JPH03263151A - Channel test processing system - Google Patents

Abstract

PURPOSE:To automatically execute in a short time the test related to plural transfer modes of plural channel devices by executing continuously the test with regard to each of plural transfer modes of one channel device, and also, executing a parallel test with regard to plural channel devices. CONSTITUTION:A mode setting part 5 executes setting of a transfer mode by using set data 6, by which a function testing part 4 executes continuously a test by plural transfer modes of one channel device 8. Also, whether a parallel operation part 7 can execute a parallel operation with regard to plural channel devices 8 or not is checked, and in the case it is possible, tests by plural channel devices 8 are executed in parallel. In such a way, with regard to plural transfer modes of plural channel devices, the test can be executed automatically in a short time.

Description

[Detailed Description of the Invention] [Summary] The purpose of this invention is to automatically test multiple transfer modes of multiple channel devices in a short time regarding a parallel and continuous channel test processing method for multiple transfer modes of multiple channels. .

A mode setting section that sets a transfer mode, a control section that includes setting data for the setting, and a control section that controls a test, and a parallel operation section that performs the test on a plurality of channel devices in parallel, and performs the test. A function test section is provided in a test processing section, and the mode setting section sets the transfer mode using the setting data. The test is performed continuously, and the parallel operation unit checks whether parallel operation is possible for the plurality of channel devices, and if possible, the test is performed by the plurality of channel devices in parallel. .

[Industrial application field]

The present invention relates to a channel test processing scheme.
This invention relates to a parallel and continuous channel test processing method for multiple channels and multiple transfer modes.

As data processing systems become more complex and faster, the number of channel devices in one system is increasing. Also, 1
There are two or three types of transfer modes in one channel device. Therefore, it is necessary to perform a channel test for each transfer mode of each channel device.

[Conventional technology]

When a plurality of channel devices having a plurality of transfer modes are provided, a channel test is performed as follows.

First, a tester uses two channels to test one channel device.
Set the transfer mode.

Next, when the tester instructs to start the test, the test starts. That is, data is transferred via the channel device in the specified transfer mode.

When the test is completed, a message indicating that the test has been completed is displayed to the tester.

The tester who sees this sets the transfer mode and instructs the start of the test in order to test other transfer modes of the channel device. That is, in the channel device, it is necessary to set the transfer mode and instruct the start of the test every time the transfer mode is different.

Furthermore, when the test for the channel device is completed, 1
Repeat the same operation for the next channel device to test all transfer modes.

By repeating the above steps, tests are performed for all transfer modes of all channel devices.

[Problem to be solved by the invention]

According to the above-mentioned conventional technology, there are the following problems.

That is, since testing can only be performed independently for each transfer mode of each channel device, the tester had to set the transfer mode and instruct the start of the test each time. Moreover, for this reason, the tester had to virtually monitor the channel device and the like during the test period.

Therefore, the burden on the tester is heavy, and this tendency becomes stronger as the number of channel devices and transfer modes increases.

Furthermore, since it is possible to test only one transfer mode of one channel device at a time, it takes a long time to complete the entire test. This point became more pronounced as the number of channel devices and transfer modes increased. Furthermore, if the test time was limited, it was not possible to conduct a test for the case of two complete tests.

An object of the present invention is to provide a channel test processing method that makes it possible to automatically test multiple transfer modes of multiple channel devices in a short time.

[Means for Solving the Problems] FIG. 1 is a diagram showing the basic configuration of the present invention, and shows a data processing system according to the present invention.

In FIG. 1, 1 is a processing device, 2 is a test processing section, 3 is a control section, 4 is a function test section, 5 is a mode setting section, 6 is setting data, 7 is a parallel operation section, 8 (8-1, 8-2) is a channel device, and 9 (9-1, 9-2) is an input/output device.

In a data processing system, rA number of channel devices N8
~1.8-2 are provided and connected to the processing device 1. Each channel device 8-1.8-2 is capable of operating in multiple transfer modes.

Each channel device 8-1.8-2 includes an input/output device 1f9-
1.9-2 are connected, and data transfer is performed between them in a predetermined transfer mode.

The test processing unit 2 is provided in the processing device 1 and is connected to a channel device 8-1, 8-2 and an input/output device 9- which are devices to be tested.
1. Conduct the test for 9-2.

For this purpose, a control section 3 and a function test section 4 are provided.

The control unit 3 includes a mode setting unit 5 that sets a transfer mode;
It is provided with setting data 6 for setting this transfer mode, and controls the test.

The function test section 4 includes a parallel operation section 7 that performs tests on a plurality of channel devices 8-1 and 8-2 in parallel, and controls the tests.

[Effect]

Under the control of the control section 3, the function test section 4 performs tests using all the transfer modes of all the channel devices 8-1, 8-2.

In this test, one channel device 8 (e.g. 8-
1)).

This is done as follows. That is, 2, first, the mode setting section 5
uses the setting data 6 to set one transfer mode. In response to this, the 2-function test section 4.

A test is performed on the channel device 8-1 using the transfer mode. Then, when the test is finished, the mode setting section 5
Set a new other transfer mode.

In response to this, other transfer modes of the channel device 8-1 are tested. By repeating the above steps, tests using a plurality of transfer modes are successively performed in the channel device 8-1. Therefore.

There is no need for any intervention by the tester.

On the other hand, focusing on the plurality of channel devices 8-1 and 8-2, the test is performed as follows. That is, first, the parallel operation section 7 performs a plurality of channel devices 8-1 .
Check whether parallel operation of 8-2 is possible. Then, if possible, the parallel operation section 7 (or function test section 4)
Tests using multiple channel devices 8-1, 8-2 are performed in parallel.

Thereby, the influence that an increase in the number of channel devices 8 has on the test time can be reduced.

In this way, multiple transfer modes of multiple channel devices can be tested in parallel and consecutively, reducing the burden on testers and allowing tests to be performed for all cases in a short time. Become.

〔Example〕

FIG. 1 will be further explained.

The processing device 1 consists of two central processing units (CPUs) and a memory, and performs data transfer with an input/output device 9-1.9-2 via a channel device 78-1.8-2. Input/output device 9 1.9 2 is an input device such as a keyboard, CRT
It consists of output devices such as, auxiliary storage devices such as magnetic disks, etc.

The test processing unit 2 is realized by a test program existing in the memory of the processing device 1, and is implemented by a channel device 8-1.8-2 provided in the data processing system.
This is for performing channel function tests. This test is conducted by the dual-function test section 4 under the control of the control section 3.

The functional test section 4 includes a plurality of test items and performs tests on each of them. This test item includes items that can be tested by operating multiple channel devices 8-1, 8-2 in parallel,
There are some things that cannot be tested by running them in parallel. Therefore, before starting the test, the parallel operation section 7 checks whether it is possible to cause the channel devices 8-1, 8-2 to operate in parallel for the test item that the one-function test section 4 is about to start. If the test item can be operated in parallel, the 5-parallel operation section 7 (or functional test section 4) causes the 5-channel device 8-1.8-2 to operate in parallel to perform a test on the test item. . In order to enable these processes, the parallel operation unit 7.

It is provided in the functional test section 4.

In addition, in the channel function test, each channel equipment! Since this test is intended to test the functions of 81.8-2, the same data is not transferred simultaneously by a plurality of channel devices 8-1.8-2. Therefore, as will be described later, this parallel operation includes preparatory processing such as data transfer processing and reception of commands for the data transfer processing, which will be described later.
1 and 8-2 in parallel. by this.

The test time for the plurality of channel tests 8-1 and 8-2 can be overlapped to shorten the overall test time.

The control section 3 monitors the test performed by the 1-function test section 4.

Control.

That is, the control unit 3 controls one channel device 8 (for example, 8-
1) and determine its type.

According to this type, the mode setting unit 5 uses the setting data 6 to instruct the input/output device 9-1 to select a transfer mode (setting the setting data 6). This input/output device 9-1 is 2
It must be connected to the selected channel device 8-1. For example, when the control section 3 notifies the function test section 4 of this setting, the function test section 4 starts testing a predetermined test item.

