JPH0363008B2 - - Google Patents
Info
- Publication number
- JPH0363008B2 JPH0363008B2 JP16751382A JP16751382A JPH0363008B2 JP H0363008 B2 JPH0363008 B2 JP H0363008B2 JP 16751382 A JP16751382 A JP 16751382A JP 16751382 A JP16751382 A JP 16751382A JP H0363008 B2 JPH0363008 B2 JP H0363008B2
- Authority
- JP
- Japan
- Prior art keywords
- light source
- noise
- fiber
- light
- etalon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- BJQHLKABXJIVAM-UHFFFAOYSA-N bis(2-ethylhexyl) phthalate Chemical compound CCCCC(CC)COC(=O)C1=CC=CC=C1C(=O)OCC(CC)CCCC BJQHLKABXJIVAM-UHFFFAOYSA-N 0.000 claims description 19
- 238000000034 method Methods 0.000 claims description 7
- 230000000694 effects Effects 0.000 claims description 6
- 230000010355 oscillation Effects 0.000 claims description 2
- 230000001360 synchronised effect Effects 0.000 claims description 2
- 239000000835 fiber Substances 0.000 description 12
- 238000001228 spectrum Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 4
- 230000035945 sensitivity Effects 0.000 description 3
- 238000005259 measurement Methods 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000013518 transcription Methods 0.000 description 1
- 230000035897 transcription Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16751382A JPS5957136A (ja) | 1982-09-28 | 1982-09-28 | 光源のａｍ・ｆｍ雑音の特性評価方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16751382A JPS5957136A (ja) | 1982-09-28 | 1982-09-28 | 光源のａｍ・ｆｍ雑音の特性評価方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5957136A JPS5957136A (ja) | 1984-04-02 |
| JPH0363008B2 true JPH0363008B2 (it) | 1991-09-27 |
Family
ID=15851072
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16751382A Granted JPS5957136A (ja) | 1982-09-28 | 1982-09-28 | 光源のａｍ・ｆｍ雑音の特性評価方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5957136A (it) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2507790B2 (ja) * | 1988-12-20 | 1996-06-19 | 富士通株式会社 | 半導体レ―ザのｆｍ変調特性測定装置 |
| JP2802390B2 (ja) * | 1989-06-02 | 1998-09-24 | 日本電信電話株式会社 | 光周波数変調特性の測定装置 |
| JPH0359428A (ja) * | 1989-07-28 | 1991-03-14 | Fujitsu Ltd | 半導体レーザの周波数変調特性測定方法及び装置 |
| JPH0620333U (ja) * | 1992-06-12 | 1994-03-15 | 有限会社九州生技研 | チェーンガイドレール構造 |
-
1982
- 1982-09-28 JP JP16751382A patent/JPS5957136A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5957136A (ja) | 1984-04-02 |
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