JPH0330832B2 - - Google Patents

Info

Publication number
JPH0330832B2
JPH0330832B2 JP57128735A JP12873582A JPH0330832B2 JP H0330832 B2 JPH0330832 B2 JP H0330832B2 JP 57128735 A JP57128735 A JP 57128735A JP 12873582 A JP12873582 A JP 12873582A JP H0330832 B2 JPH0330832 B2 JP H0330832B2
Authority
JP
Japan
Prior art keywords
interference
test
signal
specimen
conducted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57128735A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5918468A (ja
Inventor
Koitaro Kasai
Toshio Abe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP57128735A priority Critical patent/JPS5918468A/ja
Publication of JPS5918468A publication Critical patent/JPS5918468A/ja
Publication of JPH0330832B2 publication Critical patent/JPH0330832B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
JP57128735A 1982-07-23 1982-07-23 伝導干渉試験装置 Granted JPS5918468A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57128735A JPS5918468A (ja) 1982-07-23 1982-07-23 伝導干渉試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57128735A JPS5918468A (ja) 1982-07-23 1982-07-23 伝導干渉試験装置

Publications (2)

Publication Number Publication Date
JPS5918468A JPS5918468A (ja) 1984-01-30
JPH0330832B2 true JPH0330832B2 (cg-RX-API-DMAC10.html) 1991-05-01

Family

ID=14992152

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57128735A Granted JPS5918468A (ja) 1982-07-23 1982-07-23 伝導干渉試験装置

Country Status (1)

Country Link
JP (1) JPS5918468A (cg-RX-API-DMAC10.html)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN120742001B (zh) * 2025-08-29 2025-11-07 中国船舶集团有限公司第七一九研究所 一种舰船电网瞬态电磁干扰分级评估方法及系统

Also Published As

Publication number Publication date
JPS5918468A (ja) 1984-01-30

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