JPH0271276U - - Google Patents
Info
- Publication number
- JPH0271276U JPH0271276U JP15147388U JP15147388U JPH0271276U JP H0271276 U JPH0271276 U JP H0271276U JP 15147388 U JP15147388 U JP 15147388U JP 15147388 U JP15147388 U JP 15147388U JP H0271276 U JPH0271276 U JP H0271276U
- Authority
- JP
- Japan
- Prior art keywords
- fixed
- package
- fixed electrode
- input
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 5
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Relating To Insulation (AREA)
Description
第１図ａ，ｂ，ｃは本考案の一実施例に係る静
電耐圧試験装置の構造図、第２図は従来の静電耐
圧試験装置の構造図、第３図ａ，ｂ，ｃは従来の
静電耐圧試験装置による動作の説明図、第４図ａ
，ｂは第１図ａ，ｂ，ｃの静電耐圧試験装置によ
る動作の説明図である。
４０……測定ヘツド、４１……固定電極、４１
ａ……電極部、４２……可動電極板、４２ａ，４
５ａ……ばね、４４……固定抵抗体、４５……可
動抵抗体、４５ｂ……調整ねじ、５０……半導体
装置、５１……パツケージ、５２……半導体素子
、５３……入出力端子、６０……位置決め手段。
Figures 1a, b, and c are structural diagrams of an electrostatic withstand voltage tester according to an embodiment of the present invention, Figure 2 is a structural diagram of a conventional electrostatic withstand voltage tester, and Figures 3a, b, and c are structural diagrams of a conventional electrostatic withstand voltage tester. Explanatory diagram of the operation of a conventional electrostatic withstand voltage tester, Figure 4a
, b are explanatory diagrams of operations performed by the electrostatic withstand voltage testing apparatus shown in FIGS. 1a, b, and c. 40...Measuring head, 41...Fixed electrode, 41
a... Electrode part, 42... Movable electrode plate, 42a, 4
5a... Spring, 44... Fixed resistor, 45... Movable resistor, 45b... Adjusting screw, 50... Semiconductor device, 51... Package, 52... Semiconductor element, 53... Input/output terminal, 60 ...Positioning means.
Claims (1)
ケージ内に半導体素子が内蔵された半導体装置に
対して、前記パツケージ及び入出力端子に所定の
直流電圧を印加するための測定ヘツドを備えた静
電耐圧試験装置において、 前記測定ヘツドは、 直流電圧印加用の電極部を有する固定電極と、 前記固定電極上にばね力で上下動自在に取付け
られ、前記パツケージの上面と接触するための可
動電極板と、 前記固定電極の側面に固定され前記入出力端子
と接触するための固定抵抗体と、 前記固定抵抗体と対向して前記固定電極の側面
に、ばね力と調整ねじで可動自在に取付けられ、
前記入出力端子と接触した状態で前記固定抵抗体
と共働して前記パツケージ側面を挟持するための
可動抵抗体とで構成されると共に、 前記パツケージを前記固定電極側の所定位置に
押圧する位置決め手段を設けたことを特徴とする
静電耐圧試験装置。[Claims for Utility Model Registration] For a semiconductor device in which a semiconductor element is built in a package with a plurality of input/output terminals protruding from the side surface, a predetermined DC voltage is applied to the package and the input/output terminals. In the electrostatic withstand voltage testing apparatus, the measurement head includes: a fixed electrode having an electrode section for applying a DC voltage; and a fixed electrode mounted on the fixed electrode so as to be movable up and down by a spring force, and a movable electrode plate for contacting the upper surface; a fixed resistor fixed to the side surface of the fixed electrode for contacting the input/output terminal; and a spring mounted on the side surface of the fixed electrode opposite to the fixed resistor. Mounted movably with force and adjustment screws,
a movable resistor that cooperates with the fixed resistor to clamp the side surface of the package while in contact with the input/output terminal, and a positioning member that presses the package to a predetermined position on the fixed electrode side. An electrostatic withstand voltage testing device characterized by being provided with means.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15147388U JPH0271276U (en) | 1988-11-21 | 1988-11-21 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15147388U JPH0271276U (en) | 1988-11-21 | 1988-11-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0271276U true JPH0271276U (en) | 1990-05-30 |
Family
ID=31425550
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15147388U Pending JPH0271276U (en) | 1988-11-21 | 1988-11-21 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0271276U (en) |
-
1988
- 1988-11-21 JP JP15147388U patent/JPH0271276U/ja active Pending
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