JPH0299961U - - Google Patents

Info

Publication number
JPH0299961U
JPH0299961U JP716389U JP716389U JPH0299961U JP H0299961 U JPH0299961 U JP H0299961U JP 716389 U JP716389 U JP 716389U JP 716389 U JP716389 U JP 716389U JP H0299961 U JPH0299961 U JP H0299961U
Authority
JP
Japan
Prior art keywords
chamber
sample
thin film
film
exposed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP716389U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP716389U priority Critical patent/JPH0299961U/ja
Publication of JPH0299961U publication Critical patent/JPH0299961U/ja
Pending legal-status Critical Current

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  • Physical Vapour Deposition (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の実施例の構成を示す縦断面図
、第2図は本考案の他の実施例の構成を示す要部
縦断面図である。 1…成膜用のチヤンバ、5…ヒータ室、6…ヒ
ータ、S…基板。
FIG. 1 is a vertical cross-sectional view showing the structure of an embodiment of the present invention, and FIG. 2 is a longitudinal cross-sectional view of main parts showing the structure of another embodiment of the present invention. 1... Chamber for film formation, 5... Heater chamber, 6... Heater, S... Substrate.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 所定雰囲気のチヤンバ内で、試料を電気ヒータ
により加熱し、その試料表面に成膜材料の粒子を
衝突させることによつて、その試料表面に薄膜を
形成する装置において、外壁面の少なくとも一部
が上記チヤンバ内に露呈し、かつ、そのチヤンバ
内とは気密に仕切られてなる室を設け、この室の
内部空間に上記ヒータを配設するとともに、この
室の上記チヤンバ内に露呈する面に膜を形成すべ
き試料を装着するよう構成したことを特徴とする
、薄膜製造装置。
In an apparatus for forming a thin film on a sample surface by heating the sample with an electric heater in a chamber with a predetermined atmosphere and colliding particles of a film-forming material on the sample surface, at least a portion of the outer wall surface is A chamber is provided that is exposed within the chamber and is airtightly partitioned from the interior of the chamber, and the heater is disposed in the internal space of this chamber, and a film is formed on the surface of this chamber that is exposed within the chamber. 1. A thin film manufacturing apparatus, characterized in that the apparatus is configured to mount a sample on which a thin film is to be formed.
JP716389U 1989-01-25 1989-01-25 Pending JPH0299961U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP716389U JPH0299961U (en) 1989-01-25 1989-01-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP716389U JPH0299961U (en) 1989-01-25 1989-01-25

Publications (1)

Publication Number Publication Date
JPH0299961U true JPH0299961U (en) 1990-08-09

Family

ID=31211950

Family Applications (1)

Application Number Title Priority Date Filing Date
JP716389U Pending JPH0299961U (en) 1989-01-25 1989-01-25

Country Status (1)

Country Link
JP (1) JPH0299961U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009157228A1 (en) * 2008-06-26 2009-12-30 キヤノンアネルバ株式会社 Sputtering apparatus, sputtering method and light emitting element manufacturing method
JP2021123749A (en) * 2020-02-05 2021-08-30 アリオス株式会社 Reactive sputtering apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009157228A1 (en) * 2008-06-26 2009-12-30 キヤノンアネルバ株式会社 Sputtering apparatus, sputtering method and light emitting element manufacturing method
JP2021123749A (en) * 2020-02-05 2021-08-30 アリオス株式会社 Reactive sputtering apparatus

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