JPH0345347B2 - - Google Patents
Info
- Publication number
- JPH0345347B2 JPH0345347B2 JP57020396A JP2039682A JPH0345347B2 JP H0345347 B2 JPH0345347 B2 JP H0345347B2 JP 57020396 A JP57020396 A JP 57020396A JP 2039682 A JP2039682 A JP 2039682A JP H0345347 B2 JPH0345347 B2 JP H0345347B2
- Authority
- JP
- Japan
- Prior art keywords
- test
- board
- adapter plate
- probe
- support plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57020396A JPS58137772A (ja) | 1982-02-10 | 1982-02-10 | 回路基板テストシステムに用いるフイクスチア |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57020396A JPS58137772A (ja) | 1982-02-10 | 1982-02-10 | 回路基板テストシステムに用いるフイクスチア |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58137772A JPS58137772A (ja) | 1983-08-16 |
JPH0345347B2 true JPH0345347B2 (enrdf_load_stackoverflow) | 1991-07-10 |
Family
ID=12025849
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57020396A Granted JPS58137772A (ja) | 1982-02-10 | 1982-02-10 | 回路基板テストシステムに用いるフイクスチア |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58137772A (enrdf_load_stackoverflow) |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5095778A (enrdf_load_stackoverflow) * | 1973-12-25 | 1975-07-30 | ||
JPS5945105B2 (ja) * | 1977-05-31 | 1984-11-02 | 日本アビオニクス株式会社 | プリント板回路の自動試験方法および装置 |
-
1982
- 1982-02-10 JP JP57020396A patent/JPS58137772A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS58137772A (ja) | 1983-08-16 |
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