JPH0281028A - Liquid crystal display device - Google Patents

Liquid crystal display device

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Publication number
JPH0281028A
JPH0281028A JP63234105A JP23410588A JPH0281028A JP H0281028 A JPH0281028 A JP H0281028A JP 63234105 A JP63234105 A JP 63234105A JP 23410588 A JP23410588 A JP 23410588A JP H0281028 A JPH0281028 A JP H0281028A
Authority
JP
Japan
Prior art keywords
film
electrodes
gate
transparent conductive
liquid crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63234105A
Other languages
Japanese (ja)
Other versions
JP2639980B2 (en
Inventor
Shoichiro Nakayama
中山 正一郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP23410588A priority Critical patent/JP2639980B2/en
Publication of JPH0281028A publication Critical patent/JPH0281028A/en
Application granted granted Critical
Publication of JP2639980B2 publication Critical patent/JP2639980B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To provide the liquid crystal display device which obviates the decrease in the opening ratios of respective picture elements by providing electrodes for auxiliary capacities consisting of transparent conductive films electrically connected to gate metallic films of thin-film transistors (TFTR) to prevent the deterioration of display. CONSTITUTION:The electrodes 2 for auxiliary capacities consisting of the transparent conductive films electrically connected to the gate metallic films 3 are provided on the insulating substrate of the constitution disposed in matrix shape with the TFTRs each consisting of the gate metallic film, insulating film for gate, amorphous semiconductor, and metallic films for drain nd source on the insulating substrate. Since the transparent conductive films 2 are used as the electrodes for auxiliary capacities, the opening rate of the respective picture elements is entirely prevented from lowering even if the electrodes for auxiliary capacities are lowering even if the electrodes for auxiliary capacities are so patterned as to overlap on the transparent electrodes 7 for display which are counter electrodes. The degradation of the display lightness is thus prevented.

Description

【発明の詳細な説明】 (イ)産業上の利用分野 本発明は、アクチブマトリクス型の液晶表示装置に関す
る。
DETAILED DESCRIPTION OF THE INVENTION (a) Industrial Application Field The present invention relates to an active matrix type liquid crystal display device.

(ロ)従来の技術 近年非晶質半導体材料、特にアモルファス・ジノコン(
以下a−5iと略記する)膜等の非晶質材料は、その物
性上の特徴及びプラズマCVD法という形成法の利点を
いかしてこれまでの単結晶シリコン(c−5i)では実
現不可能であった分野への応用を開拓している。特にa
−5i膜はプラズマ反応という形成法で成膜できるため
、太陽電2池や大面積液晶TV用のスイッチング素子な
どに応用されている。
(b) Conventional technology In recent years, amorphous semiconductor materials, especially amorphous dinocon (
Amorphous materials such as a-5i (hereinafter abbreviated as a-5i) films, which are impossible to achieve with conventional single-crystal silicon (c-5i), take advantage of their physical properties and the advantages of the plasma CVD method. We are developing applications for existing fields. Especially a
Since the -5i film can be formed by a formation method called plasma reaction, it is applied to switching elements for solar cells and large-area liquid crystal TVs.

アクティブマトリックス型の)α品テレビへのa−5i
薄膜トランジスタ(以下TPTとする)スイッチング素
子の応用は、プラズマ反応の大面積化の容易さといった
メリットをいかしたものであるが、同時に同反応法によ
ってTPTを構成するゲート絶縁膜やパッシベーション
膜となる窒化ジノコン(以下5INx)膜や酸化シリコ
ン(以下Sin、)膜を反応ガスを変えるだけで形成で
きるという長所も利用している。
A-5i to active matrix type) alpha product TV
The application of thin film transistor (hereinafter referred to as TPT) switching elements takes advantage of the ease of large-area plasma reaction, but at the same time, the same reaction method also produces nitride that becomes the gate insulating film and passivation film that make up the TPT. It also takes advantage of the fact that a Zinocon (hereinafter referred to as 5INx) film and a silicon oxide (hereinafter referred to as "Sin") film can be formed simply by changing the reaction gas.

しかしながら、TPTを用いた液晶TVでは、液晶をコ
ンデンサと見做した電荷蓄積作用を利用して、映像を表
示している。そのため、映像信号の1フレーム毎に更新
される液晶の充電電荷は、そのフレームの間保持されな
ければならないが、らし、この期間、リークにより液晶
の保持電圧が低下したならば、表示品質の劣化を招く。
However, in a liquid crystal TV using TPT, images are displayed using the charge accumulation effect of the liquid crystal, which is regarded as a capacitor. Therefore, the charged charge of the liquid crystal, which is updated every frame of the video signal, must be maintained during that frame, but if the holding voltage of the liquid crystal decreases due to leakage during this period, the display quality will deteriorate. invite.

このため、従来から液晶による容量と並列に補助容量を
設け、表示劣化を防止する構造が提案されているし特開
昭57−3088号]。
For this reason, a structure has heretofore been proposed in which an auxiliary capacitor is provided in parallel with the liquid crystal capacitor to prevent display deterioration (Japanese Patent Laid-Open No. 57-3088).

このような補助容量の付設構造としては、一般に次の二
種類ある。一つは、第5図に示すようにTPT(0)に
結合した表示用透明’it極(7)と絶縁性基板との間
に補助容量用透明電極(2)を設けて絶縁膜を介して表
示用透明電極(7)と補助容量用透明を極(2)を対向
させたものである。この場合の補助容量用透明電極(2
)は例えばアースされるのが一般的であった。らう一つ
の構造は、第6図に示すように表示用透明電極(7)と
ガラス基板との間に隣接ゲート金属膜(3)を延在させ
て、これを補助容量@極となし、この延在したゲート金
属膜(3)と表示用透明を極(7)とを絶縁膜を介して
対向させたものである。
There are generally two types of structures for attaching such auxiliary capacity: One is to provide a transparent electrode for auxiliary capacitance (2) between an insulating substrate and a transparent 'it electrode for display (7) coupled to TPT (0), as shown in Fig. 5, through an insulating film. The transparent electrode for display (7) and the transparent electrode for auxiliary capacitance (2) are made to face each other. In this case, the transparent electrode for auxiliary capacitance (2
) was generally grounded. Another structure, as shown in FIG. 6, extends an adjacent gate metal film (3) between the display transparent electrode (7) and the glass substrate, and uses this as an auxiliary capacitor@pole. This extended gate metal film (3) and a display transparent electrode (7) are opposed to each other with an insulating film interposed therebetween.

(ハ)発明が解決しようとする課題 上述の第6図の如くゲート金属膜(3)を補助容量用電
極として用いる液晶表示装置は、第5図の如く別体の補
助容儀用透明tt極(2)をもうけたものより、装置構
造が簡単て゛あるので、特に大面積の表示パネルの製造
には有効である。しかしながら、第6図の装置の場合、
ゲート金属膜(3)で各機成分を構成するため、補助容
量の容量値が大きくなるにつれて、不透明なゲート金属
膜(3)の面積を拡大することが必要となり、一般の液
晶TVのように、透光性液晶表示装置では、各画素の開
口率の低下を引き起こし表示明度の低下を引き起こす欠
点があった。
(c) Problems to be Solved by the Invention The liquid crystal display device using the gate metal film (3) as the auxiliary capacitance electrode as shown in FIG. Since the device structure is simpler than the one with 2), it is particularly effective for manufacturing large-area display panels. However, in the case of the device shown in FIG.
Since each device component is composed of a gate metal film (3), as the capacitance value of the auxiliary capacitance increases, it becomes necessary to increase the area of the opaque gate metal film (3), which makes it difficult to use the opaque gate metal film (3) like a general LCD TV. However, the translucent liquid crystal display device has a disadvantage in that the aperture ratio of each pixel decreases, resulting in a decrease in display brightness.

本発明はこのような欠点を解消するためになされたもの
である。
The present invention has been made to eliminate these drawbacks.

(ニ)課題を解決するための手段 本発明の液晶表示装置は、絶縁性基板上にゲート金属膜
、ゲート用絶縁膜、非結晶半導体、ドレイン並びにソー
ス用金属膜からなる薄膜トランジスタをマトリクス状に
配置し、各トランジスタに表示電極を結合したものであ
って、前記ゲート金属膜に電気的に接続された透明導電
膜からなる補助容量用電極を設けたらのである。
(d) Means for Solving the Problems In the liquid crystal display device of the present invention, thin film transistors each consisting of a gate metal film, a gate insulating film, an amorphous semiconductor, and a drain and source metal film are arranged in a matrix on an insulating substrate. However, a display electrode is coupled to each transistor, and an auxiliary capacitance electrode made of a transparent conductive film is electrically connected to the gate metal film.

(ホ)作用 本発明によれば、ゲート金属膜とTf、気的に接続した
透明導電膜を補助容量用を極として用いることにより、
対電極となる表示用透明電極と重なるように補助容量用
電極のパターン化を行っても、開口率を全、く低下させ
ることなく有効な補助容量を設置することが可能となる
(E) Function According to the present invention, by using the transparent conductive film which is electrically connected to the gate metal film and Tf as the pole for the auxiliary capacitance,
Even if the auxiliary capacitor electrode is patterned so as to overlap the display transparent electrode serving as the counter electrode, it is possible to provide an effective auxiliary capacitor without reducing the aperture ratio at all.

(へ)実施例 第1図に本発明の液晶表示装置の一実施例の部分平面図
を示し、同図のA−A’線断面、並びにB−B’線断面
に於る製造工程を第2図に示す。
(F) Embodiment FIG. 1 shows a partial plan view of an embodiment of the liquid crystal display device of the present invention, and the manufacturing process in the AA' line cross section and the BB' line cross section of the same figure is shown in FIG. Shown in Figure 2.

第2図(a)〜(g)の製造工程に基すいて、第1図の
本発明の液晶表示装置の構成を以下に詳述する。
The structure of the liquid crystal display device of the present invention shown in FIG. 1 will be described in detail below based on the manufacturing steps shown in FIGS. 2(a) to 2(g).

ガラス板からなる絶縁縁基板(1)上に、ITOの補助
容量用透明導電膜(2)を形成しパターン化する[第2
図(a)]。
On an insulating edge substrate (1) made of a glass plate, a transparent conductive film (2) of ITO for auxiliary capacitance is formed and patterned [Second
Figure (a)].

次に前記透明導電膜(2)に電気的にコンタクトするよ
うにAu/Crの2層膜でゲート用金属膜(3)形成し
、透明導電膜(2)に一部重量した形状にパターン化す
る[第2図(b)]。
Next, a gate metal film (3) is formed using a two-layer film of Au/Cr so as to be in electrical contact with the transparent conductive film (2), and patterned into a shape that partially overlaps the transparent conductive film (2). [Figure 2(b)].

そして、プラズマ反応法などの採用により、例えばSi
Nxでゲート用絶縁膜(4)、例えばa−5で半導体薄
膜(5)、不純物をドープした例えばn″a−5iで不
純物半導体膜(6)を順次形成する[第2図(C)]。
By adopting a plasma reaction method, for example, Si
A gate insulating film (4) is formed using Nx, a semiconductor thin film (5) is formed using, for example, a-5, and an impurity semiconductor film (6) is formed using, for example, n''a-5i doped with impurities [Figure 2 (C)]. .

次に、前記半導体薄膜(5)及びゲート用絶縁膜(4)
をゲート用金属膜(3)上に位置するように所望のパタ
ーンに二7チングする[第2図(d)〕。
Next, the semiconductor thin film (5) and the gate insulating film (4)
27 in a desired pattern so as to be located on the gate metal film (3) [FIG. 2(d)].

その後、ITOで表示用透明導電膜(7)を形成しパタ
ーン化する[第2図(e)コ。
Thereafter, a transparent conductive film (7) for display is formed using ITO and patterned [see FIG. 2(e)].

さらに、不純物半導体膜(6)上にドレイン、ソース用
金属膜(8)を形成してパターン化した[第2図(f)
]後、ドレイン、ソース用金属膜(8)間のチャンネル
位置の不純物半導体膜(6)をエツチング除去し完成と
なる[第2図(g)]。
Furthermore, a drain and source metal film (8) was formed on the impurity semiconductor film (6) and patterned [Fig. 2(f)]
] After that, the impurity semiconductor film (6) at the channel position between the drain and source metal films (8) is removed by etching to complete the process [FIG. 2(g)].

上述の実施例では、補助容量用透明導電膜(2)をゲー
ト金属膜(3)より先に形成したが、これらの成膜順序
は逆であっても全く問題はない。
In the above embodiment, the transparent conductive film for auxiliary capacitance (2) was formed before the gate metal film (3), but there is no problem even if the order of forming these films is reversed.

第3図に本発明の他の実施例を示し、その製造工程をc
−c’線に沿って4図の(a) −(f)に示す。
FIG. 3 shows another embodiment of the present invention, and its manufacturing process is shown in c.
It is shown in (a) to (f) of Figure 4 along the line -c'.

