JPH0342611Y2 - - Google Patents

Info

Publication number
JPH0342611Y2
JPH0342611Y2 JP1984027871U JP2787184U JPH0342611Y2 JP H0342611 Y2 JPH0342611 Y2 JP H0342611Y2 JP 1984027871 U JP1984027871 U JP 1984027871U JP 2787184 U JP2787184 U JP 2787184U JP H0342611 Y2 JPH0342611 Y2 JP H0342611Y2
Authority
JP
Japan
Prior art keywords
aperture
ions
section
aperture plates
mass spectrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1984027871U
Other languages
English (en)
Japanese (ja)
Other versions
JPS60140356U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2787184U priority Critical patent/JPS60140356U/ja
Publication of JPS60140356U publication Critical patent/JPS60140356U/ja
Application granted granted Critical
Publication of JPH0342611Y2 publication Critical patent/JPH0342611Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Electron Tubes For Measurement (AREA)
JP2787184U 1984-02-28 1984-02-28 質量分析装置 Granted JPS60140356U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2787184U JPS60140356U (ja) 1984-02-28 1984-02-28 質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2787184U JPS60140356U (ja) 1984-02-28 1984-02-28 質量分析装置

Publications (2)

Publication Number Publication Date
JPS60140356U JPS60140356U (ja) 1985-09-17
JPH0342611Y2 true JPH0342611Y2 (pm) 1991-09-06

Family

ID=30525224

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2787184U Granted JPS60140356U (ja) 1984-02-28 1984-02-28 質量分析装置

Country Status (1)

Country Link
JP (1) JPS60140356U (pm)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4581184B2 (ja) * 2000-06-07 2010-11-17 株式会社島津製作所 質量分析装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5923419B2 (ja) * 1978-10-07 1984-06-01 日本真空技術株式会社 質量分析装置
JPS5623273A (en) * 1979-07-31 1981-03-05 Takara Belmont Co Ltd Sieve for scattering glaze

Also Published As

Publication number Publication date
JPS60140356U (ja) 1985-09-17

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