JPH0358529B2 - - Google Patents
Info
- Publication number
- JPH0358529B2 JPH0358529B2 JP59075843A JP7584384A JPH0358529B2 JP H0358529 B2 JPH0358529 B2 JP H0358529B2 JP 59075843 A JP59075843 A JP 59075843A JP 7584384 A JP7584384 A JP 7584384A JP H0358529 B2 JPH0358529 B2 JP H0358529B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- mirror
- light receiving
- wafer
- mask
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000003287 optical effect Effects 0.000 claims description 16
- 235000012431 wafers Nutrition 0.000 description 31
- 101100269850 Caenorhabditis elegans mask-1 gene Proteins 0.000 description 13
- 238000001514 detection method Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 8
- 230000000694 effects Effects 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59075843A JPS60220348A (ja) | 1984-04-17 | 1984-04-17 | 位置合せ装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59075843A JPS60220348A (ja) | 1984-04-17 | 1984-04-17 | 位置合せ装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60220348A JPS60220348A (ja) | 1985-11-05 |
JPH0358529B2 true JPH0358529B2 (fr) | 1991-09-05 |
Family
ID=13587887
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59075843A Granted JPS60220348A (ja) | 1984-04-17 | 1984-04-17 | 位置合せ装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60220348A (fr) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS636840A (ja) * | 1986-06-26 | 1988-01-12 | Nikon Corp | アライメント装置 |
US5477057A (en) * | 1994-08-17 | 1995-12-19 | Svg Lithography Systems, Inc. | Off axis alignment system for scanning photolithography |
-
1984
- 1984-04-17 JP JP59075843A patent/JPS60220348A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS60220348A (ja) | 1985-11-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4232969A (en) | Projection optical system for aligning an image on a surface | |
KR950034480A (ko) | 투영 노광 장치 및 방법 | |
US4732479A (en) | Particle analyzing apparatus | |
US4829193A (en) | Projection optical apparatus with focusing and alignment of reticle and wafer marks | |
US4856905A (en) | Projection exposure apparatus | |
JPH08130181A (ja) | 投影露光装置 | |
JPH0122977B2 (fr) | ||
US4801208A (en) | Projection type exposing apparatus | |
US4710029A (en) | Projection type exposing apparatus | |
JPH0358529B2 (fr) | ||
JPS6336526A (ja) | ウエハ露光装置 | |
JPS62140418A (ja) | 面位置検知装置 | |
JP3252526B2 (ja) | 位置検出装置及びそれを用いた半導体素子の製造方法 | |
JP3304533B2 (ja) | ピンホール素子 | |
JP3061280B2 (ja) | 物体の孔位置検出方法 | |
JPH07311012A (ja) | 投影光学系における基板の位置決定方法及び検出方法 | |
KR200144702Y1 (ko) | 반도체 제조장비용 렌즈 촛점 보정장치 | |
JPH0358528B2 (fr) | ||
JPH0449887B2 (fr) | ||
JPS6266112A (ja) | 位置検出装置 | |
JPS59163612A (ja) | 傾き制御方法および同装置 | |
JPS63206682A (ja) | 光電スイツチ | |
JPH01207602A (ja) | 投影露光装置 | |
JP2000002622A (ja) | 光走査ユニットのビーム検査装置およびビーム調整方法 | |
JPH11281319A (ja) | 光学素子の位置設定装置、及び光学素子の位置設定方法 |