JPH04256318A - Chemical treatment device - Google Patents
Chemical treatment deviceInfo
- Publication number
- JPH04256318A JPH04256318A JP1780691A JP1780691A JPH04256318A JP H04256318 A JPH04256318 A JP H04256318A JP 1780691 A JP1780691 A JP 1780691A JP 1780691 A JP1780691 A JP 1780691A JP H04256318 A JPH04256318 A JP H04256318A
- Authority
- JP
- Japan
- Prior art keywords
- chemical
- chemicals
- vessel
- tank
- filter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000126 substance Substances 0.000 title claims abstract description 76
- 239000007788 liquid Substances 0.000 claims abstract description 29
- 238000004140 cleaning Methods 0.000 claims abstract description 7
- 239000004065 semiconductor Substances 0.000 claims abstract description 6
- 238000005530 etching Methods 0.000 claims description 4
- 238000012545 processing Methods 0.000 claims description 3
- 238000007599 discharging Methods 0.000 claims description 2
- 238000012993 chemical processing Methods 0.000 abstract description 8
- 230000000694 effects Effects 0.000 abstract description 4
- 238000000034 method Methods 0.000 abstract description 3
- 235000012431 wafers Nutrition 0.000 description 8
- 239000000428 dust Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 230000003749 cleanliness Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は薬液処理装置に関し、特
に半導体装置用の薬液処理装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a chemical processing apparatus, and more particularly to a chemical processing apparatus for semiconductor devices.
【0002】0002
【従来の技術】従来の薬液処理装置は図2に示すように
、薬液を満たして半導体ウェーハのエッチングや洗浄を
行う薬液層14と、薬液槽14よりオーバフローさせた
薬液を回収して送り出すポンプ16と、ポンプ16から
の薬液を濾過して薬液槽14に供給するフィルタ15と
を有しており、薬液の清浄度を向上させるために薬液槽
14の形状を工夫したり、ポンプ16の容量を大きくし
て流量を増やす等の施策がとられていた。2. Description of the Related Art A conventional chemical processing apparatus, as shown in FIG. 2, includes a chemical layer 14 filled with a chemical for etching or cleaning a semiconductor wafer, and a pump 16 that collects and sends out the chemical overflowing from the chemical tank 14. and a filter 15 that filters the chemical liquid from the pump 16 and supplies it to the chemical liquid tank 14. In order to improve the cleanliness of the chemical liquid, the shape of the chemical liquid tank 14 may be devised or the capacity of the pump 16 may be increased. Measures were taken to increase the size and flow rate.
【0003】0003
【発明が解決しようとする課題】この従来の薬液処理装
置では、薬液の全部を一度に確実に濾過することができ
ないため、ウェーハに付着して前工程から持込まれたダ
ストや処理中に発生したダストが、濾過され減少するま
で莫大な時間を要し、通常用いられている。ウェーハの
処理時間内では清浄化することができず、常に薬液中に
ダストが増加して行くという問題点があった。[Problems to be Solved by the Invention] This conventional chemical processing equipment cannot reliably filter all of the chemical at once, so dust that has adhered to the wafer and has been brought in from the previous process, and dust that has been generated during processing. It takes a huge amount of time for the dust to be filtered out and reduced, which is what is normally used. There is a problem in that cleaning cannot be done within the wafer processing time, and dust constantly increases in the chemical solution.
