JPH0269609A - Method for inspecting taped parts - Google Patents

Method for inspecting taped parts

Info

Publication number
JPH0269609A
JPH0269609A JP22155388A JP22155388A JPH0269609A JP H0269609 A JPH0269609 A JP H0269609A JP 22155388 A JP22155388 A JP 22155388A JP 22155388 A JP22155388 A JP 22155388A JP H0269609 A JPH0269609 A JP H0269609A
Authority
JP
Japan
Prior art keywords
inspection
parts
light
image
tape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22155388A
Other languages
Japanese (ja)
Other versions
JPH0731053B2 (en
Inventor
Tomio Ogiso
小木曽 富夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CKD Corp
Original Assignee
CKD Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CKD Corp filed Critical CKD Corp
Priority to JP22155388A priority Critical patent/JPH0731053B2/en
Publication of JPH0269609A publication Critical patent/JPH0269609A/en
Publication of JPH0731053B2 publication Critical patent/JPH0731053B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To perform a stable inspection on taped parts by irradiating one of adjacent parts with the light of one of paired light sources only, with the other of the adjacent parts being irradiated with transmissive light, and fetching and setting a single picture for inspection through the fetching routes of the reflected light and transmitted light from both parts. CONSTITUTION:A belt-like mount 4 which arranges and holds numerous parts 1, 1A, and 1B in one line and an inspection station S provided on the running path of a tape 5 are provided. Light sources 10 and 11 provided in parallel with each other in the running direction of the tape 5, etc., in the vicinity of the station S are turned on in a state where the light sources 10 and 11 are respectively made to correspond to one of the adjacent parts 1A and 1B only in accordance with the arranged state of the parts 1A and 1B. The other parts are irradiated with transmissive light and a single picture for inspection is fetched and set through fetching routes Xb2, Ya, etc., of the reflected light and transmitted light. Then the set picture for inspection being taken out and set is put on a window for picture processing preset in corresponding to each route Xb2, Ya, etc., and the parts 1A and 1B are decided in quality.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、テーピングにより一列状態に整列保持された
多数個の部品の検査方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for inspecting a large number of parts held in a line by taping.

[従来の技術] 各種部品の良否判定を行なうための手段として従来より
画像処理が利用されており、対象部品の画像取り込み、
取り込まれた画像の量子化、特徴抽出等の情報収集及び
処理後、基準データとの比較により対象部品の良否判定
が行われる。このような画像処理利用による検査方法で
は取り込まれた画像のうち不要部分を除去することが一
般的に行われており、そのために処理対象となる領域(
ウィンド)が設定される。このウィンド設定方式による
部品の検査方法が例えば特開昭60−27084号公報
に開示されており、部品の移送経路近傍に設置されたカ
メラにより取り込まれた部品の全体形状画像が予め設定
されたウィンドと重ね合わせられ、この重ね合わせ結果
と基準データとの比較により対象部品の良否が判定され
る。
[Prior Art] Image processing has traditionally been used as a means of determining the quality of various parts.
After information collection and processing such as quantization and feature extraction of the captured image, the quality of the target part is determined by comparison with reference data. In inspection methods that use image processing, unnecessary parts are generally removed from the captured image, and for this purpose the area to be processed (
window) is set. A component inspection method using this window setting method is disclosed, for example, in Japanese Patent Laid-Open No. 60-27084, in which an image of the overall shape of the component captured by a camera installed near the component transport path is displayed in a preset window. The quality of the target part is determined by comparing the result of this superposition with reference data.

[発明が解決しようとする課題] 部品の検査項目が少なく、全体形状の画像取り出しのみ
にて部品の良否判定が行い得る場合には前記従来例のよ
うに1台のカメ、うで対象部品の全体形状を取り出せば
事足りる。しかしながら、例えばプリント基板へ電子部
品を自動挿入する装置への電子部品の装填では多数個の
同種の電子部品をテープで一列状態に整列保持して行わ
れるため、テープの存在及び電子部品自体の検査項目の
多さにより1台のカメラによる全体形状の取り込みのみ
では全ての検査項目に必要な画像を得ることができない
。そのため、複数台のカメラにより複数方向から対象部
品の画像取り出しを行わざるを得す、カメラの設置スペ
ース及びコストに関して問題が有る。しかも、検査対象
部品の配列方向を逆向きにすると、この向き替えに応し
て照射光源あるいはカメラの設置位置の変更といった面
倒な切換操作が必要となる。
[Problems to be Solved by the Invention] When there are few inspection items for a part and it is possible to judge the quality of the part only by taking out an image of the entire shape, it is possible to use one camera and arm to inspect the part as in the conventional example. It is enough to extract the entire shape. However, for example, when loading electronic components into a device that automatically inserts electronic components into a printed circuit board, a large number of electronic components of the same type are held in a line with tape, so inspections for the presence of the tape and the electronic components themselves are performed. Due to the large number of items, it is not possible to obtain images necessary for all inspection items by capturing the overall shape using only one camera. Therefore, it is necessary to take out images of the target part from multiple directions using multiple cameras, which poses problems regarding the installation space and cost of the cameras. Moreover, if the arrangement direction of the parts to be inspected is reversed, a troublesome switching operation such as changing the installation position of the irradiation light source or camera is required in accordance with this change of orientation.

