JPH0297024A - Device for circulation and filtration of chemical for semiconductor wafer - Google Patents

Device for circulation and filtration of chemical for semiconductor wafer

Info

Publication number
JPH0297024A
JPH0297024A JP24911188A JP24911188A JPH0297024A JP H0297024 A JPH0297024 A JP H0297024A JP 24911188 A JP24911188 A JP 24911188A JP 24911188 A JP24911188 A JP 24911188A JP H0297024 A JPH0297024 A JP H0297024A
Authority
JP
Japan
Prior art keywords
chemical
storage tank
chemical liquid
tank
filtered
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24911188A
Other languages
Japanese (ja)
Inventor
Mitsuru Watanabe
満 渡辺
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP24911188A priority Critical patent/JPH0297024A/en
Publication of JPH0297024A publication Critical patent/JPH0297024A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To surly remove the dust in a chemical treatment vessel and to obtain the filter device with which the washing efficiency can be improved in an automatic washing device by a method wherein a first storage tank, in which the filtered chemical sent from the bottom of a chemical treatment vessel is stored, and a second storage tank on standby, storing the necessary quantity of constant-temperature chemical, are provided in the title filter device. CONSTITUTION:This filter device is provided with a chemical treatment vessel 30, with which a semiconductor wafer is surface-treated by dipping it therein, and a storage tank 40 in which the chemical taken out from the bottom part of the chemical treatment vessel 30 for removal of dust mixed in the chemical of the chemical vessel 30. In the chemical circulating filter device constituted in such a manner that the chemical in the storage tank 40 is filtered and returned to the chemical treatment vessel 30 again, the first storage tank 40, in which the filtered chemical comes out from the bottom part of the chemical treatment vessel 30 is stored, and a second storage tank 50 on standby, with the necessary quantity of chemical brought in constant temperature in advance, are provided. For example, after the chemical has been transferred to the second storage tank 50 from the first storage tank 40, the chemical is returned to the chemical treatment vessel 30, or the chemical is directly transferred to the chemical treatment vessel 30 while the chemical is being filtered.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、半導体製造工程のウェット処理装置における
薬液の循環濾過装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a circulation filtration device for a chemical solution in a wet processing device in a semiconductor manufacturing process.

(従来の技術) 従来、このような分野の技術としては、例えば特開昭6
2−195130号、特開昭62−281335号に記
載されるものがあった。
(Prior art) Conventionally, as a technology in this field, for example, Japanese Patent Application Laid-open No. 6
There were those described in No. 2-195130 and JP-A No. 62-281335.

その構成を図を用いて説明する。Its configuration will be explained using figures.

第2図はかかる従来の薬液循環濾過装置の概略構成図で
ある。
FIG. 2 is a schematic configuration diagram of such a conventional chemical liquid circulation filtration device.

この図に示すように、薬液処理槽1にはオーバフロー槽
2を設け、そのオーバフロー槽2をオーバフローした薬
液は、ポンプ3、フィルタ4を通して、再び薬液処理槽
1へ戻すように構成されていた。
As shown in this figure, the chemical solution processing tank 1 was provided with an overflow tank 2, and the chemical solution that overflowed the overflow tank 2 was configured to be returned to the chemical solution processing tank 1 through a pump 3 and a filter 4.

しかしながら、この薬液の循環濾過方式では、濾過され
る薬液は薬液処理槽1の外周に設けられるオーバフロー
槽2よりのオーバフロー分のみであり、薬液処理槽1内
で発生する淀み部分の薬液の循環濾過ができない。つま
り、確実な塵埃の除去ができない。従って、薬液処理槽
1底部より槽内の薬液を一旦全部取り出して回収タンク
に回収し、再び薬液処理槽1へ浄化(濾過)した薬液を
戻すようにしている。
However, in this chemical liquid circulation filtration method, the chemical liquid to be filtered is only the overflow from the overflow tank 2 provided on the outer periphery of the chemical liquid processing tank 1, and the chemical liquid in the stagnation part generated in the chemical liquid processing tank 1 is circulated and filtered. I can't. In other words, dust cannot be removed reliably. Therefore, all of the chemical liquid in the tank is once taken out from the bottom of the chemical liquid processing tank 1 and collected in a recovery tank, and the purified (filtered) chemical liquid is returned to the chemical liquid processing tank 1 again.

このiff過方式を第3図及び第4図を用いて詳細に説
明する。
This IF passing method will be explained in detail using FIGS. 3 and 4.

第3図においては、回収タンク5に供給された薬液(こ
こではエツチング液)はポンプ6、フィルタ7、バルブ
8を通り循環濾過される。次に、この薬液はバルブ9、
ポンプ6、フィルタ7、バルブ10を通して薬液処理槽
1へ供給され、薬液処理槽1でポンプ11、フィルタ1
2、バルブ13を通して循環濾過され、薬液処理可能な
状態となる。薬液処理終了後、薬液はバルブ14、ポン
プ11、フィルタ12、バルブ15を通して回収タンク
5へ戻され、回収タンク5内で循環濾過され、次の薬液
処理に備えるようになっている。
In FIG. 3, a chemical solution (here, an etching solution) supplied to a recovery tank 5 is circulated and filtered through a pump 6, a filter 7, and a valve 8. Next, this chemical solution is applied to valve 9,
It is supplied to the chemical treatment tank 1 through the pump 6, filter 7, and valve 10, and in the chemical treatment tank 1, the pump 11 and the filter 1 are supplied.
2. It is circulated and filtered through the valve 13 and becomes ready for chemical treatment. After the chemical liquid treatment is completed, the chemical liquid is returned to the recovery tank 5 through the valve 14, pump 11, filter 12, and valve 15, and is circulated and filtered within the recovery tank 5, in preparation for the next chemical liquid treatment.

また、第4図に示す薬液の循環濾過方式は、薬液中の塵
埃を減少させるために弁27を設けることにより、薬液
処理槽22中の薬液が循環バイブ26を通ってフィルタ
24に流れ込み、そのフィルタ24を通って浄化され、
薬液処理槽22中の薬液が全部貯溜タンク28に貯溜さ
れた後、ポンプ25によって再び薬液処理槽22に戻す
ような構成となっており、このように薬液処理槽22の
薬液を一括して循環濾過することにより、薬液中の塵埃
が減少するように構成されている。なお、ここで、21
は薬液槽、23は薬液供給バルブ、29a、29bは廃
液バルブである。
Further, in the chemical circulation filtration system shown in FIG. 4, by providing a valve 27 to reduce dust in the chemical, the chemical in the chemical treatment tank 22 flows into the filter 24 through the circulation vibrator 26, and is purified through a filter 24,
After all the chemical liquid in the chemical liquid processing tank 22 is stored in the storage tank 28, it is configured to be returned to the chemical liquid processing tank 22 again by the pump 25. In this way, the chemical liquid in the chemical liquid processing tank 22 is circulated all at once. The filter is configured to reduce dust in the chemical solution. In addition, here, 21
23 is a chemical liquid tank, 23 is a chemical liquid supply valve, and 29a and 29b are waste liquid valves.

(発明が解決しようとする課題) しかしながら、以上述べた全薬液濾過方法では、回収槽
への移し替え及び薬液槽への再移送の間に薬液が配管内
等に残存し、薬液容量が減少してしまうこと、また、こ
の薬液は一般に恒温コントロールされているため、移送
により薬液槽に戻された際、使用できる状態になるまで
一定時間要する等の点から、連続的に薬液処理槽を使用
することが不可能である。特に、自動洗浄装置のように
一定サイクルで処理されている場合は、上記問題点が顕
著に反映してくるものである。
(Problems to be Solved by the Invention) However, in the above-described all-chemical filtration method, the chemical remains in the piping etc. during transfer to the collection tank and retransfer to the chemical tank, resulting in a decrease in the chemical liquid capacity. Also, since this chemical solution is generally controlled at a constant temperature, it takes a certain amount of time for it to be ready for use when it is transferred back to the chemical solution tank, so it is recommended to use the chemical solution treatment tank continuously. It is impossible. Particularly, when processing is carried out in a fixed cycle, such as in an automatic cleaning device, the above-mentioned problems are clearly reflected.

本発明は、上記問題点を除去し、薬液処理槽中の塵埃を
確実に除去し、かつ自動洗浄装置における作業効率の向
上を図り得る半導体ウェハの薬液循環濾過装置を提供す
ることを目的とする。
SUMMARY OF THE INVENTION An object of the present invention is to provide a chemical circulation filtration device for semiconductor wafers that can eliminate the above-mentioned problems, reliably remove dust in a chemical processing tank, and improve work efficiency in an automatic cleaning device. .

(課題を解決するための手段) 本発明は、上記問題点を解決するために、半導体ウェハ
を浸漬して、該半導体ウェハの表面処理を行う薬液処理
槽と、該薬液処理槽の薬液中に混入した塵埃を除去する
ために該薬液処理槽底部から薬液を取り出して貯溜する
貯溜タンクと、該貯溜タンクから薬液を濾過して、再び
前記薬液処理槽に戻すように構成された薬液循環濾過装
置において、前記薬液処理槽底部より濾過した薬液を貯
溜する第1の貯溜タンクと、薬液の予め必要量を恒温し
て待機する第2の貯溜タンクとを設けるようにしたもの
である。
(Means for Solving the Problems) In order to solve the above-mentioned problems, the present invention provides a chemical treatment tank in which a semiconductor wafer is immersed to perform surface treatment on the semiconductor wafer, and a chemical solution in the chemical treatment tank. A storage tank that takes out and stores a chemical solution from the bottom of the chemical processing tank in order to remove mixed dust; and a chemical circulation filtration device that is configured to filter the chemical solution from the storage tank and return it to the chemical processing tank. A first storage tank for storing the chemical liquid filtered from the bottom of the chemical liquid processing tank, and a second storage tank for holding a required amount of the chemical liquid at a constant temperature in advance are provided.

(作用) 本発明によれば、上記したように、薬液を薬液処理槽底
部からポンプ、フィルタを通して第1の貯溜タンクに貯
溜し、前記空になった薬液処理槽に予め、一定量秤量し
、かつ所定温度に恒温された薬液を供給する第2の貯溜
タンクを設ける。そして、薬液を第1の貯溜タンクから
第2の貯溜タンクへ移送し、前記一定秤量及び恒温して
、次の給液に備える。
(Function) According to the present invention, as described above, the chemical liquid is stored in the first storage tank from the bottom of the chemical liquid processing tank through the pump and the filter, and a certain amount is weighed in advance into the empty chemical liquid processing tank, A second storage tank is also provided for supplying a chemical solution kept at a predetermined temperature. Then, the chemical liquid is transferred from the first storage tank to the second storage tank, and is weighed and kept at a constant temperature in preparation for the next liquid supply.

また、比較的処理サイクルに余裕がある場合においては
、第2の貯溜タンクに貯溜することなく、第1の貯溜タ
ンクから直接第2の貯溜タンクに濾過して移送し、一定
秤量及び恒温にした後、薬液処理槽に給液することがで
きる。
In addition, if there is a comparatively long margin in the processing cycle, the first storage tank may be directly filtered and transferred to the second storage tank without storing it in the second storage tank to maintain a constant weight and constant temperature. After that, the liquid can be supplied to the chemical treatment tank.

(実施例) 以下、本発明の実施例について図面を参照しながら詳細
に説明する。
(Example) Hereinafter, an example of the present invention will be described in detail with reference to the drawings.

第1図は本発明の実施例を示す半導体ウェハの薬液循環
濾過装置の構成図である。
FIG. 1 is a block diagram of a chemical circulation filtration apparatus for semiconductor wafers showing an embodiment of the present invention.

この図に示すように、通常、薬液処理槽30より溢れた
薬液は、オーバフロ一部分31から循環パイプ32を通
りポンプ33によってフィルタ34に送り込まれ、薬液
中の塵埃を除去した後、弁35を通過し、再び薬液処理
槽30に戻される。この場合、循環パイプ中の弁36.
37.38.39は閉じている。
As shown in this figure, normally, the chemical liquid overflowing from the chemical liquid processing tank 30 is sent from an overflow part 31 through a circulation pipe 32 to a filter 34 by a pump 33, and after removing dust in the chemical liquid, it passes through a valve 35. Then, it is returned to the chemical treatment tank 30 again. In this case, valve 36. in the circulation pipe.
37.38.39 are closed.

次に、上記の循環路を一定の処理量及び時間を経過した
後、弁36.37を開き、弁35を閉じることによって
、薬液処理槽30の薬液は弁36、ポンプ33、フィル
タ34、弁37を通過して、第1の貯溜タンク40へ移
送される。ここで、弁38、排液弁39は閉じたままで
ある。
Next, after a certain amount of processing and a certain amount of time have passed through the above circulation path, the valves 36 and 37 are opened and the valve 35 is closed, so that the chemical liquid in the chemical liquid processing tank 30 is transferred to the valve 36, the pump 33, the filter 34, and the valve 35. 37 and is transferred to the first storage tank 40. Here, the valve 38 and the drain valve 39 remain closed.

次に、空になった薬液処理槽30を純水で洗浄する。こ
の時、弁36は閉じて、排液弁39が開き、洗浄水が排
出され、洗浄後排液弁39を閉じる。ここで、弁35.
38は閉じたままである。
Next, the empty chemical treatment tank 30 is washed with pure water. At this time, the valve 36 is closed, the drain valve 39 is opened, the wash water is discharged, and the drain valve 39 is closed after washing. Here, valve 35.
38 remains closed.

次に、薬液処理槽30が空になると、第2の貯溜タンク
50より薬液処理槽30へ薬液が供給される。
Next, when the chemical liquid processing tank 30 becomes empty, the chemical liquid is supplied from the second storage tank 50 to the chemical liquid processing tank 30.

この第2の貯溜タンク50には、薬液処理槽30へ供給
するのに必要な量の薬液が秤量袋254、例えばレベル
検知器によって秤量されて貯えられるようになっている
。更に、薬液は恒温制御装置55によって所定温度に制
御されるように構成されている。
In this second storage tank 50, the amount of chemical liquid required to be supplied to the chemical liquid processing tank 30 is measured and stored using a weighing bag 254, for example, a level detector. Furthermore, the chemical solution is configured to be controlled to a predetermined temperature by a constant temperature control device 55.

第2の貯溜タンク50の薬液は、底部に設けられた弁5
1を開くことによって、供給パイプ52を通って薬液処
理槽30に供給される。この供給の方法は落差によって
自然に供給されるが、圧送用ポンプを使用するようにし
ても良い。
The chemical liquid in the second storage tank 50 is stored at a valve 5 provided at the bottom.
1 is opened, the chemical solution is supplied to the chemical treatment tank 30 through the supply pipe 52. This method of supply is naturally carried out by a head, but a pressure pump may also be used.

次に、第2の貯溜タンク50の薬液が空になったら、第
1の貯溜クンク40より弁41を開き、ポンプ42、移
送パイプ43を通過し、切替弁44を開き、移送パイプ
45を通って、薬液が第2の貯溜タンク50へ送られる
。なお、ポンプ42の後段に濾過用フィルタを設けるよ
うにしてもよい。
Next, when the second storage tank 50 is empty, the first storage tank 40 opens the valve 41, passes through the pump 42 and transfer pipe 43, opens the switching valve 44, and passes through the transfer pipe 45. Then, the chemical solution is sent to the second storage tank 50. Note that a filtration filter may be provided after the pump 42.

このようにして、第2の貯溜タンク50に送られた薬液
は秤量装置54によって秤量され、薬液処理槽30へ供
給するのに必要な量に満たない場合は、不足する薬液の
量だけ薬液供給バルブ53から供給(補給)される。そ
して、第2の貯溜タンク50へ供給された薬液は恒温制
御袋W55によって所定温度に制御され、薬液処理槽3
0への供給に備える。
In this way, the chemical liquid sent to the second storage tank 50 is weighed by the weighing device 54, and if the amount is less than the amount required to be supplied to the chemical liquid processing tank 30, the chemical liquid is supplied by the amount of the chemical liquid that is insufficient. It is supplied (supplied) from the valve 53. The chemical solution supplied to the second storage tank 50 is controlled to a predetermined temperature by the constant temperature control bag W55, and the chemical solution processing tank 3
Prepare for supply to 0.

また、比較的処理量及び処理サイクルに余裕のある装置
及び工程で使用する場合は、薬液を薬液処理槽30から
濾過しながら、第1の貯溜タンク40へは送らずに、直
接第2の貯溜タンク50へ移送することができる。この
場合、当然第2の貯溜タンク50は空である。この移送
は薬液処理槽30の弁36を開き、ポンプ33、フィル
タ34、弁38、移送パイプ45を通過し、第2の貯溜
タンク50へ移送される。
In addition, when used in an apparatus or process that has a comparatively large processing amount and processing cycle, it is possible to filter the chemical solution from the chemical processing tank 30 and directly transfer it to the second storage tank 40 without sending it to the first storage tank 40. It can be transferred to tank 50. In this case, the second storage tank 50 is naturally empty. This transfer opens the valve 36 of the chemical treatment tank 30, passes through the pump 33, filter 34, valve 38, and transfer pipe 45, and is transferred to the second storage tank 50.

移送された第2の貯溜タンク50内の薬液は、上記と同
様な手段で管理された後、薬液処理槽30に供給され、
循環濾過されながら、処理ウェハの投入を持つようする
こともできる。
The transferred chemical liquid in the second storage tank 50 is managed by the same means as described above, and then supplied to the chemical liquid processing tank 30,
It is also possible to have processing wafers input while being circulated and filtered.

このような装置及びパイプラインの敷設により、手作業
をなくし、省力化、自動化、安全化を推進することがで
きる。
By installing such equipment and pipelines, manual work can be eliminated and labor savings, automation, and safety can be promoted.

なお、本発明は上記実施例に限定されるものではなく、
本発明の趣旨に基づいて種々の変形が可能であり、これ
らを本発明の範囲から排除するものではない。
Note that the present invention is not limited to the above embodiments,
Various modifications are possible based on the spirit of the present invention, and these are not excluded from the scope of the present invention.

(発明の効果) 以上、詳細に説明したように、本発明によれば、薬液処
理槽底部より濾過した薬液を貯溜する第1の貯溜タンク
と、予め必要量を恒温して待機する第2の貯溜タンクを
設けるようにしたので、薬液の温度管理を行うことがで
き、短時間で薬液処理槽を使用することが可能となり、
確実に薬液中の塵埃を除去し、かつ作業効率を大幅に向
上することができる。
(Effects of the Invention) As described in detail above, according to the present invention, there is a first storage tank that stores the chemical liquid filtered from the bottom of the chemical liquid processing tank, and a second storage tank that holds the necessary amount at a constant temperature in advance. Since a storage tank is provided, the temperature of the chemical solution can be controlled, and the chemical processing tank can be used in a short period of time.
It is possible to reliably remove dust from the chemical solution and greatly improve work efficiency.

また、濾過、移送によって配管内等に薬液が残存するこ
とによる薬液の減少を補うことができる。
Further, it is possible to compensate for the decrease in the amount of the chemical solution due to the chemical solution remaining in the piping etc. by filtration and transfer.

すなわち、濾過のために薬液処理槽から第1の貯溜タン
クへ薬液を流したすぐ後に、第2の貯溜タンクから、濾
過されていると共に量及び温度が管理済の薬液を供給す
ることができるので、濾過後の処理の立ち上がりを速く
することができる。
That is, immediately after the chemical liquid is poured from the chemical liquid processing tank to the first storage tank for filtration, the chemical liquid that has been filtered and whose quantity and temperature are controlled can be supplied from the second storage tank. , it is possible to speed up the start-up of the treatment after filtration.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例を示す半導体ウェハの薬液循環
濾過装置の構成図、第2図は従来の半導体ウェハの薬液
循環濾過装置の構成図、第3図は従来の他の半導体ウェ
ハの薬液循環濾過装置の構成図、第4図は従来の更なる
他の半導体ウェハの薬液循環濾過装置の構成図である。 30・・・薬液処理槽、31・・・オーバフロ一部分、
32・・・循環パイプ、33.42・・・ポンプ、34
・・・フィルタ、35゜36、37.3B、 39.4
1.44.51・・・弁、40・・・第1の貯溜タンク
、45・・・移送パイプ、50・・・第2の貯溜タンク
、52・・・供給パイプ、53・・・薬液供給バルブ。 特許出願人 沖電気工業株式会社
FIG. 1 is a block diagram of a chemical circulation filtration device for semiconductor wafers showing an embodiment of the present invention, FIG. 2 is a block diagram of a conventional chemical circulation filtration device for semiconductor wafers, and FIG. 3 is a block diagram of another conventional semiconductor wafer chemical circulation filtration device. FIG. 4 is a block diagram of yet another conventional chemical circulation filtration device for semiconductor wafers. 30... Chemical solution processing tank, 31... Overflow part,
32...Circulation pipe, 33.42...Pump, 34
...Filter, 35°36, 37.3B, 39.4
1.44.51... Valve, 40... First storage tank, 45... Transfer pipe, 50... Second storage tank, 52... Supply pipe, 53... Chemical solution supply valve. Patent applicant Oki Electric Industry Co., Ltd.

