JPH03167839A - Dicing method - Google Patents
Dicing methodInfo
- Publication number
- JPH03167839A JPH03167839A JP1308163A JP30816389A JPH03167839A JP H03167839 A JPH03167839 A JP H03167839A JP 1308163 A JP1308163 A JP 1308163A JP 30816389 A JP30816389 A JP 30816389A JP H03167839 A JPH03167839 A JP H03167839A
- Authority
- JP
- Japan
- Prior art keywords
- dicing
- wafer
- adhesive tape
- tape
- adhesive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 8
- 239000002390 adhesive tape Substances 0.000 claims abstract description 29
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 239000008188 pellet Substances 0.000 description 19
- 239000000853 adhesive Substances 0.000 description 10
- 230000001070 adhesive effect Effects 0.000 description 10
- 239000004065 semiconductor Substances 0.000 description 8
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
Landscapes
- Dicing (AREA)
Abstract
Description
【発明の詳細な説明】
L菜上空凱且立立
本発明は、半導体ウェハを個々の半導体ペレットに分割
するダイシング方法に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a dicing method for dividing a semiconductor wafer into individual semiconductor pellets.
従来旦皮販
トランジスタ等の半導体装置は放熱板やリードフレーム
に半導体ペレットをマウントして製造される。Conventionally, semiconductor devices such as commercially available transistors are manufactured by mounting semiconductor pellets on heat sinks or lead frames.
ここで、半導体ベレットは一枚のウェハに同一パターン
の半導体素子を多数、一括形成し、半導体素子の隣接部
より分割して得られる。Here, the semiconductor pellet is obtained by forming a large number of semiconductor elements with the same pattern on one wafer at once, and dividing the semiconductor elements from adjacent parts.
以下にウェハを分割して半導体ペレットを得る方法を第
11図から第13図により説明する。まず第11図に示
す様に、ウェハ1に粘着テープ2を貼り付ける。そして
、第12図に示す様にウェハ1をダイシングソウ3にて
、格子状に分割し、ペレット4を形成する。この後、ペ
レット4を粘着シ一ト2より剥離して、放熱基板(図示
せず)等ヘマウントする。A method for obtaining semiconductor pellets by dividing a wafer will be described below with reference to FIGS. 11 to 13. First, as shown in FIG. 11, an adhesive tape 2 is attached to a wafer 1. Then, as shown in FIG. 12, the wafer 1 is divided into grid shapes using a dicing saw 3 to form pellets 4. Thereafter, the pellet 4 is peeled off from the adhesive sheet 2 and mounted on a heat dissipation board (not shown) or the like.
ところで粘着シ一ト2の粘着力が大きいとペレット4の
剥離が困難となり、ペレット供給作業に支障を生じる為
、粘着シ一ト2として紫外線硬化型粘着シートを用い、
ダイシング後、第13図に示す様に紫外線照射ランプ5
により粘着シ一ト2の粘着面に紫外線を照射して粘着力
を低下させ、剥離を容易にしている。By the way, if the adhesive sheet 2 has a high adhesive strength, it will be difficult to peel off the pellets 4, which will hinder the pellet supply operation, so an ultraviolet curing type adhesive sheet is used as the adhesive sheet 2.
After dicing, as shown in FIG.
The adhesive surface of the adhesive sheet 2 is irradiated with ultraviolet rays to reduce the adhesive strength and facilitate peeling.
ところで上記の従来のダイシング方法では、ダイシング
時にペレット表面に切削クズが付着したりウェハ外周面
不定形部分が飛び散り、ペレット表面に付着して正常な
ペレットの取り出しに支障をきたし、短絡などの原因と
なるという問題があった。However, in the conventional dicing method described above, cutting debris adheres to the pellet surface during dicing, and irregularly shaped parts of the wafer's outer circumferential surface scatter, which adheres to the pellet surface and interferes with normal pellet extraction, causing short circuits and other problems. There was a problem.
; 2の
本発明は上記課題の解決を目的として提案されたもので
ウェハ両面に紫外線硬化型粘着テープを貼り付け、一方
の面よりダイシングし、ダイシング面に紫外線照射して
粘着性を低下させた後、一方の面側の粘着テープを剥離
する事を特徴とするダイシング方法を提供する。The second invention was proposed with the aim of solving the above problem, and involves attaching ultraviolet curing adhesive tape to both sides of the wafer, dicing from one side, and irradiating the dicing side with ultraviolet rays to reduce the adhesiveness. To provide a dicing method characterized in that the adhesive tape on one side is then peeled off.