[課題を解決するための手段コ そこで本発明では保持テープにより一列状態に整列保持
された部品を対象とし、保持テープの走行により前記検
査ステーションへ順次移送された隣合う一対の部品を別
方向から照射する一対の光源を検査ステーション近傍の
反射可能領域にて保持テープの走行方向に並設し、部品
の配列状態に応じて両光源のいずれか一方の点灯を隣合
う部品の一方にのみ対応させると共に、他方には透過照
明を対応させ、両部品からの反射光及び透過光の取り出
し経路を介して草−の検査用画像を取り出し設定し、各
取り出し経路に対応して予め設定された画像処理用ウィ
ンドと取り出し設定された検査用画像との重ね合わせに
基づいて良否判定のだめの情報収集及び処理を行なうよ
うにした。
[Means for Solving the Problem] Therefore, the present invention targets parts that are aligned and held in a line by a holding tape, and a pair of adjacent parts that are sequentially transferred to the inspection station by the running of the holding tape from different directions. A pair of irradiating light sources are arranged in parallel in the running direction of the holding tape in a reflective area near the inspection station, and depending on the arrangement of the parts, lighting of either light source corresponds to only one of the adjacent parts. At the same time, the other side is made to correspond to transmitted illumination, and images for inspection of the grass are taken out and set through the extraction paths of reflected light and transmitted light from both parts, and image processing that is set in advance corresponding to each extraction path is performed. Information collection and processing for pass/fail judgment is performed based on the superposition of the inspection window and the inspection image set to be taken out.

[作用] 検査ステーションへ移送された隣合う一対の部品は照射
光源からの照射光を受け、一方の照射光に対する部品か
らの反射光及び透過照明に対する他方の部品からの透過
光が互いに別の経路を経由して取り出され、単一の検査
用画像が取り出し設定される。前記反射光の経路は対象
部品からの直接反射経路以外にも例えば鏡使用により設
定可能であり、このような各種の経路設定により単一の
検査用画像の設定が可能である。これにより保持テープ
の存在に関係なく部品の各検査項目に関連する複数の画
像を難なく単一画像として取り出すことができる。しか
も、検査対象部品の配列の向きが逆になった場合には他
方の照射光源の点灯に対応する画像を検査対象とすれば
よく、この対象切換により前記検査用画像に対してテー
プ走行方向へ反転した検査画像が得られる。従って、1
台のカメラのみで光源あるいはカメラの設置位置を変更
することなく効率の良い検査を達成することができ、コ
スト抑制をも達成することができる。
[Operation] A pair of adjacent parts transferred to the inspection station receive irradiation light from the irradiation light source, and the reflected light from one part for the irradiation light and the transmitted light from the other part for the transmitted illumination take different paths from each other. A single inspection image is retrieved and set. The path of the reflected light can be set other than the direct reflection path from the target part, for example, by using a mirror, and a single inspection image can be set by setting such various paths. This allows multiple images related to each inspection item of the component to be easily retrieved as a single image regardless of the presence of the holding tape. Moreover, when the arrangement direction of the parts to be inspected is reversed, the image corresponding to the lighting of the other irradiation light source can be set as the inspection target, and by this target switching, the direction of the tape running direction relative to the inspection image can be set as the inspection target. An inverted inspection image is obtained. Therefore, 1
Efficient inspection can be achieved using only one camera without changing the light source or the installation position of the camera, and cost reductions can also be achieved.

[実施例] 以下、本発明を電解コンデンサの検査方法に具体化した
一実施例を図面に基づいて説明する。
[Example] Hereinafter, an example in which the present invention is embodied in a method for inspecting an electrolytic capacitor will be described based on the drawings.

