JPH0346045B2 - - Google Patents

Info

Publication number
JPH0346045B2
JPH0346045B2 JP59242756A JP24275684A JPH0346045B2 JP H0346045 B2 JPH0346045 B2 JP H0346045B2 JP 59242756 A JP59242756 A JP 59242756A JP 24275684 A JP24275684 A JP 24275684A JP H0346045 B2 JPH0346045 B2 JP H0346045B2
Authority
JP
Japan
Prior art keywords
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absolute value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59242756A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61120002A (ja
Inventor
Hiroshi Moribe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyota Central R&D Labs Inc
Original Assignee
Toyota Central R&D Labs Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyota Central R&D Labs Inc filed Critical Toyota Central R&D Labs Inc
Priority to JP24275684A priority Critical patent/JPS61120002A/ja
Publication of JPS61120002A publication Critical patent/JPS61120002A/ja
Publication of JPH0346045B2 publication Critical patent/JPH0346045B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/028—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Analysis (AREA)
JP24275684A 1984-11-16 1984-11-16 画像のコ−ナ点検出方法及びその装置 Granted JPS61120002A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24275684A JPS61120002A (ja) 1984-11-16 1984-11-16 画像のコ−ナ点検出方法及びその装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24275684A JPS61120002A (ja) 1984-11-16 1984-11-16 画像のコ−ナ点検出方法及びその装置

Publications (2)

Publication Number Publication Date
JPS61120002A JPS61120002A (ja) 1986-06-07
JPH0346045B2 true JPH0346045B2 (enrdf_load_stackoverflow) 1991-07-15

Family

ID=17093795

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24275684A Granted JPS61120002A (ja) 1984-11-16 1984-11-16 画像のコ−ナ点検出方法及びその装置

Country Status (1)

Country Link
JP (1) JPS61120002A (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6252690A (ja) * 1985-08-31 1987-03-07 Kawasaki Heavy Ind Ltd 対象物体の頂点の検出方法
DE102016120775B4 (de) 2015-11-02 2025-02-20 Cognex Corporation System und Verfahren zum Erkennen von Linien in einem Bild mit einem Sichtsystem
US10937168B2 (en) 2015-11-02 2021-03-02 Cognex Corporation System and method for finding and classifying lines in an image with a vision system
JP6463593B2 (ja) * 2015-11-02 2019-02-06 コグネックス・コーポレイション ビジョンシステムでラインを検出するためのシステム及び方法
CN110728285B (zh) * 2019-08-23 2022-06-24 北京正安维视科技股份有限公司 一种基于动态变频的快速角点检测方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57163807A (en) * 1981-04-01 1982-10-08 Mitsubishi Electric Corp Shape detector

Also Published As

Publication number Publication date
JPS61120002A (ja) 1986-06-07

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