JPH03153329A - Resin mold for semiconductor device - Google Patents

Resin mold for semiconductor device

Info

Publication number
JPH03153329A
JPH03153329A JP29366489A JP29366489A JPH03153329A JP H03153329 A JPH03153329 A JP H03153329A JP 29366489 A JP29366489 A JP 29366489A JP 29366489 A JP29366489 A JP 29366489A JP H03153329 A JPH03153329 A JP H03153329A
Authority
JP
Japan
Prior art keywords
gate
resin
cavity
force
angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP29366489A
Other languages
Japanese (ja)
Other versions
JP2675644B2 (en
Inventor
Yutaka Maruyama
裕 丸山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP29366489A priority Critical patent/JP2675644B2/en
Publication of JPH03153329A publication Critical patent/JPH03153329A/en
Application granted granted Critical
Publication of JP2675644B2 publication Critical patent/JP2675644B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C45/00Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
    • B29C45/17Component parts, details or accessories; Auxiliary operations
    • B29C45/26Moulds
    • B29C45/27Sprue channels ; Runner channels or runner nozzles
    • B29C45/2701Details not specific to hot or cold runner channels
    • B29C45/2708Gates

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Mechanical Engineering (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Abstract

PURPOSE:To realize the uniform and smooth injection of a resin into a cavity, and to prevent the generation of non-filling and a shrinkage void by tapering a dam block in approximately parallel with a gate angle. CONSTITUTION:A gate 14 in gate-port depth of 0.2-0.6mm and gate width of 0.4-1.2mm is shaped to a bottom force 12. The angle of the gate is inclined at 10-15 deg. to a mold mating surface L. The surface of the dam block 16 of a top force 11 oppositely faced to the gate 14 is tapered at 10-15 deg. in approximately parallel with the angle of the gate. Since the taper of the dam block is made parallel with the angle of the gate, a resin injected from the gate to a cavity gradually flows into a top-force cavity and a bottom-force cavity uniformly. Consequently, molding pressure is applied equally to the resin in the top force and the bottom force, the periphery of a frame is also filled uniformly, and molding pressure simultaneously reaches to the position 18 of a gas bent and a gas is discharged easily. Resistance in a gate port is lowered and the entrainment of air is also prevented, thus reducing the generation of non-filling and a shrinkage void.

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) この発明は、樹脂封止型半導体装置の外囲器を、樹脂成
形材料によってモールド成形するのに用いられる金型装
置に関する。
Detailed Description of the Invention [Object of the Invention] (Industrial Application Field) The present invention relates to a molding device used for molding an envelope of a resin-sealed semiconductor device with a resin molding material. .

(従来技術) 樹脂封止型半導体装置は、リードフレームに多数個の半
導体チップを搭載したフレームを、上型、下型の金型装
置にセットして、予熱された樹脂成形材料をポットから
ランナー、ゲートを経て外囲器キャビティ内に移送・充
填し、加圧加熱して成形される。
(Prior art) In a resin-encapsulated semiconductor device, a frame with a large number of semiconductor chips mounted on a lead frame is set in upper and lower mold equipment, and preheated resin molding material is passed from a pot to a runner. The material is transferred and filled into the envelope cavity through a gate, and is then pressurized and heated to be molded.

従来の樹脂モールド金型装置における1つのキャビティ
の断面構造を、第2図に示した。 同図において、lは
上型、2は下型、そして3は画形の外囲器が成形される
キャビティである。 一般に、ランナー(図示されない
)からキャビティに樹脂を注入する樹脂注入口(ゲート
)は、上型、下型のいずれかに、またキャビティの1カ
所あるいは2カ所に形成される。 第2図の場合におい
て、4が下型2に設けられたゲートであり、図でみるよ
うに、ゲートtlの金型面は、全型合ゼ面りに対して所
定の角度をなすように形成される。
FIG. 2 shows a cross-sectional structure of one cavity in a conventional resin molding device. In the figure, 1 is an upper mold, 2 is a lower mold, and 3 is a cavity in which a picture-shaped envelope is molded. Generally, a resin injection port (gate) for injecting resin into the cavity from a runner (not shown) is formed in either the upper mold or the lower mold, and in one or two places in the cavity. In the case of Fig. 2, 4 is a gate provided on the lower mold 2, and as shown in the figure, the mold surface of the gate tl is set at a predetermined angle with respect to the entire mold assembly surface. It is formed.