也且
本発明によればダイシング時にウェハは2枚の紫外線硬
化型粘着テープにより挟まれている為、切削クズの飛び
散りゃ不定形部分の飛び散りを防止できる。Furthermore, according to the present invention, since the wafer is sandwiched between two ultraviolet-curable adhesive tapes during dicing, it is possible to prevent irregularly shaped parts from scattering when cutting debris scatters.
尖胤旌
以下に本発明の実施例を第1図から第3図により説明す
る。図において6はウェハ、7,8は一対の紫外線硬化
型テープ、9はダイシングンウ、10はウェハ6が分割
されて形成されたペレット、11は紫外線照射ランプで
ある。Embodiments of the present invention will be described below with reference to FIGS. 1 to 3. In the figure, 6 is a wafer, 7 and 8 are a pair of ultraviolet curing tapes, 9 is a dicing plate, 10 is a pellet formed by dividing the wafer 6, and 11 is an ultraviolet irradiation lamp.
まず第1図に示す様にウェハ6の両面に第1,第2の紫
外線硬化型粘着テープ7,8を貼り付ける。First, as shown in FIG. 1, first and second ultraviolet curing adhesive tapes 7 and 8 are attached to both sides of a wafer 6.
次に第2図に示す様に第1の粘着テープ7の面よりダイ
シングソウ9を用いダイシングし、ペレット10を形成
する。これにより、ダイシング時ウェハへの切削クズの
飛び散りゃ不定形部分の飛び散りを防止できる。Next, as shown in FIG. 2, dicing is performed from the surface of the first adhesive tape 7 using a dicing saw 9 to form pellets 10. Thereby, it is possible to prevent irregularly shaped portions from scattering when cutting debris is scattered onto the wafer during dicing.
次に第3図に示す様に、ダイシング面に紫外線照射ラン
ブ11より紫外線を照射し、粘着テープ7の粘着力を低
下させる。Next, as shown in FIG. 3, the dicing surface is irradiated with ultraviolet light from an ultraviolet irradiation lamp 11 to reduce the adhesive strength of the adhesive tape 7.
この時、ペレットと同時に粘着テープ7が切断される為
、ペレット表面には同寸法の粘着テープが付着している
。そのため第4図に示す様に第3の粘着テーブ12を貼
り付け、第5図に示す様に第3の粘着テープ12を剥が
す事より、粘着カが低下した粘着テープ7はペレット表
面より剥離除去できる。At this time, since the adhesive tape 7 is cut at the same time as the pellet, the adhesive tape of the same size is attached to the surface of the pellet. Therefore, by pasting the third adhesive tape 12 as shown in FIG. 4 and peeling off the third adhesive tape 12 as shown in FIG. 5, the adhesive tape 7 whose adhesive strength has decreased is peeled off from the pellet surface. can.
以下に第2実施例を第6図から第10図より説明する。A second embodiment will be explained below with reference to FIGS. 6 to 10.
図においてlla,llbは紫外線照射ランプであり、
1 3 a, 1 3 bは第1,第2のマスクで紫
外線を選択的に第1,第2の粘着テープ7,8に照射す
るもので、互いにポジとネガの関係にあり、第1のマス
ク13aはウェハ周辺の不定形部分の照射を阻止する。In the figure, lla and llb are ultraviolet irradiation lamps,
1 3 a and 1 3 b are used to selectively irradiate the first and second adhesive tapes 7 and 8 with ultraviolet rays using first and second masks, which have a positive and negative relationship with each other, and The mask 13a prevents irradiation of irregularly shaped portions around the wafer.
まず、第6図,第7図に示す様にウェハ6の両面に粘着
テープ7,8を貼り付け、グイシングソウ9を用いてグ
イシングしペレット9を形成する。First, as shown in FIGS. 6 and 7, adhesive tapes 7 and 8 are attached to both sides of a wafer 6, and pellets 9 are formed by guising using a guising saw 9.
次に第8図に示す様に第1,第2のマスク13a,13
bを第1,第2の粘着テープにし、紫外線照射ランプl
la,llbの光を第1,第2マスク13a,13bを
介して照射する。これにより第1の粘着テープ7のウェ
ハ周辺部の不定形部分の粘着性を残留させ、第2の粘着
テープ8のウェハ周辺の不定形部分の粘着性を低下させ
る。Next, as shown in FIG. 8, the first and second masks 13a, 13
b as the first and second adhesive tapes, and ultraviolet irradiation lamp l
Light of la and llb is irradiated through the first and second masks 13a and 13b. As a result, the adhesiveness of the irregularly shaped portion of the first adhesive tape 7 around the wafer remains, and the adhesiveness of the irregularly shaped portion of the second adhesive tape 8 around the wafer is reduced.
