JPH027506B2 - - Google Patents
Info
- Publication number
- JPH027506B2 JPH027506B2 JP59007016A JP701684A JPH027506B2 JP H027506 B2 JPH027506 B2 JP H027506B2 JP 59007016 A JP59007016 A JP 59007016A JP 701684 A JP701684 A JP 701684A JP H027506 B2 JPH027506 B2 JP H027506B2
- Authority
- JP
- Japan
- Prior art keywords
- scanning
- electron beam
- objective lens
- coil
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000010894 electron beam technology Methods 0.000 claims description 44
- 230000003287 optical effect Effects 0.000 claims description 18
- 230000001360 synchronised effect Effects 0.000 claims description 5
- 230000004075 alteration Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 230000005284 excitation Effects 0.000 description 2
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 2
- 238000000386 microscopy Methods 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Sources, Ion Sources (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59007016A JPS60151946A (ja) | 1984-01-20 | 1984-01-20 | 走査型電子線装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59007016A JPS60151946A (ja) | 1984-01-20 | 1984-01-20 | 走査型電子線装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60151946A JPS60151946A (ja) | 1985-08-10 |
JPH027506B2 true JPH027506B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1990-02-19 |
Family
ID=11654239
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59007016A Granted JPS60151946A (ja) | 1984-01-20 | 1984-01-20 | 走査型電子線装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60151946A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2647949B2 (ja) * | 1989-02-17 | 1997-08-27 | 日本電子株式会社 | 走査型電子顕微鏡のアライメント装置 |
JPH11250850A (ja) | 1998-03-02 | 1999-09-17 | Hitachi Ltd | 走査電子顕微鏡及び顕微方法並びに対話型入力装置 |
-
1984
- 1984-01-20 JP JP59007016A patent/JPS60151946A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS60151946A (ja) | 1985-08-10 |