The control section 3 monitors this test, and when it is completed, causes the mode setting section 5 to instruct the input/output device 9-1 to select another new transfer mode. Due to this.

Testing of the same test item using the other transfer mode is started.

The mode setting unit 5 includes necessary setting data for all transfer modes in advance as setting data 6. Setting data 6 is stored in a predetermined order for each type of channel device 8. This makes it possible to test all transfer modes in a predetermined order depending on the type of channel device 8. When the tests for the same test items are completed for all transfer modes of one channel device 2B-1, the mode setting section 5 or the control section 3 notifies the function test section 4 of this, and then tests the other new channel device 8-1. Similar processing is performed for 2.

There are three types of channel devices 8-1 and 8-2, for example, BMC (block multiplexer channel) or MXC (hyde multiplexer channel).

In the case of BMC, it is possible to operate in two types of transfer modes: burst mode and data streaming mode. In the case of MXC, operation is possible in three types of transfer modes: burst mode, multiplex mode, and local burst mode. Therefore, in this case, as the setting data 6, two types of data are prepared for the BMC and three types of data are prepared for the MXC.

Next, the channel test will be explained.

First, the tester inputs the setting data 6 and, if necessary, manually inputs data regarding the type of the two-channel device 8-1, 8-2. Then, after specifying some or all of the test items, an instruction is given to start the test. Thereafter, the test is automatically performed by the test processing unit 2 for the designated test items.

FIG. 2 is a flowchart of multiple channel parallel operation processing.

(2) The control section 3 selects one of the specified test items, selects one channel device 8-1 (channel 1), and instructs the i-performance testing section 4 to start the test.

(2) The parallel operation unit 7 checks whether the test item in question can be tested by parallel operation.

If possible, the following process (route 1) is performed.

(2) The mode setting unit 5 specifies one transfer mode to the input/output device 9-1, and the two-function testing unit 4 starts the test item (sends a test start command).

■ For example, until the channel device 8-1 starts up, becomes ready for operation, and receives an interrupt notification (until it receives a command), the channel device 8-1 remains in a waiting state.
. Therefore, using this time, 5 other channel devices 8-2
Start testing on (channel 2). That is, the same process as process (2) is performed for the channel device 8-2.

■ Until there is an interrupt notification from channel device 8-2,
The channel device 8-2 enters a waiting state. During this time, an interrupt occurs in channel device e-t.

(2) Tests are performed for each transfer mode of channel device 8-1. This process will be described later with reference to FIG. During this test, an interrupt occurs in channel device 8-2.

(2) Immediately after the tests for all transfer modes of channel device 8-1 are completed, tests for each transfer mode of channel device 8-2 are executed. This process will also be explained with reference to FIG.

Through the above steps, all transfer modes of all channel devices for one test item are completely tested. If multiple test items are specified, the following steps are repeated. That is, the control unit 3 selects one other test item from the specified test items, and the function test unit 4 performs a test on this item.
have it done.

As is clear from FIG. 2, channel devices 8-1 and 8
-2 test times overlap.

Therefore, the entire test time can be shortened.

This is also clear from a comparison with the process of route 2 in FIG. 2, ie, process 2, in which it is determined that testing by parallel operation is impossible.

The contents of each process of route 2 are the same as those of the corresponding route 1, so the explanation thereof will be omitted.

Although some test items may have to be processed by route 2, a considerable number of test items can be processed by route 1, so the test time can be shortened. Furthermore, depending on the input/output device 9, the interrupt wait time in processing (2) etc. may be relatively long, so in such a case.

In particular, shortening of test time can be expected. Furthermore, as the number of channel devices 8 and input/output devices 9 to be tested increases,
Since the time spent waiting for each interrupt can be substantially omitted, the test time can be greatly reduced.

FIG. 3 is a flowchart of continuous processing in multiple transfer mode.

