JPH036650B2 - - Google Patents
Info
- Publication number
- JPH036650B2 JPH036650B2 JP59196645A JP19664584A JPH036650B2 JP H036650 B2 JPH036650 B2 JP H036650B2 JP 59196645 A JP59196645 A JP 59196645A JP 19664584 A JP19664584 A JP 19664584A JP H036650 B2 JPH036650 B2 JP H036650B2
- Authority
- JP
- Japan
- Prior art keywords
- alignment
- mask
- wafer
- pattern
- reduction projection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7049—Technique, e.g. interferometric
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59196645A JPS6175522A (ja) | 1984-09-21 | 1984-09-21 | 縮小投影式アライメント装置 |
| US06/762,329 US4701050A (en) | 1984-08-10 | 1985-08-05 | Semiconductor exposure apparatus and alignment method therefor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59196645A JPS6175522A (ja) | 1984-09-21 | 1984-09-21 | 縮小投影式アライメント装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6175522A JPS6175522A (ja) | 1986-04-17 |
| JPH036650B2 true JPH036650B2 (Direct) | 1991-01-30 |
Family
ID=16361216
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59196645A Granted JPS6175522A (ja) | 1984-08-10 | 1984-09-21 | 縮小投影式アライメント装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6175522A (Direct) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2574460B2 (ja) * | 1989-05-08 | 1997-01-22 | 松下電子工業株式会社 | マスクならびにマスクとウエーハとの位置合わせ方法 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57142612A (en) * | 1981-02-27 | 1982-09-03 | Nippon Kogaku Kk <Nikon> | Alignment optical system of projection type exposure device |
| JPS58112330A (ja) * | 1981-12-25 | 1983-07-04 | Nippon Kogaku Kk <Nikon> | 投影型露光装置 |
| FR2523323A1 (fr) * | 1982-03-09 | 1983-09-16 | Euromask | Dispositif d'alignement pour machines de fabrication de circuits integres |
| JPS58162039A (ja) * | 1982-03-23 | 1983-09-26 | Nippon Kogaku Kk <Nikon> | 投影型露光装置 |
| JPS58162954A (ja) * | 1982-03-24 | 1983-09-27 | Nippon Kogaku Kk <Nikon> | 投影型露光装置 |
-
1984
- 1984-09-21 JP JP59196645A patent/JPS6175522A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6175522A (ja) | 1986-04-17 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |