JPH0277842U - - Google Patents
Info
- Publication number
- JPH0277842U JPH0277842U JP15734088U JP15734088U JPH0277842U JP H0277842 U JPH0277842 U JP H0277842U JP 15734088 U JP15734088 U JP 15734088U JP 15734088 U JP15734088 U JP 15734088U JP H0277842 U JPH0277842 U JP H0277842U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- chamber
- scanning electron
- electron microscope
- processing chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001816 cooling Methods 0.000 claims description 6
- 239000003507 refrigerant Substances 0.000 claims description 2
- 239000000523 sample Substances 0.000 claims 7
- 239000012520 frozen sample Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Landscapes
- Electron Sources, Ion Sources (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15734088U JPH0277842U (enExample) | 1988-12-02 | 1988-12-02 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15734088U JPH0277842U (enExample) | 1988-12-02 | 1988-12-02 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0277842U true JPH0277842U (enExample) | 1990-06-14 |
Family
ID=31436693
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15734088U Pending JPH0277842U (enExample) | 1988-12-02 | 1988-12-02 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0277842U (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017522607A (ja) * | 2014-07-29 | 2017-08-10 | ライカ ミクロジュステーメ ゲーエムベーハー | クライオ顕微鏡法用の試料ステージを備えた光学顕微鏡 |
-
1988
- 1988-12-02 JP JP15734088U patent/JPH0277842U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017522607A (ja) * | 2014-07-29 | 2017-08-10 | ライカ ミクロジュステーメ ゲーエムベーハー | クライオ顕微鏡法用の試料ステージを備えた光学顕微鏡 |
| US10901196B2 (en) | 2014-07-29 | 2021-01-26 | Leica Mikrosysteme Gmbh | Light microscope having a sample stage for cryomicroscopy |
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