JPH03282273A - Tester - Google Patents

Abstract

PURPOSE:To perform a simultaneous test by using a predetermined pin electronics card in common and providing an opening and closing means between each connection terminal of a performance board and each pin electronics card. CONSTITUTION:When both ICs 1, 2 are tested simultaneously, respective relay contacts 8a - 8h are controlled to a closed state by a control means to simultaneously test both ICs 1, 2. When a test is conducted at every IC, for example, when the first IC 1 is tested at first, the relay contacts 8a - 8d for the first DUT are controlled to a closed state by the control means and the relay contacts 8e - 8h for the second DUT are controlled to an open state to test the second IC 2. Therefore, by controlling the respective relay contacts 8a - 8h, the simultaneous test of both ICs 1, 2 and the test at every IC can be conducted.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a test device that simultaneously tests a plurality of ICs.

[Conventional technology]

Conventionally, when testing multiple ICs at the same time, a number of pin electronics cards corresponding to the pins of each IC are provided, and the pins of each IC and each pin electronics card are connected to one another.
The pin electronics card for signal output outputs a pre-programmed test signal to each IC, and the signal from each IC is input to the pin electronics card for signal input. The input signal is compared with a preset setting signal using the pin electronics card, and based on the comparison result, the quality of the IC is determined.

However, in this case, a large number of pin electronics cards are required, and when the number of pin electronics cards installed in one test device is limited, unused pin electronics cards can be used when testing multiple ICs simultaneously. card, the utilization efficiency of the pin electronics card is poor, and simultaneous testing is possible.
The number of C's is also limited.

Therefore, as shown in FIG. 2, it has been considered to share a common pin electronics card to improve the utilization efficiency of the pin electronics cards and to utilize them effectively.

That is, as shown in FIG. 2, when testing the first and second ICIs 2 to be tested simultaneously,
Each pin 18 to IC of (Device Under Te5
Connection terminals 38 to 3 of the connection terminals 3a to 3d for t)
The pins 2a to 2C of the second IC 2 are connected to the connection terminals 3e3f and 3h of the connection terminals 3e to 3h for the second DUT of the performance board 3. Each lead wire 5a
~5C.

Next, four pin electronics cards (hereinafter referred to as pin elm cards) 6a, 6b, 6c and 6d are provided, and among these pin elm cards 6a to 6d, two pin elm cards 6a and 6b transmit predetermined test signals programmed in advance. These are for signal output, respectively.
The remaining two pin elm cards F5c and 6d are for manual signal use to compare the signal from the IC with a preset setting signal and output it to a judgment means (not shown), and the pin elm cards 6a and 6b for signal output are respectively These bottle elm cards 6a and 6b are shared because they are common to both ICIs 2.

Further, the vinyl elm card 6a is connected to the connection terminals 3a and 3e by the lead wire 7a, the vinyl elm card 6b is connected to the connection terminals 3b and 3f by the lead wire 7b, and the vinyl elm card 6C is connected to the connection terminals 3C and 3g by the lead wire 7c. At the same time, the bottle elm card 6d is connected to the connection terminals 3d and 3h by lead wires 7d.

Then, a predetermined test signal is output from the bottle elm card 6a to both ICIs, 2, and a predetermined test signal is output from the bottle elm card 6b.
A predetermined test signal different from the pinnire card 6a is output to both ICIs and 2, and a signal from the ICI is output to the connection terminal 3.
It is input to the pinnire cart 6C via C, and
The signal from IC2 is input to the bottle elm card 6d via the connection terminal 3h, and the bottle elm card 6c, 6d causes
Each preset setting signal and the input signal from the ICI, 2 are compared, and based on the results of these comparisons, the determining means determines whether the ICI, 2 is good or bad.

In this way, by sharing the pin card 6a and 6b, fewer pin card cards are needed when the same number of ICs as before are tested at the same time, and on the other hand, if the total number of pin card cards is limited, they are not used. The number of vinyl cards can be reduced, and the number of ICs that can be tested simultaneously can be increased.