【0004】0004
【課題を解決するための手段】本発明の薬液処理装置は
、薬液中で半導体ウェーハのエッチングや洗浄を行うた
めの薬液層と、前記薬液層に接続した複数の排液バルブ
と、前記排液バルブの夫々に接続して前記薬液槽の薬液
を溜める予備槽と、前記予備槽に接続して前記予備槽内
の薬液を循環させ且つ浄化するポンプ及びフィルタと、
前記フィルタの出力側に接続して濾過した前記予備槽の
薬液を前記薬液槽に供給する供液バルブとを含んで構成
される。[Means for Solving the Problems] A chemical processing apparatus of the present invention includes a chemical layer for etching or cleaning a semiconductor wafer in a chemical, a plurality of drain valves connected to the chemical layer, and a plurality of drain valves connected to the chemical layer. a reserve tank connected to each of the valves to store the chemical liquid in the chemical tank; a pump and a filter connected to the reserve tank to circulate and purify the chemical liquid in the reserve tank;
The liquid supply valve is connected to the output side of the filter and supplies the filtered chemical liquid from the preliminary tank to the chemical liquid tank.
【0005】[0005]
【実施例】次に、本発明について図面を参照して説明す
る。DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be explained with reference to the drawings.
【0006】図1は本発明の一実施例を説明するための
ブロック図である。FIG. 1 is a block diagram for explaining one embodiment of the present invention.
【0007】図1に示すように、薬液中で半導体ウェー
ハのエッチングや洗浄を行うための薬液槽1と、薬液槽
1に接続して薬液槽1中の薬液を排出するための第1及
び第2の排液バルブ8,9と、排液バルブ8,9の夫々
に接続して薬液槽1の薬液を全量収納できる第1及び第
2の予備槽2,3と、予備槽2,3の夫々に接続して予
備層2,3の夫々の薬液を排出させる第1及び第2のポ
ンプ12,13と、ポンプ12,13の夫々に接続して
薬液を濾過する第1及び第2のフィルタ10,11と、
フィルタ11,12の夫々に接続して薬液を予備槽2,
3に戻すための第1及び第2の循環バルブ6,7と、フ
ィルタ11,12に接続して清浄化した薬液を薬液槽1
に供給するための第1及び第2の給液バルブ4,5とを
備えている。As shown in FIG. 1, there is a chemical tank 1 for etching and cleaning semiconductor wafers in a chemical solution, and a first and a second tank connected to the chemical tank 1 for discharging the chemical solution in the chemical tank 1. 2 drain valves 8 and 9, first and second reserve tanks 2 and 3 which are connected to the drain valves 8 and 9 and can store the entire amount of the chemical liquid in the chemical liquid tank 1, and First and second pumps 12 and 13 that are connected to each other to discharge the respective chemical liquids from the preliminary layers 2 and 3, and first and second filters that are connected to the pumps 12 and 13 respectively to filter the chemical liquids. 10, 11 and
The preparatory tank 2,
The first and second circulation valves 6 and 7 are connected to filters 11 and 12 for returning the cleaned chemical solution to the chemical tank 1.
The first and second liquid supply valves 4 and 5 are provided for supplying liquid to the liquid.
【0008】薬液槽1で半導体ウェーハをエッチング又
は洗浄した薬液は排液バルブ8を開いて薬液槽1内で薬
液の全量を予備槽2に移した後排液バルブ8を閉じる。
次にポンプ13,フィルタ11,循環バルブ7により循
環させ濾過していた予備槽3の薬液を循環バルブ7を閉
じ、給液バルブ5を開いて、薬液槽1に供給し、次の薬
液処理を行う。薬液槽1で薬液処理で行っている間に予
備槽2に移した薬液をポンプ12,フィルタ10,循環
バルブ6により循環させ濾過して浄化する。A drain valve 8 is opened to transfer the entire amount of the chemical in the chemical tank 1 to the preliminary tank 2, and then the drain valve 8 is closed. Next, the circulation valve 7 is closed, the liquid supply valve 5 is opened, and the chemical liquid in the preliminary tank 3, which has been circulated and filtered by the pump 13, filter 11, and circulation valve 7, is supplied to the chemical liquid tank 1, and the next chemical liquid treatment is carried out. conduct. During the chemical treatment in the chemical tank 1, the chemical liquid transferred to the preliminary tank 2 is circulated by a pump 12, a filter 10, and a circulation valve 6, and is filtered and purified.
