JPH0363175B2 - - Google Patents

Info

Publication number
JPH0363175B2
JPH0363175B2 JP58056558A JP5655883A JPH0363175B2 JP H0363175 B2 JPH0363175 B2 JP H0363175B2 JP 58056558 A JP58056558 A JP 58056558A JP 5655883 A JP5655883 A JP 5655883A JP H0363175 B2 JPH0363175 B2 JP H0363175B2
Authority
JP
Japan
Prior art keywords
lens
sample
electrostatic
electron
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58056558A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59181451A (ja
Inventor
Kojin Kondo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Denshi KK filed Critical Nihon Denshi KK
Priority to JP58056558A priority Critical patent/JPS59181451A/ja
Publication of JPS59181451A publication Critical patent/JPS59181451A/ja
Publication of JPH0363175B2 publication Critical patent/JPH0363175B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
JP58056558A 1983-03-31 1983-03-31 電子線エネルギ−分析装置を備えた電子顕微鏡 Granted JPS59181451A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58056558A JPS59181451A (ja) 1983-03-31 1983-03-31 電子線エネルギ−分析装置を備えた電子顕微鏡

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58056558A JPS59181451A (ja) 1983-03-31 1983-03-31 電子線エネルギ−分析装置を備えた電子顕微鏡

Publications (2)

Publication Number Publication Date
JPS59181451A JPS59181451A (ja) 1984-10-15
JPH0363175B2 true JPH0363175B2 (enrdf_load_stackoverflow) 1991-09-30

Family

ID=13030441

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58056558A Granted JPS59181451A (ja) 1983-03-31 1983-03-31 電子線エネルギ−分析装置を備えた電子顕微鏡

Country Status (1)

Country Link
JP (1) JPS59181451A (enrdf_load_stackoverflow)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5762016B2 (enrdf_load_stackoverflow) * 1974-05-17 1982-12-27 Nippon Electron Optics Lab

Also Published As

Publication number Publication date
JPS59181451A (ja) 1984-10-15

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