JPH0294719A - Faulty point detection system for time division multiplex communication system - Google Patents

Faulty point detection system for time division multiplex communication system

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Publication number
JPH0294719A
JPH0294719A JP24604188A JP24604188A JPH0294719A JP H0294719 A JPH0294719 A JP H0294719A JP 24604188 A JP24604188 A JP 24604188A JP 24604188 A JP24604188 A JP 24604188A JP H0294719 A JPH0294719 A JP H0294719A
Authority
JP
Japan
Prior art keywords
test signal
circuit
time division
time
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24604188A
Other languages
Japanese (ja)
Inventor
Norio Ito
伊藤 典雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP24604188A priority Critical patent/JPH0294719A/en
Publication of JPH0294719A publication Critical patent/JPH0294719A/en
Pending legal-status Critical Current

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  • Time-Division Multiplex Systems (AREA)

Abstract

PURPOSE:To detect at which location a fault takes place by providing an inverse logic arithmetic circuit for the processing of a test signal. CONSTITUTION:A reception signal processing unit 30 of a time division multiplexer 3 at the receiver side applies signal processing to a received data 106, a test signal demultiplexing circuit 31 demultiplexes a test signal 107 and inverse logic arithmetic circuits 33a-33n apply the inverse logic arithmetic operation to the test signal 107 using patterns 103a-103n from pattern generating circuits 32a-32n. If a repeater 2A is faulty and the signal therefrom shows all consecutive 0s, the result of the operation with a pattern 103b of a repeater 2B indicates all 0s. Thus, the time division multiplexer 3 at the receiver side can detect a faulty location depending whether any result of the inverse logic arithmetic circuits 33a-33n depicts all 0s or all 1s.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は時分割多重通信システムの障害箇所検出方式に
関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a fault detection method for a time division multiplex communication system.

〔従来の技術〕[Conventional technology]

従来、この種の複数の中継装置を含む時分割多重通信シ
ステムでは、各中継装置が障害検出回路を有しており、
ある中継装置内で障害が発生したとき、その障害を検出
した次段の中継装置が送信データの特定タイムスロット
に障害情報を時分割多重化してさらに次段の中継装置又
は受信側の時分割多重装置に伝送していた。
Conventionally, in this type of time division multiplex communication system including multiple relay devices, each relay device has a fault detection circuit.
When a failure occurs in a relay device, the next-stage relay device that detects the failure time-division multiplexes the failure information into a specific time slot of the transmitted data, and then time-division multiplexes it to the next-stage relay device or the receiving side. was transmitting to the device.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来の時分割多重通信システムの障害検出方式
は、受信側の時分割多重装置において受信データに時分
割多重化されている障害情報により中継区間の障害の有
無のみを検出しており、中継区間のどの中継装置で障害
が検出されたかは判定できないため、特に中継段数が多
くなると障害箇所の検出が容易ではないという欠点があ
る。
The failure detection method of the conventional time division multiplex communication system described above detects only the presence or absence of a failure in the relay section based on the failure information time division multiplexed with the received data in the time division multiplexer on the receiving side. Since it is not possible to determine in which relay device in a section a failure has been detected, there is a drawback that it is not easy to detect the failure location, especially when the number of relay stages increases.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の時分割多重通信システムの障害箇所検出方式は
、2つの時分割多重装置間の信号を多段中継する複数の
中継装置から構成される時分割多重通信システムにおい
て、送信側の前記時分割多重装置は送信データの信号処
理を行う送信信号処理回路と、テスト信号を発生するテ
スト信号発生回路と、このテスト信号発生回路の出力信
号を送信データの特定のタイムスロットに時分割多重化
するテスト信号多重化回路とを備え、前記各中継装置は
前段の前記時分割多重化装置又は前段の前記中継装置か
らの受信データに対してデータの時分割多重化及び分離
を行うデータ多重化分離回路と、それぞれ自中継装置に
固有なパタンを発生する固有パタン発生回路と、この固
有パタン発生回路の出力信号を用いて送信データに時分
割多重化されているテスト信号に論理演算を行う演算回
路とを備え、受信側の前記時分割多重装置は前段の前記
中継装置からの受信データの信号処理を行う受信信号処
理回路と、前記受信データに時分割多重化されている前
記テスト信号を分離するテス1へ信号分離回路と、前記
各中継装置の前記固有パタンと同一のパタンを発生する
複数のパタン発生回路と、このパタン発生回路の出力信
号を用いて前記受信データから分離したテスト信号に前
記各中継装置で行ったのとは逆の論理演算を行う逆論理
演算回路とを備えることを特徴とする。
The failure point detection method for a time division multiplex communication system of the present invention is a time division multiplex communication system that includes a plurality of relay devices that relay signals between two time division multiplex devices in multiple stages. The device includes a transmission signal processing circuit that performs signal processing of transmission data, a test signal generation circuit that generates a test signal, and a test signal that time-division multiplexes the output signal of the test signal generation circuit into a specific time slot of the transmission data. a data multiplexing and demultiplexing circuit that performs time division multiplexing and demultiplexing of data for received data from the time division multiplexing device in the preceding stage or the relay device in the preceding stage; Each device is equipped with a unique pattern generation circuit that generates a unique pattern for its own repeater, and an arithmetic circuit that performs logical operations on a test signal that is time-division multiplexed with transmission data using the output signal of this unique pattern generation circuit. , the time division multiplexing device on the receiving side includes a reception signal processing circuit that performs signal processing of the reception data from the relay device in the previous stage, and a test signal that separates the test signal time division multiplexed with the reception data. a signal separation circuit; a plurality of pattern generation circuits that generate the same pattern as the unique pattern of each relay device; and a plurality of pattern generation circuits that generate a test signal separated from the received data using the output signal of the pattern generation circuit. It is characterized by comprising an inverse logic operation circuit that performs a logic operation opposite to that performed in .