同図の液晶表示装置は、まず絶縁性基板(1)上に補助
容量用透明導電膜(2)、ゲート用金属膜(3)を続け
て形成した後、ゲート用金属膜(3)をゲートのパター
ンと、補助容量用透明導電膜(2)のパターンを重ねた
パターンで第ルジスト(9)をパターニングし、ゲート
用金属膜(3)および補助容量用透明導電膜(2)のそ
れぞれのエッチャントでエツチングする[第4図(a)
]。
In the liquid crystal display device shown in the figure, first, a transparent conductive film for auxiliary capacitance (2) and a metal film for gate (3) are successively formed on an insulating substrate (1), and then a metal film for gate (3) is applied to the gate. The lugist (9) is patterned using a pattern in which the pattern of the transparent conductive film for auxiliary capacitance (2) is overlapped with the pattern of [Figure 4 (a)]
].

次に、補助容量用透明導電膜(2)として、透明性を必
要とする部分が開口するように第2レジスト(10)を
パターニングするし第4図(b)]。
Next, the second resist (10) is patterned to form an auxiliary capacitance transparent conductive film (2) so that the portion requiring transparency is opened (FIG. 4(b)).

続いて、ゲート用金属膜(3)のエッチャントで、透明
導電膜(2)上の不要な金属膜(3)を除去した後、第
2図の場合と同様に、ゲート用絶縁膜(4)、半導体薄
膜(5)、不純物半導体膜(6)を順次形成する[第4
図(C)]。
Next, after removing the unnecessary metal film (3) on the transparent conductive film (2) using an etchant for the gate metal film (3), the gate insulating film (4) is removed as in the case of FIG. , a semiconductor thin film (5), and an impurity semiconductor film (6) are sequentially formed [Fourth
Figure (C)].

以下の工程も第2図の場合と同じで良く、第4図(d)
は半導体薄膜(5)と不純物半導体膜(6)の、パター
ニングを示し、第4図(e)はレジスト(11)による
表示用透明導電膜(7)のパターニングを示し、更に第
4図([)はレジスl−(11)の除去及びチャンネル
Lの不純物半導体膜(6)の除去を完了した状態を示し
ている。
The following steps may be the same as those in Figure 2, and Figure 4(d)
4(e) shows the patterning of the transparent conductive film for display (7) using the resist (11), and FIG. ) shows a state in which the removal of the resist l-(11) and the impurity semiconductor film (6) of the channel L have been completed.

斯様な製造方法に於ては、第2図の場合と異な)、ゲー
ト用金属膜(3)下の全てに補助容量用透明導電膜(2
)として用いる透明導電膜を有しているため、両者のコ
ンタクト不良の発生が少なくなり、歩どまりの向上が図
れる。
In such a manufacturing method, a transparent conductive film (2) for auxiliary capacitance is formed entirely under the metal film (3) for gate (different from the case shown in Fig. 2).
), the occurrence of poor contact between the two is reduced, and the yield can be improved.

また、補助容量用透明導電膜(2)のゲート用金属膜(
3)からの開口部、即ち透光性を有した補助容量として
の面積は、第1のレジスト・パターン(9)と第2のレ
ジスト・パターン(11)により決定される事、補助容
量は使用する絶縁膜の材料とその膜厚で決定される事、
さらに補助容量用透明導電膜(2)と後工程の表示用透
明導電膜(7)の重なり面積で決まってしまうことから
、第2のレジスト・パターン(10)を表示用透明導電
膜(7)のパタニングに於けるリフト・オフ用レジスト
とじて利用することが可能である。この場合のリフト・
オフ処理前の過程を同図(g)に示している。
In addition, the metal film for gate of the transparent conductive film for auxiliary capacitance (2) (
3) The opening from 3), that is, the area of the auxiliary capacitor with light-transmitting properties, is determined by the first resist pattern (9) and the second resist pattern (11), and the auxiliary capacitor is not used. Determined by the material of the insulating film and its thickness,
Furthermore, since it is determined by the overlapping area of the transparent conductive film for auxiliary capacitance (2) and the transparent conductive film for display (7) in the subsequent process, the second resist pattern (10) is applied to the transparent conductive film for display (7). It can be used as a lift-off resist in patterning. Lift in this case
The process before the off-processing is shown in FIG. 4(g).