【0009】このように予備槽2,3の薬液を交互に薬
液槽1に供給し、且つ交互に循環させて浄化することに
より、薬液槽の薬液の全量を一度に清浄化させた薬液と
交換でき薬液の清浄効果を向上させることができる。In this way, by alternately supplying the chemical solutions in the reserve tanks 2 and 3 to the chemical solution tank 1 and purifying them by circulating them alternately, the entire amount of the chemical solution in the chemical solution tank can be replaced with the purified chemical solution at once. The cleaning effect of the resulting chemical solution can be improved.
【0010】なお、予備槽を含む浄化系は3組以上に増
設しても良く、薬液の使用期間を短くでき清浄度の高い
薬液で処理できる。[0010] Note that three or more sets of purification systems including preliminary tanks may be installed, so that the usage period of the chemical solution can be shortened and treatment can be performed with a highly clean chemical solution.
【0011】[0011]
【発明の効果】以上説明したように本発明は、薬液をバ
ッチ式で完全に濾過できる機能を有するのでウェーハは
、常に清浄化された薬液で処理され、また、ウェーハに
付着して持ち込まれた前工程からのダストも完全に除去
できるという効果を有する。[Effects of the Invention] As explained above, the present invention has the function of completely filtering the chemical solution in a batch manner, so that the wafers are always treated with the cleaned chemical solution, and the wafers are not brought in with the chemical solution attached to the wafers. This has the effect of completely removing dust from the previous process.
【図1】本発明の一実施例を説明するためのブロック図
である。FIG. 1 is a block diagram for explaining one embodiment of the present invention.
【図2】従来の薬液処理装置を説明するためのブロック
図である。FIG. 2 is a block diagram for explaining a conventional chemical processing device.
1,14 薬液槽 2,3 予備槽 4,5 給液バルブ 6,7 循環バルブ 8,9 排液バルゴ 10,11,15 フィルタ 12,13,16 ポンプ 1,14 Chemical tank 2, 3 Preliminary tank 4, 5 Liquid supply valve 6,7 Circulation valve 8,9 Drainage balgo 10, 11, 15 Filter 12, 13, 16 Pump
Claims (1)
や洗浄を行うための薬液層と、前記薬液層に接続した複
数の排液バルブと、前記排液バルブの夫々に接続して前
記薬液槽の薬液を溜める予備槽と、前記予備槽に接続し
て前記予備槽内の薬液を循環させ且つ浄化するポンプ及
びフィルタと、前記フィルタの出力側に接続して濾過し
た前記予備槽の薬液を前記薬液槽に供給する供液バルブ
とを含むことを特徴とする薬液処理装置。1. A chemical layer for etching or cleaning a semiconductor wafer in a chemical solution, a plurality of drain valves connected to the chemical layer, and a plurality of drain valves connected to each of the drain valves for discharging the chemical solution in the chemical tank. a pump and filter connected to the reserve tank to circulate and purify the chemical solution in the reserve tank; and a pump and filter connected to the output side of the filter to transfer the filtered chemical solution in the reserve tank to the chemical solution tank. A chemical liquid processing device comprising: a liquid supply valve for supplying a liquid to the liquid supply valve;
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1780691A JPH04256318A (en) | 1991-02-08 | 1991-02-08 | Chemical treatment device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1780691A JPH04256318A (en) | 1991-02-08 | 1991-02-08 | Chemical treatment device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04256318A true JPH04256318A (en) | 1992-09-11 |
Family
ID=11953972
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1780691A Pending JPH04256318A (en) | 1991-02-08 | 1991-02-08 | Chemical treatment device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04256318A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6415803B1 (en) * | 1999-10-06 | 2002-07-09 | Z Cap, L.L.C. | Method and apparatus for semiconductor wafer cleaning with reuse of chemicals |
