JPH0334595B2 - - Google Patents

Info

Publication number
JPH0334595B2
JPH0334595B2 JP57156154A JP15615482A JPH0334595B2 JP H0334595 B2 JPH0334595 B2 JP H0334595B2 JP 57156154 A JP57156154 A JP 57156154A JP 15615482 A JP15615482 A JP 15615482A JP H0334595 B2 JPH0334595 B2 JP H0334595B2
Authority
JP
Japan
Prior art keywords
fixed contact
common
changeover switch
signal
tester
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57156154A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5944670A (ja
Inventor
Kunihiko Katsuhara
Yoshio Myazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP57156154A priority Critical patent/JPS5944670A/ja
Publication of JPS5944670A publication Critical patent/JPS5944670A/ja
Publication of JPH0334595B2 publication Critical patent/JPH0334595B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP57156154A 1982-09-08 1982-09-08 デジタル入力／出力用テスタ Granted JPS5944670A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57156154A JPS5944670A (ja) 1982-09-08 1982-09-08 デジタル入力／出力用テスタ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57156154A JPS5944670A (ja) 1982-09-08 1982-09-08 デジタル入力／出力用テスタ

Publications (2)

Publication Number Publication Date
JPS5944670A JPS5944670A (ja) 1984-03-13
JPH0334595B2 true JPH0334595B2 (enrdf_load_html_response) 1991-05-23

Family

ID=15621525

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57156154A Granted JPS5944670A (ja) 1982-09-08 1982-09-08 デジタル入力／出力用テスタ

Country Status (1)

Country Link
JP (1) JPS5944670A (enrdf_load_html_response)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4735177B2 (ja) * 2005-10-11 2011-07-27 三菱電機株式会社 溶融金属吐出装置及び溶融金属吐出方法並びにバンプ形成方法
KR20110052619A (ko) 2008-08-14 2011-05-18 히타치 긴조쿠 가부시키가이샤 용융 금속의 공급 파이프, 그 공급 파이프가 내장된 용융 금속의 공급 장치 및 용융 금속의 공급 방법
CN103983882B (zh) * 2013-02-08 2016-12-28 施耐德电器工业公司 检测数字输入信号线连通性的装置及方法

Also Published As

Publication number Publication date
JPS5944670A (ja) 1984-03-13

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