〔実施例〕〔Example〕

次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の一実施例のブロック図である。FIG. 1 is a block diagram of one embodiment of the present invention.

送信側時分割多重装置1では、送信信号処理回路10は
送信データ100の信号処理を行い、テスト信号発生回
路12はテスト信号101を発生し、テスト信号多重化
回路11はテスト信号101を送信データの特定タイム
スロットに時分割多重化する。各中継装置2A、〜2N
では、データ多重化分離回路20は前段の時分割多重化
装置1又は前段の中継装置からの受信データ102、〜
105に対してデータの時分割多重化及び分離を行い、
固有パタン発生回路22a、〜22nはそれぞれ自中継
装W 2 A 、〜2Nに固有なパタン103a、〜1
03nを発生し、演算回路21はそれぞれパタン103
a、〜103nを用いて送信データに時分割多重化され
ているテスト信号に論理演算を行う。受信側時分割多重
化装置3では、受信信号処理装置30は前段の中継装置
2Nからの受信データ106の信号処理を行い、デス1
〜信号分離回路3]7は受信データ106に時分割多重
化されているテスト信号108を分離し、パタン発生回
路32a、〜32nはそれぞれ中継装置2A、〜2N内
の固有パタン発生回路22a、〜22nが発生するパタ
ン103a、〜103nと同一のパタンを発生し、逆論
理演算回路33a、〜33nはそれぞれこのパタン10
3a、〜103nを用いてテスト信号107に各中継装
置2A、〜2N内の演算口R21とは逆の論理演算を行
う。
In the transmission side time division multiplexer 1, a transmission signal processing circuit 10 performs signal processing on transmission data 100, a test signal generation circuit 12 generates a test signal 101, and a test signal multiplexing circuit 11 converts the test signal 101 into transmission data. time-division multiplexing into specific time slots. Each relay device 2A, ~2N
In this case, the data multiplexing/demultiplexing circuit 20 receives the received data 102, .
105, time-division multiplexing and demultiplexing of data;
The unique pattern generation circuits 22a and 22n generate patterns 103a and 103a, 103a and 103a, which are unique to their own repeaters W 2 A and 2N, respectively.
03n, and the arithmetic circuit 21 generates the pattern 103.
A, to 103n are used to perform a logical operation on the test signal time-division multiplexed with the transmission data. In the receiving side time division multiplexing device 3, the received signal processing device 30 performs signal processing on the received data 106 from the preceding relay device 2N, and
~Signal separation circuit 3]7 separates the test signal 108 time-division multiplexed from the received data 106, and pattern generation circuits 32a and ~32n correspond to the unique pattern generation circuits 22a and ~32n in the relay devices 2A and ~2N, respectively. 22n generates the same pattern as the patterns 103a and 103n, and the inverse logic operation circuits 33a and 33n each generate this pattern 103a and 103n.
3a and 103n are used to perform a logical operation on the test signal 107 that is opposite to that of the operation port R21 in each relay device 2A and 2N.