JP2017063107A (en) * | 2015-09-24 | 2017-03-30 | エスアイアイ・セミコンダクタ株式会社 | Semiconductor substrate processing device, method for removing photoresist, and method for manufacturing semiconductor device |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62258735A (en) * | 1986-05-01 | 1987-11-11 | Nec Kyushu Ltd | Apparatus for recirculating chemical liquid |
JPS63289819A (en) * | 1987-05-21 | 1988-11-28 | Nec Corp | Wet etching equipment |
JPH0297024A (en) * | 1988-10-04 | 1990-04-09 | Oki Electric Ind Co Ltd | Device for circulation and filtration of chemical for semiconductor wafer |
-
1991
- 1991-02-08 JP JP1780691A patent/JPH04256318A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62258735A (en) * | 1986-05-01 | 1987-11-11 | Nec Kyushu Ltd | Apparatus for recirculating chemical liquid |
JPS63289819A (en) * | 1987-05-21 | 1988-11-28 | Nec Corp | Wet etching equipment |
JPH0297024A (en) * | 1988-10-04 | 1990-04-09 | Oki Electric Ind Co Ltd | Device for circulation and filtration of chemical for semiconductor wafer |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6415803B1 (en) * | 1999-10-06 | 2002-07-09 | Z Cap, L.L.C. | Method and apparatus for semiconductor wafer cleaning with reuse of chemicals |
JP2017063107A (en) * | 2015-09-24 | 2017-03-30 | エスアイアイ・セミコンダクタ株式会社 | Semiconductor substrate processing device, method for removing photoresist, and method for manufacturing semiconductor device |
CN106919014A (en) * | 2015-09-24 | 2017-07-04 | 精工半导体有限公司 | The manufacture method of semiconductor substrate processing apparatus, stripping means and semiconductor device |
US10916454B2 (en) | 2015-09-24 | 2021-02-09 | Ablic Inc. | Method of stripping a photoresist, and method of manufacturing a semiconductor device |
CN106919014B (en) * | 2015-09-24 | 2021-05-11 | 艾普凌科有限公司 | Semiconductor substrate processing apparatus, peeling method, and method for manufacturing semiconductor device |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100226548B1 (en) | Wet treating apparatus of semiconductor wafer | |
KR102382902B1 (en) | Substrate processing apparatus, cleaning method of substrate processing apparatus | |
JP3138901B2 (en) | Substrate immersion processing equipment | |
JPH04256318A (en) | Chemical treatment device | |
JP2000058492A (en) | Immersion processing system for substrate | |
JP2541443B2 (en) | Wet etching apparatus and filter regeneration method | |
JP2003142448A (en) | Operating method of substrate-washing apparatus | |
JPH09219386A (en) | Cleaning equipment | |
JP2000183024A (en) | Substrate-processing apparatus | |
JPS62156659A (en) | Method and apparatus for cleaning | |
KR100701395B1 (en) | Apparatus and method for cleaning autostrainer by detergent | |
JPH0831789A (en) | Surface treatment apparatus for substrate | |
JPH04290432A (en) | Semiconductor manufacturing device | |
JPH1050654A (en) | Wafer-treating apparatus | |
JPH05331652A (en) | Wet film-forming device | |
JPH0521415A (en) | Semiconductor processor | |
JPS62195130A (en) | Wet type semiconductor manufacturing equipment | |
JPS62140423A (en) | Manufacturing equipment for semiconductor integrated circuit device | |
JPH08167546A (en) | Wet treatment device | |
JP2002075957A (en) | Device for manufacturing semiconductor | |
JPH0596257A (en) | Part washing device | |
JPH088223A (en) | Method and apparatus for cleaning semiconductor substrate | |
JP2588402Y2 (en) | Liquid supply / drain passage device for substrate processing equipment | |
JPS63128186A (en) | Wet etching device | |
JPH06114311A (en) | Chemical treatment apparatus |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 19970603 |