[Invention or problem to be solved]

In the conventional case, the shared bottle elm card 6a and IC1, 2
Since the connections between pins la and 2a of the vinyl card 6b and pins lb and 2b of ICI and 2 are fixed, even if it is necessary to test each IC for special test items, There was a problem that it was not possible to carry out tests.

This invention was made to solve the above-mentioned problems, and its purpose is to make it possible to test each IC as necessary while sharing a common pin electronics card. do.

[Means to solve the problem]

The test device according to the present invention has a plurality of I
A performance board having a plurality of connection terminals connected to each pin of the IC, and a plurality of pin electronics cards that output a predetermined test signal or compare an input signal from the IC with a setting signal. , a predetermined pin electronics card is connected to several of the connection terminals, the predetermined pin electronics card is shared with the IC, and the remaining pin electronics cards and the connection terminals corresponding to the pin electronics cards are connected to the predetermined pin electronics card. The test device is characterized in that an opening/closing means is provided between each of the connection terminals and each of the pin electronics cards.

[Effect]

In this invention, a predetermined pin electronics card is shared, and opening/closing means are provided between each connection terminal of the performance board and each pin electronics card, so that each opening/closing means is controlled to be in a closed state. A simultaneous test of the ICs is performed, and a test for each IC is performed by controlling the opening/closing means corresponding to each IC to be in a closed state.

〔Example〕

FIG. 1 shows a wiring diagram of an embodiment of the test device of the present invention.

What is different in FIG. 1 from FIG. 2 is that relay contacts 8a as opening/closing means are provided between each connection terminal 3a to 3h of the performance board 3 and each pin elm card 6a to 6d.
-8h was provided.

At this time, relay contacts 8a to 8d correspond to the first DUT, relay contacts 8e to 8h correspond to the second DUT, and each relay contact 8a to 8h is controlled by a control means not shown.

When testing both ICIs 2 at the same time, the control means controls each relay contact 8a to 8h to the closed state, and by the same operation as in the case of FIG. 2 described above, both ICs
Simultaneous tests of I and 2 are performed.

On the other hand, when testing each IC, first, for example, the first
When performing a CI test, the control means controls the relay contacts 8a to 8d for the first DUT to be in the closed state, and controls the relay contacts 8e to 8h for the second DUT to be in the open state. , the first ICI is tested, and then the control means causes the relay contacts 8a to 8 for the first DUT to be tested.
8d is controlled to be open, and the relay contacts 8e to 8h for the second DUT are controlled to be closed, and the second IC
2 tests will be conducted.

Therefore, by controlling each relay contact 8a to 8h, both ICs
Simultaneous testing of I and 2 and testing of each IC can be performed.

In the above embodiment, the case where two ICIs 2 are tested has been described, but the present invention can be implemented in the same way even when three or more ICs are tested.

Furthermore, the opening/closing means is not limited to the relay contacts described above.

[Effects of the Invention] As described above, according to the present invention, a predetermined pin electronics card is shared and an opening/closing means is provided between each connection terminal of the performance board and each pin electronics card, so that each opening/closing means By controlling the above, simultaneous testing of each IC and testing of each IC can be performed.

[Brief explanation of drawings]

FIG. 1 is a wiring diagram of an embodiment of the test device of the present invention, and FIG. 2 is a wiring diagram of a conventional test device. In the figure, 1.2 is the first. The second ICl3 is a performance board, 38 to 3h are connection terminals, 6a to 6d are vinyl carts, and 8a to 8h are relay contacts. Note that the same reference numerals in each figure indicate the same or corresponding parts.

Claims (1)

[Claims] (1) A performance board that has a plurality of connection terminals each connected to each pin of a plurality of ICs to be tested and outputs a predetermined test signal or compares an input signal from the IC with a setting signal. a plurality of pin electronics cards, a predetermined pin electronics card is connected to several of the connection terminals, and each of the IC
In a test device in which the predetermined pin electronics card is shared with the respective pin electronics cards, and the remaining pin electronics cards and the connection terminals corresponding to the pin electronics cards are respectively connected, each of the connection terminals and each of the pin electronics cards are connected to each other. A test device characterized in that opening/closing means are provided between the respective opening/closing means.