第2図は第1図の各部の信号の様子の一例を1″と゛0
″で表現した図で、特にテスト信号が時分割多重化され
ているタイムスロットの様子を示したものである。
Figure 2 shows an example of the state of the signals at each part in Figure 1.
This is a diagram expressed as ``, which particularly shows the state of time slots in which test signals are time-division multiplexed.

ここでは簡単のために中継装置は2A、〜2Dからの4
段であるとし、演算回路21として排他的論理和を用い
ているものとし、’ N ORM 」は正常状態を示し
、r A L M Jは中継装置2Aの機器障害の場合
であり、一般に機器障害の場合にはデータがオール゛O
′” (又はオール“1″)に固定される場合が多いた
め、送信データ104(第1図に図示)がオール“0″
に固定された場合を例示している。第2図において中継
装置2Aが機器障害でオール“0′°固定の場合には、
中継装置2Bのパタン103bとの演算結果がオールI
I OI+となる。従って、受信側時分割多重装置3で
は、逆論理演算回路(以下ALU)33a、〜33dの
いずれの結果がオール“0″又はオールII I 11
になるかによって、障害箇所を検出することができる。
Here, for simplicity, the relay devices are 4 from 2A to 2D.
It is assumed that the exclusive OR is used as the arithmetic circuit 21, 'N ORM' indicates a normal state, and r A L M J is a case of equipment failure in the relay device 2A, which is generally a case of equipment failure. In the case of , the data is all ゛O
’” (or all “1”), so the transmission data 104 (shown in Figure 1) is all “0”.
This example shows the case where the value is fixed to . In Fig. 2, if the relay device 2A is all fixed at 0'° due to equipment failure,
The calculation result with the pattern 103b of the relay device 2B is all I.
IOI+. Therefore, in the receiving side time division multiplexing device 3, the results of any of the inverse logic operation circuits (hereinafter referred to as ALU) 33a to 33d are all "0" or all II I 11
The location of the failure can be detected depending on whether the

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、時分割多重通信システム
の中継区間の障害の有無を検出するだけでなく、その障
害がどの箇所で発生したのかを検出することができる効
果がある。
As described above, the present invention is effective in not only detecting the presence or absence of a fault in a relay section of a time division multiplex communication system, but also being able to detect where the fault has occurred.

図は第1図の各部の信号の様子の一例を“°1″と“0
″で表現した図である。
The figure shows an example of the state of the signals at each part in Figure 1.
This is a diagram expressed in ``.

1・・・送信側時分割多重装置、2A、〜2N・・・中
継装置、3・・・受信側時分割多重装置、10・・・送
信信号処理回路、11・・・テスト信号多重化回路、1
2・・・テスト信号発生回路、20・・・データ多重化
分離回路、21・・・演算回路、22a、〜22n・・
・固有パタン発生回路、30・・・受信信号処理回路、
31・・・テスト信号分離回路、32a、〜32n・・
・パタン発生回路、33a、〜33n・・・逆論理演算
回路。
DESCRIPTION OF SYMBOLS 1... Transmission side time division multiplexer, 2A, ~2N... Relay device, 3... Receiving side time division multiplexer, 10... Transmission signal processing circuit, 11... Test signal multiplexing circuit ,1
2... Test signal generation circuit, 20... Data multiplexing/demultiplexing circuit, 21... Arithmetic circuit, 22a, ~22n...
- Unique pattern generation circuit, 30...received signal processing circuit,
31...Test signal separation circuit, 32a, ~32n...
- Pattern generation circuit, 33a, to 33n... Inverse logic operation circuit.