この角度はゲート角度と呼ばれている。This angle is called the gate angle.

一方、下型ゲート4に対向する上型面には、下をの合せ
面りとともにリードフレームのタイバーを押さえる講5
が設けられ、また溝5とキャビデイ3のyi1部との間
には、ダムブロック6が組み込まれている、 従来の金
型装置では、このダムブロック6のゲート対向面は、金
型合せ面りと平行な而に、つまりフラットな面に作られ
ていた。
On the other hand, on the upper die surface facing the lower die gate 4, there is a mechanism 5 for holding down the tie bar of the lead frame along with a bottom mating surface.
is provided, and a dam block 6 is incorporated between the groove 5 and the yi1 portion of the cavity 3. In the conventional mold device, the gate facing surface of the dam block 6 is the mold mating surface. It was made parallel to the surface, that is, on a flat surface.

上記従来の金型装置では、樹脂モールドに際して次のよ
うな問題点があり、それを第3図を参照して説明する。
The above-mentioned conventional mold apparatus has the following problems in resin molding, which will be explained with reference to FIG. 3.

外囲器が小型、つまりキャビティ3が小容積であると、
キャビティ3の容積に対してキャビティ内に収容される
フレーム7の占める容積の割合が大きくなる。 このた
めに、ゲート4から注入された樹脂がキャビティ全体に
充填されるとき、フレーム7とキャビテイ壁の最も接近
した所では樹脂の充填が悪くなり、未充填あるいは巣と
いう現象が現れる。
If the envelope is small, that is, the cavity 3 has a small volume,
The ratio of the volume occupied by the frame 7 accommodated within the cavity to the volume of the cavity 3 increases. For this reason, when the entire cavity is filled with the resin injected from the gate 4, the resin filling becomes poor at the closest point between the frame 7 and the cavity wall, resulting in the phenomenon of unfilling or voids.

この未充填と巣の発生を防止するためにとられた従来の
手法は、ゲート4のサイズを大きくすることであったが
、ゲートサイズを大きくすると、ゲート部分を切断する
(ゲートブレイク)際に、ゲートの一部が製品に残って
その除去工程が必要になったり、ゲート残りがない場合
の製品側にはカケ、クラックなど重大な欠損が生じたり
した。
The conventional method taken to prevent this unfilling and the occurrence of cavities was to increase the size of the gate 4, but when the gate size was increased, it was difficult to cut the gate part (gate break). In some cases, part of the gate remains on the product, necessitating a removal process, and when there is no remaining gate, serious defects such as chips and cracks occur on the product.

また、ゲー1〜には前記したとおりゲート角度が付けら
れているが、対向するダムブロック面はフラットである
ので、キャビティに入る直前のゲート断面積が狭くなっ
て、樹脂がゲート近傍の空気を巻き込んでキャビティ内
に注入され、この空気もまた未充填、巣の現象となって
製品に残る。
In addition, gate angles are attached to gates 1~ as mentioned above, but since the facing dam block surface is flat, the cross-sectional area of the gate just before entering the cavity becomes narrow, and the resin absorbs the air near the gate. The air is engulfed and injected into the cavity, and this air also remains in the product as an unfilled and void phenomenon.

そのような従来金型装置における欠陥は、キャビティ内
における樹脂注入の不均一性によって促進されるが、従
来の金型装置では、太い矢印Bで示した下型キャビティ
への流れが主であって、細い矢印Aで示した上型キャビ
ティへの樹脂流れが少なく、キャビティ内の樹脂の流れ
が不均一であった。
Such defects in conventional mold equipment are promoted by non-uniformity of resin injection within the cavity, but in conventional mold equipment, the flow is mainly to the lower mold cavity shown by thick arrow B. , the flow of resin into the upper mold cavity indicated by thin arrow A was small, and the flow of resin within the cavity was non-uniform.