次に第9図,第10図に示す様に第1の粘着テープ7に
第3の粘着テープ12を貼り付け、剥離させるとウェハ
周辺の不定形部分を除き第lの粘着テーブ7をペレット
から剥離すると同時にウェハ周辺の不定形部分を第2の
粘着テープ8より剥離できる。Next, as shown in FIGS. 9 and 10, the third adhesive tape 12 is pasted on the first adhesive tape 7, and when peeled off, the first adhesive tape 7 is separated from the pellet by removing the irregularly shaped part around the wafer. At the same time as the peeling, the irregularly shaped portion around the wafer can be peeled off from the second adhesive tape 8.
これによりダイシング時、ウェハへの切削クズの飛び散
りゃ不定形部分の飛び散りを防止できる。This prevents irregularly shaped parts from scattering on the wafer during dicing.
第l,第2の実施例共、従来技術(第13図)で説明し
た様に第2の粘着テープ8に紫外線照射し、ペレットの
剥離を容易にする。In both the first and second embodiments, the second adhesive tape 8 is irradiated with ultraviolet rays to facilitate the peeling of the pellets, as described in the prior art (FIG. 13).
免肚征簸果
以上説明したように、この発明によればダイシング時、
ウェハへの切削クズの飛び散りゃ不定形部分の飛び散り
を防止できる。As explained above, according to this invention, during dicing,
This prevents irregularly shaped parts from scattering on the wafer.
また、不定形部分の除去も容易にできる。Additionally, irregularly shaped portions can be easily removed.
第1図乃至第5図は、本発明の第1実施例を示す側団面
図、第6図乃至第10図は本発明の第2実施例を示す側
断面図、第11図乃至第13図は本発明の前提となるダ
イシング方法を示す側断面図である。
6・・・ウェハ、
7,8・・・紫外線硬化型粘着テープ、11,lla,
llb・・・紫外線照射ランプ、12・・・第3の粘着
テープ。1 to 5 are side views showing a first embodiment of the present invention, FIGS. 6 to 10 are side sectional views showing a second embodiment of the invention, and FIGS. 11 to 13. The figure is a side cross-sectional view showing the dicing method that is the premise of the present invention. 6... Wafer, 7,8... Ultraviolet curing adhesive tape, 11,lla,
llb...ultraviolet irradiation lamp, 12...third adhesive tape.
Claims (1)
方の面よりダイシングし、ダイシング面に紫外線照射し
て粘着性を低下させた後、一方の面側の粘着テープを剥
離する事を特徴とするダイシング方法。Dicing characterized by pasting ultraviolet curing adhesive tape on both sides of the wafer, dicing from one side, irradiating the dicing side with ultraviolet rays to reduce adhesiveness, and then peeling off the adhesive tape on one side. Method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP30816389A JP2782662B2 (en) | 1989-11-28 | 1989-11-28 | Dicing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP30816389A JP2782662B2 (en) | 1989-11-28 | 1989-11-28 | Dicing method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH03167839A true JPH03167839A (en) | 1991-07-19 |
JP2782662B2 JP2782662B2 (en) | 1998-08-06 |
Family
ID=17977656
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP30816389A Expired - Lifetime JP2782662B2 (en) | 1989-11-28 | 1989-11-28 | Dicing method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2782662B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06232257A (en) * | 1993-02-01 | 1994-08-19 | Nec Corp | Method of dicing wafer into semiconductor chips |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5921038A (en) * | 1982-07-27 | 1984-02-02 | Nec Home Electronics Ltd | Releasing method for pellet |
JPS62216244A (en) * | 1986-03-17 | 1987-09-22 | Fujitsu Ltd | Manufacture of semiconductor device |
JPS6388405U (en) * | 1986-11-28 | 1988-06-08 |
-
1989
- 1989-11-28 JP JP30816389A patent/JP2782662B2/en not_active Expired - Lifetime
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5921038A (en) * | 1982-07-27 | 1984-02-02 | Nec Home Electronics Ltd | Releasing method for pellet |
JPS62216244A (en) * | 1986-03-17 | 1987-09-22 | Fujitsu Ltd | Manufacture of semiconductor device |
JPS6388405U (en) * | 1986-11-28 | 1988-06-08 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06232257A (en) * | 1993-02-01 | 1994-08-19 | Nec Corp | Method of dicing wafer into semiconductor chips |
Also Published As
Publication number | Publication date |
---|---|
JP2782662B2 (en) | 1998-08-06 |
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