第1.2図に示すように多数個の電解コンデンサlの長
短一対の極性リード線2,3が帯状台紙4上にその長手
方向と直交してテープ5により貼着保持されており、電
解コンデンサ1.1A、1Bの本体部6がテープ5の長
手方向と直交する側方へ延出して一列状態に整列保持さ
れている。各電解コンデンサ1.1A、1A、1Bは所
定ピッチpでもって離間保持されており、各電解コンデ
ンサI1A、1A、1B間にて帯状台紙4及びテープ5
には位置決め孔7が所定ピッチpでもって各電解コンデ
ンサ1.1A、1A、1B間にて透設されている。
As shown in Fig. 1.2, a pair of long and short polar lead wires 2 and 3 of a large number of electrolytic capacitors l are stuck and held on a strip-shaped mount 4 with tape 5 perpendicular to its longitudinal direction, and the electrolytic capacitors are The main body portions 6 of 1.1A and 1B extend to the sides perpendicular to the longitudinal direction of the tape 5 and are held aligned in a line. Each electrolytic capacitor 1.1A, 1A, 1B is held apart with a predetermined pitch p, and a strip mount 4 and a tape 5 are placed between each electrolytic capacitor I1A, 1A, 1B.
Positioning holes 7 are transparently provided between each electrolytic capacitor 1.1A, 1A, and 1B at a predetermined pitch p.

多数の電解コンデンサ1.LA、1A、1Bを一列状態
に整列保持する帯状台紙4及びテープ5は隣合う一対の
移送ローラ8.9上を案内されるようになっており、両
ローラ8.9の周面には位置決め孔7にはまり込む位置
決めピン8a、9aがそれぞれビ・7チpをもって形成
されている。一方の移送ローラ8はピッチpの間欠送り
を行なう駆動ローラであり、帯状台紙4及びテープ5は
位置決めピン8a、9aと位置決め孔7との嵌め込みに
基づいてピンチpずつ間欠移送される。
A large number of electrolytic capacitors1. The strip mount 4 and tape 5 that hold LA, 1A, and 1B aligned in a line are guided over a pair of adjacent transfer rollers 8.9, and positioning rollers are provided on the circumferential surfaces of both rollers 8.9. Positioning pins 8a and 9a that fit into the holes 7 are each formed with a groove. One of the transfer rollers 8 is a drive roller that performs intermittent feeding at a pitch p, and the strip-shaped mount 4 and tape 5 are intermittently transferred at a pitch p based on the fitting of the positioning pins 8a, 9a into the positioning holes 7.

両移送ローラ8,9間にて帯状台紙4の一例(電解コン
デンサ1.LA、1A、1Bの本体部6側)の上方には
一対のランプ10.11が下方へ照射可能に設置されて
おり、両ランプ10.11と電解コンデンサ1.1A、
18列との間には遮蔽板12が介在されていると共に1
.遮蔽板12の下部にはスリット12aが設けられてい
る。スリット12aは両ランプ10.11の間に対応し
て設定されており、一方のランプ10からの照射光はス
リン)12aを介して前側(テープ5の走行向きを前と
している)から電解コンデンサ1.IA。
A pair of lamps 10.11 are installed above an example of the strip mount 4 (on the main body 6 side of the electrolytic capacitors 1.LA, 1A, 1B) between the two transfer rollers 8, 9 so as to be able to illuminate the light downward. , both lamps 10.11 and electrolytic capacitor 1.1A,
A shielding plate 12 is interposed between the 18th column and the 18th column.
.. A slit 12a is provided at the bottom of the shielding plate 12. The slit 12a is set correspondingly between both lamps 10 and 11, and the irradiated light from one lamp 10 is transmitted from the front side (the running direction of the tape 5 is the front) through the slit 12a to the electrolytic capacitor 1. .. I.A.

18列上へ入射すると共に、他方のランプ11からの照
射光はスリット12aを介して後伸tから電解コンデン
サ1.LA、18列上へ入射する。
18 columns, and the irradiated light from the other lamp 11 passes through the slit 12a and is emitted from the rear elongation t to the electrolytic capacitor 1. LA, incident on the 18th column.

コンデンサ1.1A、18列の直下には第3のランプ1
7が両ランプio、itと対向して設置されており、ラ
ンプ17とコンデンサ1,1八。
Capacitor 1.1A, 3rd lamp 1 directly below the 18th row
7 is installed facing both lamps io and it, lamp 17 and capacitors 1 and 18.

18列との間には光を分散するためのスクリーン18が
介在されている。ランプ17からの照射光はスクリーン
18をi3過して上方へ向かう。
A screen 18 for dispersing light is interposed between the 18 rows. The irradiated light from the lamp 17 passes through the screen 18 i3 and heads upward.

