計 |
JP2007212241A (ja) * | 2006-02-08 | 2007-08-23 | Ministry Of Public Management Home Affairs Posts & Telecommunications | 電波発射源可視化装置及びその方法 |
-
1982
- 1982-04-07 JP JP5675282A patent/JPS58174820A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS58174820A (ja) | 1983-10-13 |
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