■ The control unit 3 selects one channel device 8-1,
Determine its type. This process is performed in steps 2, 5, of the above-mentioned processes, for example.

■ If the type is 8MC channel, mode setting section 5
sets the input/output device 9-1 to burst mode. This process is performed in step 2, for example, in process ① described above.

■ The functional test section 4 (or parallel operation section 7) tests the channel device 8-1 and the input/output device 9-1 for predetermined test items.
The test is performed by performing data transfer in burst mode between the The steps from this process to the following process (1) are performed, for example, in the above-mentioned process (1) (or (2)).

(2) When the burst mode test is completed, the control unit 3 checks whether the current transfer mode is the data streaming mode.

If the mode is data streaming mode, the test for all transfer modes of the channel device 8-1 ends.

(2) If the mode is not the data streaming mode, the mode setting unit 5 sets the input/output device 9-1 to the data streaming mode. And after this.

Process ■Repeat the following.

■ If the type is MXC channel, mode setting section 5
sets the input/output device 9-1 to burst mode. This process is performed in step 2, for example, in process ① described above.

■ The functional test section 4 (or the parallel operation section 7) performs a test on the channel device 8-1 and the input/output bag Wt9- for a predetermined test item.
The test is performed by executing data transfer in burst mode between the data transfer process and the process 2, for example, the process 2 described above (or process 2).

(2) When the burst mode test is completed, the control unit 3 checks whether the current transfer mode is the multiplex mode (or whether it was the multiplex mode in the past).

■ If it is not multiplex mode, mode setting section 5
sets the input/output device 9-1 to multiplex mode. After this, the process ① and subsequent steps are repeated.

■ In the case of multiplex mode, the control unit 3
However, it checks whether the current transfer mode is local burst mode.

If the mode is local burst mode, the test for all transfer modes of the channel device 8-1 is completed.

(2) If the mode is not the local burst mode, the mode setting unit 5 sets the input/output device 9-1 to the local burst mode. After this, the process ① and subsequent steps are repeated.

As described above, in testing one channel device W8-1 for one test item, it is possible to continuously test all transfer modes that can be operated by the channel device 8-1.

Note that although the order of testing each transfer mode is determined in advance as described above, this order can be changed.

〔Effect of the invention〕

As explained above, according to the second aspect of the present invention, by providing the mode setting section and the parallel operation section in the channel test processing, it is possible to perform consecutive tests for each of the plurality of transfer modes of one channel device, and also, Allows parallel testing of multiple channel devices without tester intervention.

Tests for multiple transfer modes of multiple channel devices can be automatically performed in a short period of time, and test omissions can be eliminated, thereby improving the reliability of the data processing system.

[Brief explanation of drawings]

FIG. 1 is a diagram showing the principle configuration of the present invention. FIG. 2 shows a flow of parallel operation processing for multiple channels. FIG. 3 shows a flow of continuous processing in multiple transfer modes. 1 is a processing device, 2 is a test processing section, and 3 is a control section. 4 is a function test section, 5 is a mode setting section, 6 is setting data,
7 is a parallel operation unit, s<8-1; 8-2) is a channel device, and 9 (9-1, 9-2) is an input/output device.

Claims (1)

[Scope of Claims] A plurality of channel devices (8) each capable of operating in a plurality of transfer modes, an input/output device (9) connected thereto, and the channel device (8) and the input/output device (9). ) A data processing system comprising a test processing unit (2) that performs a test, comprising a mode setting unit (5) that sets the transfer mode and setting data (6) for the setting, a control unit (3) that performs the test; and a parallel operation unit (7) that performs the test on the plurality of channel devices (8) in parallel; (2), wherein the mode setting section (5) sets the transfer mode using the setting data (6), so that the function testing section (4) can test one of the channel devices (8). The tests using the plurality of transfer modes are performed continuously, and the parallel operation unit (7) is connected to the plurality of channel devices (8).
A channel test processing method, characterized in that it is checked whether or not parallel operations are possible for the channels, and if possible, the tests by the plurality of channel devices (8) are performed in parallel.