両ランプ10.11と対応してコンデンサ1゜1A、1
8列上には第1及び第2の鏡13.14が略対向して設
置されていると共に、両鏡」3゜14の中間部上方には
第3の鏡15がテープ5の走行経路に対して略45°の
傾きをもって下向きに配設されており、第3の鏡15の
後方には画像取り出し用カメラ16がテープ5の走行方
向と略平行に配設されている。第1の鏡13はランプ1
0の照射光を受ける電解コンデンサ1A、1Bからの反
射光を第3の鏡15へ送ると共に、第2の鏡14はラン
プ11の照射光を受ける電解コンデンサIAからの反射
光を第3の鏡15へ送り、第3の鏡15は第1及び第2
の鏡13.14からの反射光及びランプ17からの照射
光をカメラ16へ向けて反射する。即ち、第1及び第2
の鏡13.14間が電解コンデンサ1.1A、1A、1
Bの検査ステーションSとして設定されており、両鏡1
314の間隔は隣合う一対の電解コンデンサLA、1A
、1Bの間隔よりも大きく設定されている。
Capacitor 1゜1A, 1 corresponding to both lamps 10.11
First and second mirrors 13 and 14 are installed approximately opposite each other on the 8th row, and a third mirror 15 is placed above the intermediate portion of both mirrors 13 and 14 so that the tape 5 travels along the running path. On the other hand, it is disposed facing downward with an inclination of approximately 45 degrees, and behind the third mirror 15, an image extraction camera 16 is disposed approximately parallel to the running direction of the tape 5. The first mirror 13 is the lamp 1
The second mirror 14 sends the reflected light from the electrolytic capacitors IA, which receives the irradiated light from the lamp 11, to the third mirror 15. 15, and the third mirror 15
The reflected light from the mirrors 13 and 14 and the irradiated light from the lamp 17 are reflected toward the camera 16. That is, the first and second
Between mirrors 13 and 14 are electrolytic capacitors 1.1A, 1A, 1
It is set as inspection station S of B, and both mirrors 1
314 is the distance between a pair of adjacent electrolytic capacitors LA, 1A
, 1B.

移送ローラ8の間欠送り駆動により検査ステーションS
に順次送りこまれる電解コンデンサ1゜1A、1A、1
Bが第1図及び第2図(a)、  (b)に示すように
進行側に負の短い極性リード線3を配置した配列状態の
場合、検査ステーションS内へ送り込まれた電解コンデ
ンサ1A、1Bは検査ステーシランSにおいて第1のラ
ンプ10からの照射を受ける。
Inspection station S by intermittent feeding drive of transfer roller 8
Electrolytic capacitors 1゜1A, 1A, 1 are sent sequentially to
When B is arranged in an arrangement state in which the short negative polarity lead wire 3 is arranged on the advancing side as shown in FIGS. 1 and 2 (a) and (b), the electrolytic capacitor 1A sent into the inspection station S, 1B receives irradiation from the first lamp 10 in the inspection station run S.

第1のランプ10からの照射光は矢印zbで代表される
経路に沿ってスリット12aから電解コンデンサ1A、
1B上へ入射し、負の極性リード綿3を指示するように
電解コンデンサ1A、1Bの本体部6の一側面に暗色表
示された負極性マーク6aの領域からの反射光は矢印Y
bで代表される経路に沿って第1の鏡13及び第3の鏡
15を経由してカメラ16へ取りこまれる。
The irradiated light from the first lamp 10 is transmitted from the slit 12a to the electrolytic capacitor 1A along the path represented by the arrow zb.
1B and reflected light from the area of the negative polarity mark 6a displayed in dark color on one side of the main body 6 of the electrolytic capacitors 1A and 1B to indicate the negative polarity lead cotton 3 is indicated by the arrow Y.
The image is taken into the camera 16 via the first mirror 13 and the third mirror 15 along a path represented by b.

第3のランプ17からの照射光は矢印Xa 1で代表さ
れる経路に沿ってスクリーン18を透過し、この透過光
Xa 1が矢印Xa 2で代表される経路へ鏡15から
反射されてカメラ16へ取り込まれる。
The irradiated light from the third lamp 17 is transmitted through the screen 18 along the path represented by the arrow Xa 1, and this transmitted light Xa 1 is reflected from the mirror 15 to the path represented by the arrow Xa 2, and the camera 16 be taken into.

第2図(c)はカメラ16で捉えた第2図(b)の1点
鎖線領域の画像であり、領域Diは透過光Xaによりで
きた電解コンデンサ1の本体部6の暗部、領域D2は透
過光Xaによりできた一方の極性リード線2の暗部、領
域D3は透過光Xaによりできた他方の極性リード綿3
の反射明部を反転した暗部をそれぞれ表す。又、領域D
1の右側の領域D4は第1の鏡13からの反射により取
り込まれた負極性マーク6a付近の反射像を表し、負極
性マーク6aを除いた本体部6の周面及び両極性リード
2,3が明部として表示され、負極性マーク6aは暗部
として表示される。
FIG. 2(c) is an image of the dot-dashed line area in FIG. 2(b) captured by the camera 16, where the area Di is the dark part of the main body 6 of the electrolytic capacitor 1 created by the transmitted light Xa, and the area D2 is the dark area of the main body 6 of the electrolytic capacitor 1. The dark area D3 of one polar lead wire 2 created by the transmitted light Xa is the dark area D3 of the other polar lead cotton 3 created by the transmitted light Xa.
Each represents the dark area that is the inversion of the reflected bright area. Also, area D
An area D4 on the right side of 1 represents a reflected image near the negative polarity mark 6a captured by reflection from the first mirror 13, and includes the peripheral surface of the main body 6 excluding the negative polarity mark 6a and the bipolar leads 2 and 3. is displayed as a bright area, and the negative polarity mark 6a is displayed as a dark area.

このように各入射経路Xal、Zb及び取り出し経路X
a2 、Ybを介して取り出された単一の明暗画像に対
応して形状認識のための画像処理対象領域(ウィンド)
が第2図(c)に破線で示すように複数設定される。ウ
ィンドの設定には公知の手段、例えば特開昭60−27
084号公棒に開示される設定方法等が用いられる。ウ
ィンドは電解コンデンサ1.LA、1A、1Bの検査項
目に応して設定され、検査項目としては帯状台紙4及び
テプ5に対する傾き及び高さ、部品間のピンチずれ、極
性リード線2.3の成形異常、負極性マーク6aの位置
異常、品種判定、部品の有無等がある。傾きはウィンド
W1と領域D1との重ね合わせ、高さはウィンドW2と
領域DIとの重ね合わせに基づいて判断される。ピッチ
ずれはウィンドW1と領域DI、ウィンドW3と領域D
2.D3、ウィンドW4.W6と領域D2及びウィンド
W5゜Wlと領域D3との各重ね合わせに基づいて判断
され、極性リード線2.3の成形異常はウィンドW3と
領域D2.D3、ウィンドW4.W6と領域D2及びウ
ィンドW5.W7と領域D3との各重ね合わせに基づい
て判断される。
In this way, each input path Xal, Zb and extraction path
a2, image processing target area (window) for shape recognition corresponding to a single brightness image extracted via Yb
A plurality of values are set as shown by broken lines in FIG. 2(c). For setting the window, known means are used, for example, Japanese Patent Application Laid-Open No. 60-27
The setting method disclosed in Publication No. 084 is used. The window is an electrolytic capacitor 1. The inspection items are set according to the inspection items of LA, 1A, and 1B, and the inspection items include the inclination and height with respect to the strip mount 4 and tape 5, pinch deviation between parts, abnormal molding of the polar lead wire 2.3, and negative polarity mark. There are abnormalities in the position of 6a, type determination, presence or absence of parts, etc. The inclination is determined based on the overlapping of the window W1 and the area D1, and the height is determined based on the overlapping of the window W2 and the area DI. The pitch deviation is between window W1 and area DI, and between window W3 and area D.
2. D3, Wind W4. It is determined based on the overlapping of W6 and area D2 and the window W5° Wl and area D3, and the abnormality in the formation of the polar lead wire 2.3 is determined based on the overlapping of window W3 and area D2. D3, Wind W4. W6, area D2 and window W5. The determination is made based on each superposition of W7 and area D3.

品種判定はウィンドWl、W2と領域D1、ウィンドW
3.W4と領域D2、ウィンドW3.W4、W5と領域
DI及びウィンドW3.W5と領域D3との重ね合わせ
に粘ついて行われ、部品の有無はウィンドWl、W2と
領域DI、ウィンド〜v6と領域D2及びウィンドW7
と領域D3との重ね合わヒに基づいて行われる。又、負
極性マーク6aの位置異常はウィンドW8と領域D4と
の重ね合わせに基づいて判断される。
Type determination is done using windows Wl, W2, area D1, and window W.
3. W4, area D2, window W3. W4, W5, area DI and window W3. This is done by superimposing W5 and area D3, and the presence or absence of parts is determined by window Wl, W2 and area DI, window ~v6, area D2, and window W7.
This is performed based on the superposition of the area D3 and the area D3. Further, the positional abnormality of the negative polarity mark 6a is determined based on the overlapping of the window W8 and the area D4.