(発明が解決しようとする課題) 本発明の目的は、面形の外囲器を備えた半導体装置の樹
脂封止において、キャビティ内の樹脂の流れを均一にす
る樹脂モールド金型装置を提供することである。 また
、本発明の別の目的は、未充填や巣のない樹脂封止型半
導体装置を成形する金型装置を提供することである。
(Problems to be Solved by the Invention) An object of the present invention is to provide a resin molding device that uniformizes the flow of resin in a cavity in resin sealing of a semiconductor device equipped with a planar envelope. That's true. Another object of the present invention is to provide a molding apparatus for molding a resin-sealed semiconductor device without any unfilling or voids.

[発明の構成] (課題を解決するための手段と作用) 本発明の樹脂モールド金型装置は、上型あるいは下型に
設けである樹脂注入口(ゲート)のゲート角度に平行に
なるように、ゲートに対向する型のダムブロックにもテ
ーパを施したことを特徴とする。 ゲートと対向するこ
のダムブロックにテーパを施すことにより、従来、フラ
ットなダムブロック(例えば上型の)のために誘導され
、主に下型キャビティに流れていた樹脂の流れが大きく
変化して、上下キャビティ内で流れが均一になる。
[Structure of the Invention] (Means and Effects for Solving the Problems) The resin mold device of the present invention is configured such that the resin injection port (gate) provided in the upper mold or the lower mold is parallel to the gate angle. The dam block facing the gate is also tapered. By tapering this dam block facing the gate, the flow of resin, which was conventionally guided by a flat dam block (for example in the upper mold) and mainly flowed into the lower mold cavity, is greatly changed. The flow becomes uniform within the upper and lower cavities.

またフラットなダムブロックのため狭められたゲート口
での樹脂注入抵抗が緩和されて、樹脂の流れはスムース
となり、空気の巻込みがなくなる。
Additionally, since the dam block is flat, resin injection resistance at the narrow gate opening is alleviated, resulting in smooth resin flow and no air entrainment.

その結果、樹脂モールドにおける樹脂の未充填、巣等の
問題点を解決することができた。
As a result, problems such as unfilled resin and cavities in the resin mold could be solved.

(実施例) 次に、実施例により本発明の詳細な説明する。(Example) Next, the present invention will be explained in detail with reference to Examples.

第1図は実施例の金型装置の要部を示す断面図である。FIG. 1 is a cross-sectional view showing the main parts of a mold device according to an embodiment.

 同図において、11は上型、12は下型、そして3は
キャビティである。
In the figure, 11 is an upper mold, 12 is a lower mold, and 3 is a cavity.

下型12には、ゲート口深さ0.2 li〜0.6 n
n、ゲート幅0.4 nn〜1.2 nnのゲート14
が設けられる。 金型合せ面しに対してゲート角度は1
0°〜159に傾斜させである。 このゲート14に対
向する上型11のダムブロック16の面は、ゲート角度
にほぼ平行に10°〜15°のテーパがつけられている
The lower mold 12 has a gate opening depth of 0.2 li to 0.6 n.
n, gate width 0.4 nn to 1.2 nn gate 14
will be provided. The gate angle is 1 with respect to the mold mating surface.
It is inclined at 0° to 159°. The surface of the dam block 16 of the upper die 11 facing the gate 14 is tapered approximately parallel to the gate angle by 10° to 15°.

ダムブロックのテーパがゲート角度と平行になっている
から、ゲートからキャビティに注入される樹脂は、上型
キャビティと下型キャビティに均等に流れてゆく、 そ
の結果、成形圧力は上型、下型の樹脂に均等にかかり、
フレーム周りも均等に充填され、また同時にガスベント
の位置18に到達してガス排出も容易であることが確認
された。
Since the taper of the dam block is parallel to the gate angle, the resin injected into the cavity from the gate flows evenly into the upper and lower mold cavities.As a result, the molding pressure is equal to the upper and lower mold cavities. Evenly spread over the resin,
It was confirmed that the surrounding area of the frame was evenly filled and that the gas vent position 18 was reached at the same time, making it easy to discharge the gas.

またゲート口での抵抗が緩和されて空気の巻き込みがな
くなることもあり、未充填や巣の発生が少ないことが確
認された。
It was also confirmed that the resistance at the gate was alleviated, eliminating air entrainment, which resulted in fewer unfilled spaces and fewer cavities.

