JPH0348525Y2 - - Google Patents
Info
- Publication number
- JPH0348525Y2 JPH0348525Y2 JP8336685U JP8336685U JPH0348525Y2 JP H0348525 Y2 JPH0348525 Y2 JP H0348525Y2 JP 8336685 U JP8336685 U JP 8336685U JP 8336685 U JP8336685 U JP 8336685U JP H0348525 Y2 JPH0348525 Y2 JP H0348525Y2
- Authority
- JP
- Japan
- Prior art keywords
- screen
- light
- inspected
- defect inspection
- line sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8336685U JPH0348525Y2 (en, 2012) | 1985-06-04 | 1985-06-04 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8336685U JPH0348525Y2 (en, 2012) | 1985-06-04 | 1985-06-04 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61199661U JPS61199661U (en, 2012) | 1986-12-13 |
JPH0348525Y2 true JPH0348525Y2 (en, 2012) | 1991-10-16 |
Family
ID=30631932
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8336685U Expired JPH0348525Y2 (en, 2012) | 1985-06-04 | 1985-06-04 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0348525Y2 (en, 2012) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6759869B2 (ja) * | 2016-08-31 | 2020-09-23 | 株式会社リコー | 検査装置 |
-
1985
- 1985-06-04 JP JP8336685U patent/JPH0348525Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS61199661U (en, 2012) | 1986-12-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4966457A (en) | Inspecting apparatus for determining presence and location of foreign particles on reticles or pellicles | |
US4301363A (en) | Alignment device | |
US6075591A (en) | Optical method and apparatus for detecting low frequency defects | |
US20020018219A1 (en) | Method for three-dimensional inspection using patterned light projection | |
JP2510786B2 (ja) | 物体の形状検出方法及びその装置 | |
JPS63765B2 (en, 2012) | ||
JPH0412062B2 (en, 2012) | ||
JPH0348525Y2 (en, 2012) | ||
US4984886A (en) | Surface inspection apparatus for objects | |
US5149982A (en) | Foreign particle inspection apparatus | |
US4592637A (en) | Focus detecting device | |
JP3040131B2 (ja) | 球体表面の傷検査装置 | |
JPS5863906A (ja) | 顕微鏡用合焦位置検出装置 | |
JPS61112905A (ja) | 光応用計測装置 | |
JP2970235B2 (ja) | 表面状態検査装置 | |
JPH0643893B2 (ja) | 距離測定装置 | |
EP0162973A1 (en) | Distance measuring device | |
JPS61186806A (ja) | 透明体の欠点検出装置 | |
JPH0334577B2 (en, 2012) | ||
JPS58201005A (ja) | 粒径測定装置 | |
JPS60228908A (ja) | 表面欠陥検査方法 | |
JPS58123444A (ja) | パタン欠陥検査装置 | |
JPS6321854B2 (en, 2012) | ||
US20040007659A1 (en) | Focus error detection apparatus and method | |
JPH03173452A (ja) | 面板の欠陥検査装置 |