JPH0325135U - - Google Patents

Info

Publication number
JPH0325135U
JPH0325135U JP8726189U JP8726189U JPH0325135U JP H0325135 U JPH0325135 U JP H0325135U JP 8726189 U JP8726189 U JP 8726189U JP 8726189 U JP8726189 U JP 8726189U JP H0325135 U JPH0325135 U JP H0325135U
Authority
JP
Japan
Prior art keywords
voltage
laser diode
current
under test
diode under
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8726189U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8726189U priority Critical patent/JPH0325135U/ja
Publication of JPH0325135U publication Critical patent/JPH0325135U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP8726189U 1989-07-24 1989-07-24 Pending JPH0325135U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8726189U JPH0325135U (enrdf_load_stackoverflow) 1989-07-24 1989-07-24

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8726189U JPH0325135U (enrdf_load_stackoverflow) 1989-07-24 1989-07-24

Publications (1)

Publication Number Publication Date
JPH0325135U true JPH0325135U (enrdf_load_stackoverflow) 1991-03-14

Family

ID=31636913

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8726189U Pending JPH0325135U (enrdf_load_stackoverflow) 1989-07-24 1989-07-24

Country Status (1)

Country Link
JP (1) JPH0325135U (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001033513A (ja) * 1999-07-19 2001-02-09 Nippon Telegr & Teleph Corp <Ntt> 半導体光素子の特性測定方法及び特性測定プログラムを記録した記録媒体
JP2013257266A (ja) * 2012-06-14 2013-12-26 Sharp Corp バーンイン装置
KR102005711B1 (ko) * 2019-04-15 2019-07-31 심재영 광모듈 테스트 장치
WO2020116236A1 (ja) * 2018-12-06 2020-06-11 日本電産リード株式会社 検査装置、検査方法、及び検査装置用プログラム

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5849273B2 (ja) * 1977-11-28 1983-11-02 エヌ・ベ−・フイリツプス・フル−イランペンフアブリケン 乾式ひげそり器
JPS62247582A (ja) * 1986-04-18 1987-10-28 Fujitsu Ltd レ−ザダイオ−ド
JPS62273863A (ja) * 1986-05-23 1987-11-27 Ricoh Co Ltd 発光素子アレイの出力制御装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5849273B2 (ja) * 1977-11-28 1983-11-02 エヌ・ベ−・フイリツプス・フル−イランペンフアブリケン 乾式ひげそり器
JPS62247582A (ja) * 1986-04-18 1987-10-28 Fujitsu Ltd レ−ザダイオ−ド
JPS62273863A (ja) * 1986-05-23 1987-11-27 Ricoh Co Ltd 発光素子アレイの出力制御装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001033513A (ja) * 1999-07-19 2001-02-09 Nippon Telegr & Teleph Corp <Ntt> 半導体光素子の特性測定方法及び特性測定プログラムを記録した記録媒体
JP2013257266A (ja) * 2012-06-14 2013-12-26 Sharp Corp バーンイン装置
WO2020116236A1 (ja) * 2018-12-06 2020-06-11 日本電産リード株式会社 検査装置、検査方法、及び検査装置用プログラム
JPWO2020116236A1 (ja) * 2018-12-06 2021-10-14 日本電産リード株式会社 検査装置、検査方法、及び検査装置用プログラム
KR102005711B1 (ko) * 2019-04-15 2019-07-31 심재영 광모듈 테스트 장치

Similar Documents

Publication Publication Date Title
ES458433A1 (es) Perfeccionamientos en aparatos para medir el diametro de ca-bles yno similares.
JPH0325135U (enrdf_load_stackoverflow)
JPS63190975U (enrdf_load_stackoverflow)
JPH0219703Y2 (enrdf_load_stackoverflow)
JPS63167211A (ja) 距離検出装置
SU903774A1 (ru) Фотоэлектрическое устройство дл измерени перемещени объекта
JPH0167575U (enrdf_load_stackoverflow)
SU574612A1 (ru) Устройство световой индикации
SU729518A2 (ru) Устройство дл измерени малых токов и малых напр жений
JPH01159391U (enrdf_load_stackoverflow)
JPS5928718A (ja) 遅延回路
JPS5844943Y2 (ja) レ−ザ加工装置
JPH0371669U (enrdf_load_stackoverflow)
JPH043305U (enrdf_load_stackoverflow)
JPS60115882A (ja) 測距装置の信号処理回路
JPH03110562U (enrdf_load_stackoverflow)
JPH03130572U (enrdf_load_stackoverflow)
JPS58154410U (ja) 変位ヒステリシス測定装置
JPH02130124U (enrdf_load_stackoverflow)
JPS6196731U (enrdf_load_stackoverflow)
JPH022681U (enrdf_load_stackoverflow)
JPH0221570U (enrdf_load_stackoverflow)
JPS6046038U (ja) 放射温度計
JPH0353035U (enrdf_load_stackoverflow)
JPH01134216U (enrdf_load_stackoverflow)