JPH02113177U - - Google Patents
Info
- Publication number
- JPH02113177U JPH02113177U JP2182289U JP2182289U JPH02113177U JP H02113177 U JPH02113177 U JP H02113177U JP 2182289 U JP2182289 U JP 2182289U JP 2182289 U JP2182289 U JP 2182289U JP H02113177 U JPH02113177 U JP H02113177U
- Authority
- JP
- Japan
- Prior art keywords
- dut
- electrical signals
- outputs
- lsi
- signals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 3
- 239000013307 optical fiber Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2182289U JPH02113177U (enExample) | 1989-02-27 | 1989-02-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2182289U JPH02113177U (enExample) | 1989-02-27 | 1989-02-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02113177U true JPH02113177U (enExample) | 1990-09-11 |
Family
ID=31239389
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2182289U Pending JPH02113177U (enExample) | 1989-02-27 | 1989-02-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02113177U (enExample) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59500891A (ja) * | 1982-05-24 | 1984-05-17 | マイクロ コンポ−ネント テクノロジ−.インコ−ポレイテイド | 集積回路試験装置 |
| JPS60219571A (ja) * | 1984-04-16 | 1985-11-02 | Yokogawa Hokushin Electric Corp | アナログlsiテスタ |
| JPS61117472A (ja) * | 1984-11-13 | 1986-06-04 | Yokogawa Electric Corp | テストシステム |
-
1989
- 1989-02-27 JP JP2182289U patent/JPH02113177U/ja active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59500891A (ja) * | 1982-05-24 | 1984-05-17 | マイクロ コンポ−ネント テクノロジ−.インコ−ポレイテイド | 集積回路試験装置 |
| JPS60219571A (ja) * | 1984-04-16 | 1985-11-02 | Yokogawa Hokushin Electric Corp | アナログlsiテスタ |
| JPS61117472A (ja) * | 1984-11-13 | 1986-06-04 | Yokogawa Electric Corp | テストシステム |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| WO2001001247A3 (en) | Semiconductor parallel tester | |
| CA2072980A1 (en) | Automated breakout box for automotive testing | |
| DE60234693D1 (de) | Testverfahren für aktiven folge- und halte-leseverstärker (komparator) in einem einmal programmierbaren salizidierten poly-schmelzsicherungsarray | |
| CA2289736A1 (en) | Method and device for measuring an electrical voltage | |
| JPH02113177U (enExample) | ||
| JPH0365987U (enExample) | ||
| JPH052869Y2 (enExample) | ||
| SU1182407A1 (ru) | Способ испытаний компенсационных приборов на устойчивость к комбинированным воздействи м | |
| JPS6289034U (enExample) | ||
| JPS62170576U (enExample) | ||
| JP2633692B2 (ja) | 半導体試験方法 | |
| JPH0454428Y2 (enExample) | ||
| JPH02122370U (enExample) | ||
| JPH0422306Y2 (enExample) | ||
| JPS6435926A (en) | Reliability testing system for semiconductor element | |
| JPH02118279U (enExample) | ||
| JPS56114348A (en) | Inspecting system for wafer | |
| JPS62115682U (enExample) | ||
| JPS59192839U (ja) | ウエハの測定装置 | |
| JPS6488223A (en) | Contact load measuring apparatus | |
| JPS6267270U (enExample) | ||
| JPS6396476U (enExample) | ||
| JPH043370U (enExample) | ||
| JPH04158542A (ja) | 検査装置 | |
| JPH01141477U (enExample) |