JPH0284256U - - Google Patents
Info
- Publication number
- JPH0284256U JPH0284256U JP16334488U JP16334488U JPH0284256U JP H0284256 U JPH0284256 U JP H0284256U JP 16334488 U JP16334488 U JP 16334488U JP 16334488 U JP16334488 U JP 16334488U JP H0284256 U JPH0284256 U JP H0284256U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- semiconductor detector
- protective tube
- ray
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 5
- 238000001816 cooling Methods 0.000 claims description 4
- 230000001681 protective effect Effects 0.000 claims description 4
- 238000002441 X-ray diffraction Methods 0.000 claims 1
- 238000001514 detection method Methods 0.000 claims 1
- 238000010894 electron beam technology Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 4
- 229910052790 beryllium Inorganic materials 0.000 description 1
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 1
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16334488U JPH0284256U (enrdf_load_stackoverflow) | 1988-12-16 | 1988-12-16 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16334488U JPH0284256U (enrdf_load_stackoverflow) | 1988-12-16 | 1988-12-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0284256U true JPH0284256U (enrdf_load_stackoverflow) | 1990-06-29 |
Family
ID=31447987
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16334488U Pending JPH0284256U (enrdf_load_stackoverflow) | 1988-12-16 | 1988-12-16 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0284256U (enrdf_load_stackoverflow) |
-
1988
- 1988-12-16 JP JP16334488U patent/JPH0284256U/ja active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2020199689A1 (zh) | 一种毛细管聚焦的微束x射线衍射仪 | |
JP2004239802A (ja) | X線分析装置及びx線分析方法 | |
Thulke et al. | Versatile curved crystal spectrometer for laboratory extended x‐ray absorption fine structure measurements | |
JP2582114B2 (ja) | 電子顕微鏡におけるx線分析装置 | |
JPH0284256U (enrdf_load_stackoverflow) | ||
US10217597B2 (en) | X-ray generator and X-ray analyzer | |
JPH06338281A (ja) | 走査電子顕微鏡 | |
US5115460A (en) | X-ray analysis apparatus comprising an adjustable slit diaphragm | |
JPH07253472A (ja) | 放射線検出器用ヘリウム3クライオスタットおよび分析装置 | |
EP0120535B1 (en) | Beam exposure apparatus comprising a diaphragm drive for an object carrier | |
US4506375A (en) | X-Ray calibration system | |
Buerger | The Design of X‐Ray Powder Cameras | |
JP2001083105A (ja) | X線回折装置および回折x線の測定方法 | |
Sakurai | High‐intensity x‐ray line focal spot for laboratory extended x‐ray absorption fine‐structure experiments | |
JPS63281341A (ja) | エネルギ−分散型x線分光器を備えたx線分析装置 | |
JPH0295150U (enrdf_load_stackoverflow) | ||
JPH0120680Y2 (enrdf_load_stackoverflow) | ||
Bertin | A comparison of four slit apertures for selected-area analysis with the X-ray secondary-emission spectrometer | |
Krieger et al. | Data collection in protein crystallography: experimental methods for reducing background radiation | |
JPH0425804Y2 (enrdf_load_stackoverflow) | ||
JPS5812123Y2 (ja) | 電子顕微鏡等におけるx線分析装置 | |
JPS6139351A (ja) | X線発生装置 | |
JP2792173B2 (ja) | 表面分析用試料冷却ホルダー | |
JPH0616404B2 (ja) | 加速器結合透過型電子顕微鏡 | |
JPH08138613A (ja) | X線マイクロアナライザ |