(ト)発明の効果 本発明は表示用透明電極に対して隣接ゲートを補助容量
とするとき、表示用透明を極と重なる部分の補助容量用
電極を透明な材料とすることによって、開口率の低下の
無い液晶表示装置を実現することが可能となる。
(g) Effects of the Invention The present invention improves the aperture ratio by using a transparent material for the auxiliary capacitance electrode in the portion that overlaps the display transparent electrode when the gate adjacent to the display transparent electrode is used as an auxiliary capacitor. It becomes possible to realize a liquid crystal display device without degradation.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の液晶表示装置の一実施例の平面図、第
2図(a)〜(g)は第1図の本発明装置の製造工程図
、第3図は本発明装置の他の実施例の平面図、第4図は
第3図の本発明装置の製造工程図、第5図及び第6図は
夫々従来装置の平面図である。 (0)・・薄膜トランジスタ、(1)・・・絶縁基板、
(2)・・・補助容量用透明導電膜、(3)・・・ゲー
ト用金属膜、(4)・・・ゲート用絶縁膜、(5)・・
・半導体薄膜、(6)・・・不純物半導体膜、(7)・
・・表示用透明導電膜、(8)・・・金属膜、(9)・
・・第ルジスト、(10)・・第2のレジスト、(11
)・・・レジスト。
FIG. 1 is a plan view of an embodiment of the liquid crystal display device of the present invention, FIGS. 2(a) to (g) are manufacturing process diagrams of the device of the present invention shown in FIG. 1, and FIG. FIG. 4 is a plan view of the embodiment of FIG. 3, FIG. 4 is a manufacturing process diagram of the device of the present invention shown in FIG. 3, and FIGS. 5 and 6 are plan views of the conventional device, respectively. (0)...Thin film transistor, (1)...Insulating substrate,
(2)...Transparent conductive film for auxiliary capacitance, (3)...Metal film for gate, (4)...Insulating film for gate, (5)...
・Semiconductor thin film, (6)... Impurity semiconductor film, (7)・
・・Transparent conductive film for display, (8) ・・Metal film, (9)・
...First resist, (10)...Second resist, (11
)...Resist.

Claims (1)

【特許請求の範囲】[Claims] (1)絶縁性基板上にゲート金属膜、ゲート用絶縁膜、
非結晶半導体、ドレイン並びにソース用金属膜からなる
薄膜トランジスタをマトリクス状に配置し、各トランジ
スタに表示電極を結合してなる液晶表示装置に於て、 前記ゲート金属膜に電気的に接続された透明導電膜から
なる補助容量用透明電極を備えたことを特徴とした液晶
表示装置。
(1) Gate metal film, gate insulating film on an insulating substrate,
In a liquid crystal display device in which thin film transistors each consisting of an amorphous semiconductor and a metal film for drain and source are arranged in a matrix and a display electrode is connected to each transistor, a transparent conductor electrically connected to the gate metal film is used. A liquid crystal display device characterized by being equipped with a transparent electrode for auxiliary capacitance made of a film.
JP23410588A 1988-09-19 1988-09-19 Liquid crystal display Expired - Lifetime JP2639980B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23410588A JP2639980B2 (en) 1988-09-19 1988-09-19 Liquid crystal display

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23410588A JP2639980B2 (en) 1988-09-19 1988-09-19 Liquid crystal display

Publications (2)

Publication Number Publication Date
JPH0281028A true JPH0281028A (en) 1990-03-22
JP2639980B2 JP2639980B2 (en) 1997-08-13

Family

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Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2639980B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02250038A (en) * 1989-03-23 1990-10-05 Seiko Instr Inc Thin film transistor array
JPH06308533A (en) * 1993-04-22 1994-11-04 Nec Corp Liquid crystal display device
JPH06332007A (en) * 1993-05-25 1994-12-02 Nec Corp Liquid crystal display device
US8045072B2 (en) 2004-05-27 2011-10-25 Lg Display Co., Ltd. Liquid crystal display device
KR101116826B1 (en) * 2011-08-17 2012-02-29 엘지디스플레이 주식회사 Thin Film Transistor Substrate for Display Device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0258029A (en) * 1988-08-24 1990-02-27 Hitachi Ltd Liquid crystal display device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0258029A (en) * 1988-08-24 1990-02-27 Hitachi Ltd Liquid crystal display device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02250038A (en) * 1989-03-23 1990-10-05 Seiko Instr Inc Thin film transistor array
JPH06308533A (en) * 1993-04-22 1994-11-04 Nec Corp Liquid crystal display device
JPH06332007A (en) * 1993-05-25 1994-12-02 Nec Corp Liquid crystal display device
US8045072B2 (en) 2004-05-27 2011-10-25 Lg Display Co., Ltd. Liquid crystal display device
KR101116826B1 (en) * 2011-08-17 2012-02-29 엘지디스플레이 주식회사 Thin Film Transistor Substrate for Display Device

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JP2639980B2 (en) 1997-08-13

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