【図面の簡単な説明】[Brief explanation of the drawing]

Claims (1)

【特許請求の範囲】[Claims] 2つの時分割多重装置間の信号を多段中継する複数の中
継装置から構成される時分割多重通信システムにおいて
、送信側の前記時分割多重装置は送信データの信号処理
を行う送信信号処理回路と、テスト信号を発生するテス
ト信号発生回路と、このテスト信号発生回路の出力信号
を送信データの特定のタイムスロットに時分割多重化す
るテスト信号多重化回路とを備え、前記各中継装置は前
段の前記時分割多重化装置又は前段の前記中継装置から
の受信データに対してデータの時分割多重化及び分離を
行うデータ多重化分離回路と、それぞれ自中継装置に固
有なパタンを発生する固有パタン発生回路と、この固有
パタン発生回路の出力信号を用いて送信データに時分割
多重化されているテスト信号に論理演算を行う演算回路
とを備え、受信側の前記時分割多重装置は前段の前記中
継装置からの受信データの信号処理を行う受信信号処理
回路と、前記受信データに時分割多重化されている前記
テスト信号を分離するテスト信号分離回路と、前記各中
継装置の前記固有パタンと同一のパタンを発生する複数
のパタン発生回路と、このパタン発生回路の出力信号を
用いて前記受信データから分離したテスト信号に前記各
中継装置で行ったのとは逆の論理演算を行う逆論理演算
回路とを備えることを特徴とする時分割多重通信システ
ムの障害箇所検出方式。
In a time division multiplex communication system comprising a plurality of relay devices that relay signals between two time division multiplex devices in multiple stages, the time division multiplex device on the transmitting side includes a transmission signal processing circuit that performs signal processing of transmission data; Each relay device includes a test signal generation circuit that generates a test signal, and a test signal multiplexing circuit that time-division multiplexes the output signal of the test signal generation circuit into a specific time slot of transmission data, A data multiplexing and demultiplexing circuit that performs time division multiplexing and demultiplexing of data received from the time division multiplexing device or the relay device in the previous stage, and a unique pattern generation circuit that generates a pattern unique to each relay device. and an arithmetic circuit that performs a logical operation on a test signal that is time-division multiplexed with transmission data using the output signal of the unique pattern generation circuit, and the time-division multiplexer on the receiving side is connected to the relay device on the previous stage. a received signal processing circuit that performs signal processing of received data from the received data, a test signal separation circuit that separates the test signal time-division multiplexed from the received data, and a pattern that is the same as the unique pattern of each of the relay devices. a plurality of pattern generation circuits that generate a plurality of pattern generation circuits; and an inverse logic operation circuit that uses the output signals of the pattern generation circuits to perform a logical operation opposite to that performed on the test signal separated from the received data. A failure location detection method for a time division multiplex communication system, characterized by comprising:
JP24604188A 1988-09-29 1988-09-29 Faulty point detection system for time division multiplex communication system Pending JPH0294719A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24604188A JPH0294719A (en) 1988-09-29 1988-09-29 Faulty point detection system for time division multiplex communication system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24604188A JPH0294719A (en) 1988-09-29 1988-09-29 Faulty point detection system for time division multiplex communication system

Publications (1)

Publication Number Publication Date
JPH0294719A true JPH0294719A (en) 1990-04-05

Family

ID=17142579

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24604188A Pending JPH0294719A (en) 1988-09-29 1988-09-29 Faulty point detection system for time division multiplex communication system

Country Status (1)

Country Link
JP (1) JPH0294719A (en)

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