JPH0365987U - - Google Patents

Info

Publication number
JPH0365987U
JPH0365987U JP12729789U JP12729789U JPH0365987U JP H0365987 U JPH0365987 U JP H0365987U JP 12729789 U JP12729789 U JP 12729789U JP 12729789 U JP12729789 U JP 12729789U JP H0365987 U JPH0365987 U JP H0365987U
Authority
JP
Japan
Prior art keywords
module
controller
test head
test
optical fiber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12729789U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12729789U priority Critical patent/JPH0365987U/ja
Publication of JPH0365987U publication Critical patent/JPH0365987U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
JP12729789U 1989-10-31 1989-10-31 Pending JPH0365987U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12729789U JPH0365987U (enExample) 1989-10-31 1989-10-31

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12729789U JPH0365987U (enExample) 1989-10-31 1989-10-31

Publications (1)

Publication Number Publication Date
JPH0365987U true JPH0365987U (enExample) 1991-06-26

Family

ID=31675057

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12729789U Pending JPH0365987U (enExample) 1989-10-31 1989-10-31

Country Status (1)

Country Link
JP (1) JPH0365987U (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998022829A1 (en) * 1996-11-15 1998-05-28 Advantest Corporation Integrated circuit device tester

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59500891A (ja) * 1982-05-24 1984-05-17 マイクロ　コンポ−ネント　テクノロジ−．インコ−ポレイテイド 集積回路試験装置
JPS60219571A (ja) * 1984-04-16 1985-11-02 Yokogawa Hokushin Electric Corp アナログｌｓｉテスタ
JPS61117472A (ja) * 1984-11-13 1986-06-04 Yokogawa Electric Corp テストシステム

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59500891A (ja) * 1982-05-24 1984-05-17 マイクロ　コンポ−ネント　テクノロジ−．インコ−ポレイテイド 集積回路試験装置
JPS60219571A (ja) * 1984-04-16 1985-11-02 Yokogawa Hokushin Electric Corp アナログｌｓｉテスタ
JPS61117472A (ja) * 1984-11-13 1986-06-04 Yokogawa Electric Corp テストシステム

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998022829A1 (en) * 1996-11-15 1998-05-28 Advantest Corporation Integrated circuit device tester
GB2322203A (en) * 1996-11-15 1998-08-19 Advantest Corp Integrated circuit device tester

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