Claims (4)

【特許請求の範囲】[Claims] (1)半導体ウェハを浸漬して、該半導体ウェハの表面
処理を行う薬液処理槽と、該薬液処理槽の薬液中に混入
した塵埃を除去するために該薬液処理槽底部から薬液を
取り出して貯溜する貯溜タンクと、該貯溜タンクから薬
液を濾過して、再び前記薬液処理槽に戻すように構成さ
れた薬液循環濾過装置において、 前記薬液処理槽底部より濾過した薬液を貯溜する第1の
貯溜タンクと、薬液の予め必要量を恒温して待機する第
2の貯溜タンクとを設けるようにしたことを特徴とする
半導体ウェハの薬液循環濾過装置。
(1) A chemical processing tank in which semiconductor wafers are immersed to perform surface treatment on the semiconductor wafers, and a chemical solution taken out from the bottom of the chemical processing tank and stored in order to remove dust mixed into the chemical solution in the chemical processing tank. and a chemical liquid circulation filtration device configured to filter the chemical liquid from the storage tank and return it to the chemical liquid processing tank, the first storage tank storing the chemical liquid filtered from the bottom of the chemical liquid processing tank. 1. A chemical solution circulation filtration device for semiconductor wafers, comprising: a second storage tank in which a necessary amount of the chemical solution is kept at a constant temperature in advance and is on standby.
(2)薬液を第1の貯溜タンクから第2の貯溜タンクへ
移送し、しかる後、前記薬液処理槽に戻すようにしたこ
とを特徴とする請求項1記載の半導体ウェハの薬液循環
濾過装置。
(2) The chemical liquid circulation filtration device for semiconductor wafers according to claim 1, wherein the chemical liquid is transferred from the first storage tank to the second storage tank and then returned to the chemical liquid processing tank.
(3)前記薬液処理槽底部より薬液を濾過しながら、直
接第2の貯溜タンクへ移送するようにしたことを特徴と
する請求項1記載の半導体ウェハの薬液循環濾過装置。
(3) The chemical liquid circulation filtration device for semiconductor wafers according to claim 1, wherein the chemical liquid is directly transferred to the second storage tank while being filtered from the bottom of the chemical liquid processing tank.
(4)濾過、移送によって配管内等に薬液が残存するこ
とによる薬液の減少を、前記第2の貯溜タンクへの薬液
の補充によって補うようにしたことを特徴とする請求項
1、2又は3項記載の半導体ウェハの薬液循環濾過装置
(4) Claims 1, 2, or 3, characterized in that a decrease in the chemical solution caused by the chemical solution remaining in the piping or the like due to filtration or transfer is compensated for by replenishing the second storage tank with the chemical solution. A chemical liquid circulation filtration device for semiconductor wafers as described in 2.
JP24911188A 1988-10-04 1988-10-04 Device for circulation and filtration of chemical for semiconductor wafer Pending JPH0297024A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24911188A JPH0297024A (en) 1988-10-04 1988-10-04 Device for circulation and filtration of chemical for semiconductor wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24911188A JPH0297024A (en) 1988-10-04 1988-10-04 Device for circulation and filtration of chemical for semiconductor wafer

Publications (1)

Publication Number Publication Date
JPH0297024A true JPH0297024A (en) 1990-04-09

Family

ID=17188117

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24911188A Pending JPH0297024A (en) 1988-10-04 1988-10-04 Device for circulation and filtration of chemical for semiconductor wafer

Country Status (1)

Country Link
JP (1) JPH0297024A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04256318A (en) * 1991-02-08 1992-09-11 Nec Yamagata Ltd Chemical treatment device
US5656156A (en) * 1994-06-10 1997-08-12 Sims; Charles Filtration system for closed cycle parts washer
JPH112806A (en) * 1997-03-21 1999-01-06 Lg Electron Inc Etching device
US7159322B2 (en) 2003-11-28 2007-01-09 Honda Motor Co., Ltd. Power working machine
JP2013165217A (en) * 2012-02-13 2013-08-22 Dainippon Screen Mfg Co Ltd Substrate processing method and substrate processing apparatus

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04256318A (en) * 1991-02-08 1992-09-11 Nec Yamagata Ltd Chemical treatment device
US5656156A (en) * 1994-06-10 1997-08-12 Sims; Charles Filtration system for closed cycle parts washer
JPH112806A (en) * 1997-03-21 1999-01-06 Lg Electron Inc Etching device
US8043466B1 (en) 1997-03-21 2011-10-25 Lg Display Co., Ltd Etching apparatus
US7159322B2 (en) 2003-11-28 2007-01-09 Honda Motor Co., Ltd. Power working machine
JP2013165217A (en) * 2012-02-13 2013-08-22 Dainippon Screen Mfg Co Ltd Substrate processing method and substrate processing apparatus

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