JPH0352015B2 - - Google Patents

Info

Publication number
JPH0352015B2
JPH0352015B2 JP59143636A JP14363684A JPH0352015B2 JP H0352015 B2 JPH0352015 B2 JP H0352015B2 JP 59143636 A JP59143636 A JP 59143636A JP 14363684 A JP14363684 A JP 14363684A JP H0352015 B2 JPH0352015 B2 JP H0352015B2
Authority
JP
Japan
Prior art keywords
pattern
imaged
code
extracting
mark
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59143636A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6123950A (ja
Inventor
Koichiro Muneki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP14363684A priority Critical patent/JPS6123950A/ja
Publication of JPS6123950A publication Critical patent/JPS6123950A/ja
Publication of JPH0352015B2 publication Critical patent/JPH0352015B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Image Analysis (AREA)
JP14363684A 1984-07-11 1984-07-11 欠陥検出装置 Granted JPS6123950A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14363684A JPS6123950A (ja) 1984-07-11 1984-07-11 欠陥検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14363684A JPS6123950A (ja) 1984-07-11 1984-07-11 欠陥検出装置

Publications (2)

Publication Number Publication Date
JPS6123950A JPS6123950A (ja) 1986-02-01
JPH0352015B2 true JPH0352015B2 (OSRAM) 1991-08-08

Family

ID=15343368

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14363684A Granted JPS6123950A (ja) 1984-07-11 1984-07-11 欠陥検出装置

Country Status (1)

Country Link
JP (1) JPS6123950A (OSRAM)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63165973A (ja) * 1986-12-27 1988-07-09 Osaki Electric Co Ltd 自動形状検定装置
JP2506201B2 (ja) * 1989-09-26 1996-06-12 株式会社クボタ 物品検査装置
CN103940825B (zh) * 2014-04-14 2016-02-24 北京大恒图像视觉有限公司 一种全方位胶囊检测设备及相应检测方法

Also Published As

Publication number Publication date
JPS6123950A (ja) 1986-02-01

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