JPH03195212A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPH03195212A JPH03195212A JP1337450A JP33745089A JPH03195212A JP H03195212 A JPH03195212 A JP H03195212A JP 1337450 A JP1337450 A JP 1337450A JP 33745089 A JP33745089 A JP 33745089A JP H03195212 A JPH03195212 A JP H03195212A
- Authority
- JP
- Japan
- Prior art keywords
- output
- voltage
- current
- vgs2
- reference voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 4
- 238000001514 detection method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 2
- 230000005669 field effect Effects 0.000 description 1
Landscapes
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Emergency Protection Circuit Devices (AREA)
- Logic Circuits (AREA)
- Electronic Switches (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は半導体装置に関し、特にNチャンネル電解効果
トランジスタを使用したソースタイプの出力回路におけ
る出力トランジスタの電流検出回路に関するものである
。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor device, and particularly to a current detection circuit for an output transistor in a source type output circuit using an N-channel field effect transistor.
従来、この種の出力回路の電流検出回路は第3図に示す
ように、出力トランジスタ34にシリーズに接続したセ
ンス抵抗30の両端の電圧降下を検出器38で検出して
いた。Conventionally, a current detection circuit of this type of output circuit uses a detector 38 to detect a voltage drop across a sense resistor 30 connected in series to an output transistor 34, as shown in FIG.
上述した従来の出力回路は、電流を検出する為のセンス
抵抗30が出力トランジスタ34とシリーズに接続され
ており、出力端子33からみた出力インピーダンスが高
くなり、パワーロスになる。もしセンス抵抗30を非常
に小さい値に設定した場合、電圧降下が小さくなり、検
出器38の性能が問題になってくる、という欠点がある
。In the conventional output circuit described above, the sense resistor 30 for detecting current is connected in series with the output transistor 34, and the output impedance seen from the output terminal 33 becomes high, resulting in power loss. If the sense resistor 30 is set to a very small value, the voltage drop will be small and the performance of the detector 38 will become a problem.
本発明の出力回路は、出力トランジスタに流れる電流を
検出するための、ゲート・ソース間電圧(VOS)検出
回路と、■。8判定回路と、V(is判定結果により出
力トランジスタをオン−オフ(ON−OFF)コントロ
ールするゲートドライブ回路を有する。The output circuit of the present invention includes a gate-source voltage (VOS) detection circuit for detecting the current flowing through the output transistor; 8 judgment circuit, and a gate drive circuit that controls the output transistor to turn on/off (ON-OFF) according to the V(is judgment result).
上述した従来の出力回路に対し、本発明は出力トランジ
スタのゲート・ソース間の電圧により電流検出を行って
いる。In contrast to the conventional output circuit described above, the present invention detects current based on the voltage between the gate and source of the output transistor.
次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
第1図は本発明の一実施例のブロック図である。FIG. 1 is a block diagram of one embodiment of the present invention.
4は出力Nチャンネルトランジスタ、5は基準電圧発生
器、6はコンパレーター 7はゲートドライブ回路、8
はゲート・ソース間電圧検出器、1.2は電源、3は出
力端子、9はコントロール信号入力端子である。4 is an output N-channel transistor, 5 is a reference voltage generator, 6 is a comparator, 7 is a gate drive circuit, 8
1 is a gate-source voltage detector, 1.2 is a power supply, 3 is an output terminal, and 9 is a control signal input terminal.
出力トランジスタ4は、第4図に示すようにゲート・ソ
ース間電圧(VOS)に対応したドレイン電流を流すこ
とができる。VGSIのときはIn++VQB2のとき
はID2というように、あるV。8に対して流せるID
が決まる。The output transistor 4 can flow a drain current corresponding to the gate-source voltage (VOS) as shown in FIG. A certain V, such as In++ for VGSI and ID2 for VQB2. ID that can be sent to 8
is decided.
今基準電圧発生器の基準電圧VrO値をV r =VG
82に設定したとすると、出力トランジスタ4に流れる
電流がID2より大きいとき■。llはV。S□より大
きい値になっているため、コンパレーター6がVrとの
比較を行い、ゲートドライブ回路7に信号を送り出力ト
ランジスタ4をオフ(OFF)するように動作する。又
出力トランジスタに流れる電流が■1□より小さい場合
のV。SはV。s2より小さい値になっているためその
ままオン(ON)の状態となる。Now the reference voltage VrO value of the reference voltage generator is V r =VG
82, when the current flowing through the output transistor 4 is larger than ID2, ■. ll is V. Since the value is larger than S□, the comparator 6 compares it with Vr, sends a signal to the gate drive circuit 7, and operates to turn off the output transistor 4. Also, V when the current flowing through the output transistor is smaller than ■1□. S is V. Since the value is smaller than s2, it remains in the ON state.