ユれらの判断は重ね合わせにより得られた情報の画像処
理系における処理データと予め設定された基串データと
の比較に基づいて行われ、この比較を行なう制御系から
検査対象部品に対する良否判定結果が出力される。検査
対象部品が良品であれば取り出し経路Xa2.Ybを介
して得られる単一の検査用画像とウィンドW1〜W8と
の重ね合わせは第2図(C)に示す関係となる。
Judgments are made based on a comparison between the data processed by the image processing system of the information obtained through superimposition and preset basic data, and the control system that performs this comparison makes a pass/fail judgment for the part to be inspected. The result will be output. If the part to be inspected is a good item, take out route Xa2. The relationship between the single inspection image obtained via Yb and the windows W1 to W8 is shown in FIG. 2(C).

このような部品の良否判定を行なうためのウィンl”W
l−W8のうちウィンドW8は第1の鏡I3の設置によ
り取り出される負極性マーク6aの検査に対応して設定
されるものであり、(’l極性6aの位置検査は第2図
(a)、  (b)に示す位置の電解コンデンサ1A、
1Bにおいて行われる。
Win l”W for determining the quality of such parts
Of the l-W8, the window W8 is set to correspond to the inspection of the negative polarity mark 6a taken out by installing the first mirror I3. , an electrolytic capacitor 1A in the position shown in (b),
1B.

又、本体部6及び両極性リード線2,3の成形異常は第
2図(a)、  (b)に示す位置の電解コンデンサI
Aにおいて行われる。即ち、単一の電解コンデンサに対
する単一の照射光では単一画像上で行ない得ない負極性
マーク6aの位置検査、本体部6の傾き及び高さの検査
、極性リード線2,3の成形異常といった各種検査が隣
合う一対の電解コンデンサ1A、1A、1Bのうち電解
コンデンサIAに対しては透過照明することにより、電
解コンデンサ1A、1Bに対しては反射照明することに
より可能となる。即ち、外形検査では透過照明によるシ
ルエット化により鮮明な画像が得られ、負極性マーク検
査はスリット12aを介した反射照明により外形検査用
シルエットをくずすことなく行なわれる。
In addition, the abnormality in the molding of the main body 6 and the bipolar lead wires 2 and 3 is caused by electrolytic capacitor I located at the positions shown in Fig. 2 (a) and (b).
It is done at A. That is, inspection of the position of the negative polarity mark 6a, inspection of the inclination and height of the main body 6, and abnormal formation of the polarity lead wires 2 and 3, which cannot be performed on a single image with a single irradiation light for a single electrolytic capacitor. Various inspections such as these can be made possible by performing transmitted illumination on electrolytic capacitor IA of a pair of adjacent electrolytic capacitors 1A, 1A, and 1B, and by using reflective illumination on electrolytic capacitors 1A and 1B. That is, in the external shape inspection, a clear image can be obtained by creating a silhouette using transmitted illumination, and in the negative polarity mark inspection, the reflected illumination through the slit 12a is performed without destroying the silhouette for external shape inspection.

従って、検査項目の多さにも関わらず、検査対象部品の
検査項目に必要な各部位の画像取り出しを1台のカメラ
16により容易に取り出して安定した検査を行なうこと
ができ、複数台のカメラの設置スペース及びコストとい
った従来の検査方法における問題が解消される。
Therefore, despite the large number of inspection items, it is possible to easily take out images of each part of the part to be inspected that are necessary for the inspection items with one camera 16 and perform stable inspection, and it is possible to perform stable inspection using multiple cameras. Problems with conventional inspection methods such as installation space and cost are resolved.

第3図(a)、  (b)、  (c)は電解コンデン
サ1.1A、1A、1Bの配列向きを第2図(a)。
Figures 3(a), (b), and (c) show the arrangement orientation of electrolytic capacitors 1.1A, 1A, and 1B as shown in Figure 2(a).

(b)、  (c)とは逆にした場合であり、短い極性
リード線3及び負極性マーク6aが進行側とは反対側に
配置されている。この配列状態ではランプ11が点灯さ
れ、ランプ11からの照射光は矢印Zaで代表される入
射経路に沿って遮蔽板12のスリット12aから入射し
、電解コンデンサIAからの反射光は矢印Yaで代表さ
れる取り出し経路に沿ってカメラ16に取り込まれる。
(b) and (c) are the opposite cases, in which the short polarity lead wire 3 and the negative polarity mark 6a are arranged on the side opposite to the advancing side. In this arrangement state, the lamps 11 are lit, the irradiated light from the lamps 11 enters from the slit 12a of the shielding plate 12 along the incident path represented by the arrow Za, and the reflected light from the electrolytic capacitor IA is represented by the arrow Ya. The image is taken into the camera 16 along the extraction path.

