JPH0330829B2 - - Google Patents
Info
- Publication number
- JPH0330829B2 JPH0330829B2 JP16608481A JP16608481A JPH0330829B2 JP H0330829 B2 JPH0330829 B2 JP H0330829B2 JP 16608481 A JP16608481 A JP 16608481A JP 16608481 A JP16608481 A JP 16608481A JP H0330829 B2 JPH0330829 B2 JP H0330829B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- resistance
- contact
- electrode
- terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 27
- 238000000034 method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/08—Measuring resistance by measuring both voltage and current
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16608481A JPS5866870A (ja) | 1981-10-16 | 1981-10-16 | 抵抗測定回路 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16608481A JPS5866870A (ja) | 1981-10-16 | 1981-10-16 | 抵抗測定回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5866870A JPS5866870A (ja) | 1983-04-21 |
| JPH0330829B2 true JPH0330829B2 (enrdf_load_html_response) | 1991-05-01 |
Family
ID=15824682
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16608481A Granted JPS5866870A (ja) | 1981-10-16 | 1981-10-16 | 抵抗測定回路 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5866870A (enrdf_load_html_response) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5057772A (en) * | 1990-05-29 | 1991-10-15 | Electro Scientific Industries, Inc. | Method and system for concurrent electronic component testing and lead verification |
| CN104977469B (zh) * | 2014-04-04 | 2018-03-23 | 中芯国际集成电路制造(上海)有限公司 | 用于集成电路设计的测量电路和方法 |
-
1981
- 1981-10-16 JP JP16608481A patent/JPS5866870A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5866870A (ja) | 1983-04-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH07167812A (ja) | 着脱自在センサと共に使用される測定器 | |
| TW202131356A (zh) | 電阻器陣列、具有電阻器陣列的測量電路以及製造用於電阻器陣列的帶狀材料複合體的方法 | |
| TWI403734B (zh) | 基板檢驗方法 | |
| TW201546461A (zh) | 基板檢查裝置以及基板檢查方法 | |
| JP6633949B2 (ja) | 基板検査装置及び基板検査方法 | |
| JPH0330829B2 (enrdf_load_html_response) | ||
| JPH0845538A (ja) | 二次電池の絶縁検査装置 | |
| US20040188273A1 (en) | Electrolytic polishing apparatus, electrolytic polishing method, and wafer subject to polishing | |
| JP2001035759A (ja) | コンデンサのインピーダンス測定装置 | |
| JP2977959B2 (ja) | 半導体装置およびその測定方法 | |
| JPH0222707Y2 (enrdf_load_html_response) | ||
| JPH0192668A (ja) | コンデンサの漏洩電流測定方法 | |
| JP3612841B2 (ja) | 4線式抵抗測定方法および装置 | |
| JPH0737954A (ja) | コンタクト不良検出装置 | |
| JP3999380B2 (ja) | コンクリートレベルセンサ | |
| JPH01199173A (ja) | 静電容量測定式基板検査装置 | |
| JPH0532779Y2 (enrdf_load_html_response) | ||
| JPH0566732B2 (enrdf_load_html_response) | ||
| JPS59200934A (ja) | 測温抵抗体計測方式 | |
| JPH0935753A (ja) | 電池のショート電流測定方法および測定装置 | |
| JPH0814590B2 (ja) | 回路素子測定器の端子接続状態検出回路 | |
| JPS59171874A (ja) | 絶縁耐圧試験機 | |
| JPS58201075A (ja) | トランスフアリ−ドスイツチの特性測定回路 | |
| JPH0794224A (ja) | バッテリ試験装置のバッテリケーブル端子 | |
| JPH05281297A (ja) | 半導体装置のテスト方法 |