JPH035652B2 - - Google Patents
Info
- Publication number
- JPH035652B2 JPH035652B2 JP56203050A JP20305081A JPH035652B2 JP H035652 B2 JPH035652 B2 JP H035652B2 JP 56203050 A JP56203050 A JP 56203050A JP 20305081 A JP20305081 A JP 20305081A JP H035652 B2 JPH035652 B2 JP H035652B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- plane
- mask
- points
- reference plane
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/707—Chucks, e.g. chucking or un-chucking operations or structural details
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7003—Alignment type or strategy, e.g. leveling, global alignment
- G03F9/7023—Aligning or positioning in direction perpendicular to substrate surface
- G03F9/703—Gap setting, e.g. in proximity printer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Control Of Position Or Direction (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56203050A JPS58103136A (ja) | 1981-12-16 | 1981-12-16 | 基板の傾き設定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56203050A JPS58103136A (ja) | 1981-12-16 | 1981-12-16 | 基板の傾き設定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58103136A JPS58103136A (ja) | 1983-06-20 |
JPH035652B2 true JPH035652B2 (enrdf_load_stackoverflow) | 1991-01-28 |
Family
ID=16467506
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56203050A Granted JPS58103136A (ja) | 1981-12-16 | 1981-12-16 | 基板の傾き設定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58103136A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011164595A (ja) * | 2010-01-14 | 2011-08-25 | Nsk Ltd | 近接露光装置及び近接露光方法 |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS616701A (ja) * | 1984-06-21 | 1986-01-13 | Iwatsu Electric Co Ltd | 製版機の瀬御誤差調整方法 |
JPS6144429A (ja) * | 1984-08-09 | 1986-03-04 | Nippon Kogaku Kk <Nikon> | 位置合わせ方法、及び位置合せ装置 |
JPS6190432A (ja) * | 1984-10-11 | 1986-05-08 | Nippon Telegr & Teleph Corp <Ntt> | あおり支持機構 |
JPS62277726A (ja) * | 1986-05-27 | 1987-12-02 | Canon Inc | 平行出し装置 |
JPH0652707B2 (ja) * | 1988-10-11 | 1994-07-06 | キヤノン株式会社 | 面位置検出方法 |
JP3401769B2 (ja) * | 1993-12-28 | 2003-04-28 | 株式会社ニコン | 露光方法、ステージ装置、及び露光装置 |
JP3634068B2 (ja) | 1995-07-13 | 2005-03-30 | 株式会社ニコン | 露光方法及び装置 |
KR19980019031A (ko) | 1996-08-27 | 1998-06-05 | 고노 시게오 | 스테이지 장치(a stage apparatus) |
KR100471018B1 (ko) | 2000-11-28 | 2005-03-08 | 스미도모쥬기가이고교 가부시키가이샤 | 두 개의 대상물 간의 갭 조절장치 및 조절방법 |
SG188343A1 (en) | 2010-09-03 | 2013-04-30 | Ev Group E Thallner Gmbh | Device and method for reducing a wedge error |
CN103206591B (zh) * | 2012-01-11 | 2016-10-05 | 昆山允升吉光电科技有限公司 | 电动载物台定位方法 |
EP2752870A1 (en) * | 2013-01-04 | 2014-07-09 | Süss Microtec Lithography GmbH | Chuck, in particular for use in a mask aligner |
US20210340663A1 (en) * | 2018-04-03 | 2021-11-04 | Matthias HEYMANNS | Apparatus for processing a substrate, system for processing a substrate, and methods therefor |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5243692A (en) * | 1975-09-30 | 1977-04-05 | Sumiyoshi Heavy Ind | Apparatus for hauling with hauling roller having angle changeable fishing net linkkgethering member |
JPS5252579A (en) * | 1975-10-27 | 1977-04-27 | Canon Inc | Clearance adjusng method |
JPS5516457A (en) * | 1978-07-24 | 1980-02-05 | Nippon Telegr & Teleph Corp <Ntt> | Gap detecting method |
-
1981
- 1981-12-16 JP JP56203050A patent/JPS58103136A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011164595A (ja) * | 2010-01-14 | 2011-08-25 | Nsk Ltd | 近接露光装置及び近接露光方法 |
Also Published As
Publication number | Publication date |
---|---|
JPS58103136A (ja) | 1983-06-20 |
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