矢印Xbl、xb2は第3のランプ17からの照射光を
代表し、これにより電解コンデンサ1A、1Bのシルエ
ットが得られる。この取り出された画(象は第3図(c
)に示すように第2図(c)の画像に対して画面を中心
に略左右反転しており、各領域D1゛D2“ D3°、
D4°が前記領域Di、D2D3.D4に対応する。そ
して、前記ウィンドW1〜W8に対応するウィンドWl
 ’、 W2 ’、 W3’  W4’、W5’、W6
’、W7’、W8“が同様に設定されている。即ら、ラ
ンプ10.11の点灯切換及びウィンドの設定切換を行
なうだけで電解コンデンサ1.1A、1A、1Bの配列
向きの変更に対応でき、鏡13.14.15の配置替え
あるいはカメラ16の配置替えといった面倒な操作を行
なう必要がない。
Arrows Xbl and xb2 represent the irradiation light from the third lamp 17, and thereby the silhouettes of the electrolytic capacitors 1A and 1B are obtained. This extracted image (the elephant is shown in Figure 3 (c)
), the image in FIG. 2(c) is approximately horizontally reversed centering on the screen, and each area D1, D2, D3,
D4° is the area Di, D2D3 . Corresponds to D4. Then, a window Wl corresponding to the windows W1 to W8 is
', W2', W3'W4',W5', W6
', W7', and W8'' are set in the same way.In other words, the orientation of the electrolytic capacitors 1.1A, 1A, and 1B can be changed by simply switching the lighting of the lamps 10.11 and switching the window settings. There is no need to perform troublesome operations such as rearrangement of mirrors 13, 14, 15 or rearrangement of camera 16.

本発明は勿論前記実施例にのみ限定されるものではなく
、例えば反射鏡として凹面鏡を採用することも可能であ
り、凹面鏡の採用は検査に必要な特定部位の拡大画像の
設定を可能とし、検査精度を高めることができる。ある
いは反射光の取り出し経路を設定するために光ファイバ
ーを採用することも可能であり、これにより取り出し経
路の設定が一届容易となる。
Of course, the present invention is not limited to the above-mentioned embodiments. For example, it is possible to use a concave mirror as a reflecting mirror. Adoption of a concave mirror makes it possible to set an enlarged image of a specific part necessary for inspection, and Accuracy can be increased. Alternatively, it is also possible to employ an optical fiber to set the extraction path for the reflected light, which makes it easier to set the extraction path.

又、電解コンデンサ以外の電子部品、さらには電子部品
以外の部品の検査に本発明を適用することも可能である
Further, the present invention can also be applied to the inspection of electronic components other than electrolytic capacitors, and furthermore, components other than electronic components.

[発明の効果] 以上詳述したように本発明は、保持テープの走行により
検査ステーションへ移送された隣合う一対の部品をその
配列向きに応じて一対の光源のいずれか一方の点灯を隣
合う部品の一方にのみ対応させると共に、他方には透過
照明を対応させ、両部品からの反射光及び透過光の取り
出し経路を介して単一の検査用画像を取り出し設定し、
各取り出し経路に対応して予め設定されたウィンドと取
り出し設定された検査用画像との重ね合わせに基づいて
良否判定のための情報収集及び処理を行なうようにした
ので、保持テープの存在に関係なく部品の各検査項目に
関連する複数の画像を難なく単一画像として取り出すこ
とができ、しかも検査部品の配列向きの変更にも容易に
対処して安定した検査及びコスト抑制を達成することが
できるという優れた効果を奏する。
[Effects of the Invention] As described in detail above, the present invention allows a pair of adjacent parts transported to an inspection station by running a holding tape to be illuminated by one of a pair of light sources in accordance with the arrangement direction of the parts. Correspond only to one of the parts, and correspond to the other part with transmitted illumination, extract and set a single inspection image through the extraction path of reflected light and transmitted light from both parts,
Information collection and processing for pass/fail judgment is performed based on the superimposition of the window set in advance for each extraction route and the inspection image set for extraction, regardless of the presence of the holding tape. It is said that multiple images related to each inspection item of a part can be extracted as a single image without difficulty, and it can also easily handle changes in the arrangement orientation of inspected parts to achieve stable inspection and cost reduction. It has excellent effects.

