JPH0338555B2 - - Google Patents

Info

Publication number
JPH0338555B2
JPH0338555B2 JP55130817A JP13081780A JPH0338555B2 JP H0338555 B2 JPH0338555 B2 JP H0338555B2 JP 55130817 A JP55130817 A JP 55130817A JP 13081780 A JP13081780 A JP 13081780A JP H0338555 B2 JPH0338555 B2 JP H0338555B2
Authority
JP
Japan
Prior art keywords
optical
light
substance
measured
polarization
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP55130817A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5756777A (en
Inventor
Kyobumi Mochizuki
Yasuhiko Niino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KDDI Corp
Original Assignee
Kokusai Denshin Denwa KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kokusai Denshin Denwa KK filed Critical Kokusai Denshin Denwa KK
Priority to JP13081780A priority Critical patent/JPS5756777A/ja
Publication of JPS5756777A publication Critical patent/JPS5756777A/ja
Publication of JPH0338555B2 publication Critical patent/JPH0338555B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP13081780A 1980-09-22 1980-09-22 Method for measuring time difference of light propagation Granted JPS5756777A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13081780A JPS5756777A (en) 1980-09-22 1980-09-22 Method for measuring time difference of light propagation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13081780A JPS5756777A (en) 1980-09-22 1980-09-22 Method for measuring time difference of light propagation

Publications (2)

Publication Number Publication Date
JPS5756777A JPS5756777A (en) 1982-04-05
JPH0338555B2 true JPH0338555B2 (enrdf_load_html_response) 1991-06-11

Family

ID=15043400

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13081780A Granted JPS5756777A (en) 1980-09-22 1980-09-22 Method for measuring time difference of light propagation

Country Status (1)

Country Link
JP (1) JPS5756777A (enrdf_load_html_response)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007114206A (ja) * 2006-11-30 2007-05-10 National Institute Of Advanced Industrial & Technology 光学材料の群屈折率精密計測方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5235189B2 (ja) * 2009-12-18 2013-07-10 日本電信電話株式会社 光ファイバ屈折率測定装置及び光ファイバ屈折率測定方法
CN103776801B (zh) * 2012-10-17 2016-12-21 成都光明光电股份有限公司 光学元件折射率的检测方法及其检测装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5219448B2 (enrdf_load_html_response) * 1971-06-18 1977-05-27
JPS5413133B2 (enrdf_load_html_response) * 1973-05-24 1979-05-29
JPS5231750A (en) * 1975-04-07 1977-03-10 Toray Ind Inc Print device
JPS5225117A (en) * 1975-08-18 1977-02-24 Kanebo Ltd Prepapation of flame retardant polyamide
JPS553407U (enrdf_load_html_response) * 1978-06-20 1980-01-10

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007114206A (ja) * 2006-11-30 2007-05-10 National Institute Of Advanced Industrial & Technology 光学材料の群屈折率精密計測方法

Also Published As

Publication number Publication date
JPS5756777A (en) 1982-04-05

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