JPH0253722B2 - - Google Patents

Info

Publication number
JPH0253722B2
JPH0253722B2 JP59188912A JP18891284A JPH0253722B2 JP H0253722 B2 JPH0253722 B2 JP H0253722B2 JP 59188912 A JP59188912 A JP 59188912A JP 18891284 A JP18891284 A JP 18891284A JP H0253722 B2 JPH0253722 B2 JP H0253722B2
Authority
JP
Japan
Prior art keywords
lead
image data
determined
coordinate
histogram
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59188912A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6166908A (ja
Inventor
Tetsuo Hirayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ikegami Tsushinki Co Ltd
Oki Electric Industry Co Ltd
Original Assignee
Ikegami Tsushinki Co Ltd
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ikegami Tsushinki Co Ltd, Oki Electric Industry Co Ltd filed Critical Ikegami Tsushinki Co Ltd
Priority to JP18891284A priority Critical patent/JPS6166908A/ja
Publication of JPS6166908A publication Critical patent/JPS6166908A/ja
Publication of JPH0253722B2 publication Critical patent/JPH0253722B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP18891284A 1984-09-11 1984-09-11 Icリ−ド検出方法 Granted JPS6166908A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18891284A JPS6166908A (ja) 1984-09-11 1984-09-11 Icリ−ド検出方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18891284A JPS6166908A (ja) 1984-09-11 1984-09-11 Icリ−ド検出方法

Publications (2)

Publication Number Publication Date
JPS6166908A JPS6166908A (ja) 1986-04-05
JPH0253722B2 true JPH0253722B2 (enrdf_load_stackoverflow) 1990-11-19

Family

ID=16232062

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18891284A Granted JPS6166908A (ja) 1984-09-11 1984-09-11 Icリ−ド検出方法

Country Status (1)

Country Link
JP (1) JPS6166908A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0756446B2 (ja) * 1985-02-22 1995-06-14 株式会社日立製作所 棒状突起物体の検査方法
JPS63138746A (ja) * 1986-11-29 1988-06-10 Kanematsu Electron Kk フラツトパツケ−ジicのリ−ドピンの状態検査装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5662508U (enrdf_load_stackoverflow) * 1979-10-22 1981-05-27

Also Published As

Publication number Publication date
JPS6166908A (ja) 1986-04-05

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