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本発明を具体化した一実施例を示し、第1図は検
査ステーション付近を示す斜視図、第2図(a)は要部
正面図、第2図(b)は平面図、第2図(c)は取り出
し設定された画像と設定ウィンドとの重ね合わせ関係を
示す令頁域図、第3図(a)、  (b)、  (c)
は電解コンデンサの配列向きを第2図(a)の場合と逆
にした場合を示し、第3図(a)は要部正面図、第3図
(b)は平面図、第3図(c)は取り出し設定された画
像と設定ウィンドとの重ね合わせ関係を示す領域図であ
る。 テーピングされた部品としての電解コンデンサ1.1A
、1A、1B、部品をテーピングするための帯状台紙4
及びテープ5、光源としてのランプ10゜11、検査ス
テーションS、取り出し経路Xa。
The drawings show an embodiment embodying the present invention; FIG. 1 is a perspective view showing the vicinity of the inspection station, FIG. 2(a) is a front view of the main part, FIG. 2(b) is a plan view, Figure (c) is a page area diagram showing the overlapping relationship between the retrieved and set image and the setting window, and Figures 3 (a), (b), and (c).
Figure 3(a) is a front view of the main parts, Figure 3(b) is a plan view, and Figure 3(c) shows the case where the arrangement direction of the electrolytic capacitors is reversed from that in Figure 2(a). ) is a region diagram showing the overlapping relationship between the extracted and set image and the setting window. Electrolytic capacitor 1.1A as taped component
, 1A, 1B, band-shaped mount 4 for taping parts
and tape 5, lamps 10 and 11 as light sources, inspection station S, and extraction path Xa.

Claims (1)

【特許請求の範囲】[Claims] 1 多数個の部品(1、1A、1B)を一列状態に整列
保持する保持テープ(4、5)の走行経路上に検査ステ
ーション(S)を設定し、保持テープ(4、5)の走行
により前記検査ステーション(S)へ順次移送された隣
合う一対の部品(1A、1B)を別方向から照射する一
対の光源(10、11)を検査ステーション(S)近傍
の反射可能領域にて保持テープ(4、5)の走行方向に
並設し、部品(1A、1B)の配列状態に応じて両光源
(10、11)のいずれか一方の点灯を隣合う部品(1
A、1B)の一方にのみ対応させると共に、他方には透
過照明を対応させ、両部品(1A、1B)からの反射光
及び透過光の取り出し経路(Xb_2、Ya又はXa_
2、Yb)を介して単一の検査用画像を取り出し設定し
、各取り出し経路(Xb_2、Ya又はXa_2、Yb
)に対応して予め設定された画像処理用ウインド(W1
〜W8、W1’〜W8’)と取り出し設定された検査用
画像との重ね合わせに基づいて良否判定のための情報収
集及び処理を行なうことを特徴とするテーピングされた
部品の検査方法。
1. An inspection station (S) is set on the running path of the holding tape (4, 5) that holds a large number of parts (1, 1A, 1B) in a line, and A pair of light sources (10, 11) that irradiate a pair of adjacent parts (1A, 1B) sequentially transferred to the inspection station (S) from different directions are held by a tape in a reflective area near the inspection station (S). (4, 5) are arranged in parallel in the running direction, and depending on the arrangement state of the parts (1A, 1B), one of the two light sources (10, 11) is turned on to turn on the adjacent part (1
A, 1B), the other is made to correspond to transmitted illumination, and the extraction path (Xb_2, Ya or Xa_
2, Yb) and set a single inspection image via each extraction path (Xb_2, Ya or Xa_2, Yb
) The image processing window (W1
-W8, W1'-W8') and an inspection image that has been set to be taken out. A method for inspecting taped parts, characterized in that information collection and processing for quality determination are performed based on the superimposition of images for inspection that are set to be taken out.
JP22155388A 1988-09-05 1988-09-05 Inspection method for taped parts Expired - Fee Related JPH0731053B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22155388A JPH0731053B2 (en) 1988-09-05 1988-09-05 Inspection method for taped parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22155388A JPH0731053B2 (en) 1988-09-05 1988-09-05 Inspection method for taped parts

Publications (2)

Publication Number Publication Date
JPH0269609A true JPH0269609A (en) 1990-03-08
JPH0731053B2 JPH0731053B2 (en) 1995-04-10

Family

ID=16768524

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22155388A Expired - Fee Related JPH0731053B2 (en) 1988-09-05 1988-09-05 Inspection method for taped parts

Country Status (1)

Country Link
JP (1) JPH0731053B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0451609U (en) * 1990-09-06 1992-04-30
JPH0599634A (en) * 1991-10-08 1993-04-23 Seiwa Sangyo Kk Visual inspection device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0451609U (en) * 1990-09-06 1992-04-30
JPH0599634A (en) * 1991-10-08 1993-04-23 Seiwa Sangyo Kk Visual inspection device

Also Published As

Publication number Publication date
JPH0731053B2 (en) 1995-04-10

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