[発明の効果] 本発明の金型装置によれば、ゲート角度にほぼ平行にダ
ムブロックのテーパを設けたから、キャビティへの樹脂
の均等かつスムースな注入が実現されて、未充填や巣の
発生による不良が激減し、樹脂封止型半導体装置の成形
歩留りを向上させることができる。
[Effects of the Invention] According to the mold device of the present invention, since the taper of the dam block is provided almost parallel to the gate angle, uniform and smooth injection of resin into the cavity is realized, and the occurrence of unfilled and voids is realized. This dramatically reduces the number of defects caused by molding, and improves the molding yield of resin-sealed semiconductor devices.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の金型装置を示す要部断面図、第2図は
従来の金型装置を示す要部断面図、第3図は従来金型装
置の問題点を説明する図である。 1.11・・・上型、 2,12・・・下型、 3・・
・キャビティ、 4.14・・・樹脂注入口(ゲート)
、6.16・・・ダムブロック、 7・・・フレーム、
 L・・・金型合せ面。
Fig. 1 is a cross-sectional view of the main part showing the mold device of the present invention, Fig. 2 is a cross-sectional view of the main part showing the conventional mold device, and Fig. 3 is a diagram explaining the problems of the conventional mold device. . 1.11...upper mold, 2,12...lower mold, 3...
・Cavity, 4.14...Resin injection port (gate)
, 6.16...Dam block, 7...Frame,
L: Mold mating surface.

Claims (1)

【特許請求の範囲】[Claims] 1 樹脂封止型半導体装置の外囲器を成形する樹脂モー
ルド金型装置であって、上記金型装置の樹脂注入口が下
型若しくは上型にゲート角度をつけて施されてあり、こ
の樹脂注入口と対向する型のダムブロックにゲート角度
と平行にテーパをつけた構造を有することを特徴とする
半導体装置用樹脂モールド金型装置。
1. A resin molding device for molding an envelope of a resin-sealed semiconductor device, in which a resin injection port of the molding device is provided at a gate angle on the lower mold or the upper mold, and the resin A resin molding device for semiconductor devices, characterized in that a dam block of the mold facing the injection port has a tapered structure parallel to the gate angle.
JP29366489A 1989-11-10 1989-11-10 Resin mold equipment for semiconductor devices Expired - Fee Related JP2675644B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29366489A JP2675644B2 (en) 1989-11-10 1989-11-10 Resin mold equipment for semiconductor devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29366489A JP2675644B2 (en) 1989-11-10 1989-11-10 Resin mold equipment for semiconductor devices

Publications (2)

Publication Number Publication Date
JPH03153329A true JPH03153329A (en) 1991-07-01
JP2675644B2 JP2675644B2 (en) 1997-11-12

Family

ID=17797652

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29366489A Expired - Fee Related JP2675644B2 (en) 1989-11-10 1989-11-10 Resin mold equipment for semiconductor devices

Country Status (1)

Country Link
JP (1) JP2675644B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2248580A (en) * 1990-10-10 1992-04-15 Samsung Electronics Co Ltd Encapsulating semiconductor devices attached to load frames
US5423893A (en) * 1992-06-18 1995-06-13 Kotaki; Daizo Plastic filter, its injection molding die and producing method
US5650181A (en) * 1993-06-17 1997-07-22 Kotaki; Daizo Injection molding die for producing plastic filter
US6015280A (en) * 1997-04-28 2000-01-18 Advanced Micro Devices Apparatus for reducing warping of plastic packages
WO2000016957A1 (en) * 1998-09-18 2000-03-30 Röhm Gmbh Shaping tool for information carrier disc blanks

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2248580A (en) * 1990-10-10 1992-04-15 Samsung Electronics Co Ltd Encapsulating semiconductor devices attached to load frames
US5423893A (en) * 1992-06-18 1995-06-13 Kotaki; Daizo Plastic filter, its injection molding die and producing method
US5650181A (en) * 1993-06-17 1997-07-22 Kotaki; Daizo Injection molding die for producing plastic filter
US6015280A (en) * 1997-04-28 2000-01-18 Advanced Micro Devices Apparatus for reducing warping of plastic packages
WO2000016957A1 (en) * 1998-09-18 2000-03-30 Röhm Gmbh Shaping tool for information carrier disc blanks

Also Published As

Publication number Publication date
JP2675644B2 (en) 1997-11-12

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