JPH0330101B2 - - Google Patents

Info

Publication number
JPH0330101B2
JPH0330101B2 JP55152905A JP15290580A JPH0330101B2 JP H0330101 B2 JPH0330101 B2 JP H0330101B2 JP 55152905 A JP55152905 A JP 55152905A JP 15290580 A JP15290580 A JP 15290580A JP H0330101 B2 JPH0330101 B2 JP H0330101B2
Authority
JP
Japan
Prior art keywords
rays
ray
spectroscopic
measured
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP55152905A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5776441A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP55152905A priority Critical patent/JPS5776441A/ja
Publication of JPS5776441A publication Critical patent/JPS5776441A/ja
Publication of JPH0330101B2 publication Critical patent/JPH0330101B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP55152905A 1980-10-30 1980-10-30 Modulation method for x-ray wavelength Granted JPS5776441A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55152905A JPS5776441A (en) 1980-10-30 1980-10-30 Modulation method for x-ray wavelength

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55152905A JPS5776441A (en) 1980-10-30 1980-10-30 Modulation method for x-ray wavelength

Publications (2)

Publication Number Publication Date
JPS5776441A JPS5776441A (en) 1982-05-13
JPH0330101B2 true JPH0330101B2 (enExample) 1991-04-26

Family

ID=15550692

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55152905A Granted JPS5776441A (en) 1980-10-30 1980-10-30 Modulation method for x-ray wavelength

Country Status (1)

Country Link
JP (1) JPS5776441A (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2642886C1 (ru) * 2016-11-30 2018-01-29 Федеральное государственное автономное образовательное учреждение высшего образования "Национальный исследовательский Нижегородский государственный университет им. Н.И. Лобачевского" Способ модуляции интенсивности рентгеновского пучка
CN107219241B (zh) 2017-05-05 2020-10-16 中国科学院上海光学精密机械研究所 原位时间分辨x射线吸收谱的测量装置和测量方法

Also Published As

Publication number Publication date
JPS5776441A (en) 1982-05-13

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