従って基準電圧Vrの値で決まる電流より大きい電流が
流れると出力トランジスタ4がオフ(OF’F) L、
逆に小さい値であればそのままオン(ON)という動作
になる。いわゆる過電流保護動作になる。Therefore, when a current larger than the current determined by the value of the reference voltage Vr flows, the output transistor 4 is turned off (OF'F) L,
On the other hand, if the value is small, the operation is turned on (ON). This is a so-called overcurrent protection operation.
この回路による電流検出方法は出力トランジスタのゲー
ト・ソース間電圧を検出するため比較的大きい電圧を検
出するためコンパレーターの性能は問題にならない。又
、出力トランジスタにシリーズに入れるセンス抵抗を必
要としない。The current detection method using this circuit detects the voltage between the gate and source of the output transistor, so a relatively large voltage is detected, so the performance of the comparator is not a problem. Also, there is no need for a sense resistor to be placed in series with the output transistor.
第2図は本発明の他の実施例のブロック図である。26
.26’ はコンパレーター 20はラッチ回路であり
他の構成は一実施例と同様である。FIG. 2 is a block diagram of another embodiment of the invention. 26
.. 26' is a comparator, 20 is a latch circuit, and the other configurations are the same as in the first embodiment.
この実施例では基準電圧を2つもち、一方が電流の最大
値ID2、他方を電流の最小値工。、に設定しておけば
、出力端子3に過負荷が接続されたときIfllとID
20間でオン−オフ(ON−OF’F)動作となる。This embodiment has two reference voltages, one being the maximum current value ID2 and the other being the minimum current value ID2. , if an overload is connected to output terminal 3, Ifll and ID
It becomes an on-off (ON-OF'F) operation between 20 and 20 seconds.
以上説明したように本発明は、出力トランジスタのゲー
ト・ソース間電圧で出力電流を検出することにより、出
力インピーダンスを上げることなく、又電流検出用コン
パレーターの性能を問題にしなくてよいという効果があ
る。As explained above, the present invention has the advantage that by detecting the output current using the gate-source voltage of the output transistor, the output impedance does not increase and the performance of the current detection comparator does not become a problem. be.
29.39・・・・・・コントロール信号入力端子。29.39...Control signal input terminal.
Claims (1)
、前記電位差の大きさによって、前記出力トランジスタ
をコントロールすることを特徴とする半導体装置。A semiconductor device characterized in that a potential difference between a gate and a source of an output transistor is detected, and the output transistor is controlled depending on the magnitude of the potential difference.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1337450A JP2927847B2 (en) | 1989-12-25 | 1989-12-25 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1337450A JP2927847B2 (en) | 1989-12-25 | 1989-12-25 | Semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH03195212A true JPH03195212A (en) | 1991-08-26 |
JP2927847B2 JP2927847B2 (en) | 1999-07-28 |
Family
ID=18308749
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1337450A Expired - Lifetime JP2927847B2 (en) | 1989-12-25 | 1989-12-25 | Semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2927847B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1317827C (en) * | 2003-10-24 | 2007-05-23 | 恩益禧电子股份有限公司 | Output circuit |
WO2014181450A1 (en) * | 2013-05-10 | 2014-11-13 | 株式会社 日立製作所 | Apparatus for controlling insulating gate-type semiconductor element, and power conversion apparatus using apparatus for controlling insulating gate-type semiconductor element |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63146614A (en) * | 1986-12-10 | 1988-06-18 | Ricoh Co Ltd | Drain current detection circuit for field effect transistor |
-
1989
- 1989-12-25 JP JP1337450A patent/JP2927847B2/en not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63146614A (en) * | 1986-12-10 | 1988-06-18 | Ricoh Co Ltd | Drain current detection circuit for field effect transistor |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1317827C (en) * | 2003-10-24 | 2007-05-23 | 恩益禧电子股份有限公司 | Output circuit |
WO2014181450A1 (en) * | 2013-05-10 | 2014-11-13 | 株式会社 日立製作所 | Apparatus for controlling insulating gate-type semiconductor element, and power conversion apparatus using apparatus for controlling insulating gate-type semiconductor element |
JPWO2014181450A1 (en) * | 2013-05-10 | 2017-02-23 | 株式会社日立製作所 | Control device for insulated gate semiconductor element and power conversion device using the same |
US9780660B2 (en) | 2013-05-10 | 2017-10-03 | Hitachi, Ltd. | Apparatus for controlling insulating gate-type semiconductor element, and power conversion apparatus using apparatus for controlling insulating gate-type semiconductor element |
US10038380B2 (en) | 2013-05-10 | 2018-07-31 | Hitachi, Ltd. | Apparatus for controlling insulating gate-type semiconductor element, and power conversion apparatus using apparatus for controlling insulating gate-type semiconductor element |
Also Published As
Publication number | Publication date |
---|---|
JP2927847B2 (en) | 1999-07-28 |
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