JPH0251256A - Sealing cap for semiconductor device - Google Patents

Sealing cap for semiconductor device

Info

Publication number
JPH0251256A
JPH0251256A JP63203621A JP20362188A JPH0251256A JP H0251256 A JPH0251256 A JP H0251256A JP 63203621 A JP63203621 A JP 63203621A JP 20362188 A JP20362188 A JP 20362188A JP H0251256 A JPH0251256 A JP H0251256A
Authority
JP
Japan
Prior art keywords
sealing cap
cap
semiconductor device
sealed
case
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63203621A
Other languages
Japanese (ja)
Inventor
Takaaki Numajiri
沼尻 敬明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP63203621A priority Critical patent/JPH0251256A/en
Publication of JPH0251256A publication Critical patent/JPH0251256A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched

Landscapes

  • Lead Frames For Integrated Circuits (AREA)

Abstract

PURPOSE:To facilitate unsealing work by making a sealing cap have a part protruding outward from the sealed part with a case. CONSTITUTION:In a semiconductor device which sealed a sealing cap 1 at a sealed part after installing a chip 5 to a case 4 and connecting it to a lead 3 with a bonding wire 6, the sealed cap 1 has a part protruding outward from the sealed part 2. Hereby, it can facilitate unsealing work as well as reduce errors such as scratches to a chip in unsealing, wire breaking, etc.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体装置用封止キャップに関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a sealing cap for a semiconductor device.

〔従来の技術〕[Conventional technology]

従来、半導体チップ5を封入するこの種の封止キャップ
は、第4図に示すように、キャップ1のまわり全体が全
てケース4の壁部に密着している形状となっていた。
Conventionally, this type of sealing cap for enclosing a semiconductor chip 5 has a shape in which the entire circumference of the cap 1 is in close contact with the wall of the case 4, as shown in FIG.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来の半導体装置用封止キャップはキャップ1
のまわり全体が全てケース4に密着している形状となっ
ているため、それを開封する際にはキャップ1に穴をあ
け、そこを切口としてニッパ−等でキャップ1をはがし
ていたため、チップ5にキズをつげたりワイヤー6を切
ってしまったりし解析不能になってしまうという欠点が
あった。
The conventional sealing cap for semiconductor devices described above is Cap 1.
Since the entire circumference of the chip 5 is in close contact with the case 4, when opening it, a hole is made in the cap 1 and the hole is used as a cut to peel off the cap 1 with nippers. This had the disadvantage that it could scratch the wire or break the wire 6, making analysis impossible.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の半導体装置用封止キャップはキャップのまわり
がケースと密着している部分より外側にはみ出した部分
を有している。
The sealing cap for a semiconductor device of the present invention has a portion around the cap that protrudes outside the portion that is in close contact with the case.

〔実施例〕〔Example〕

次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の一実施例の横断面図である。FIG. 1 is a cross-sectional view of one embodiment of the present invention.

ケース4にチップ5を取り付はポンディングワイヤー6
でリード3と接続した後密着部2で封止キャップ1を封
着した半導体装置において、封止キャップ1が密着部2
よりも外側にはみ出した部分を有している。第2図は、
第1図の封止キャッブ1の平面図であり、密着部2の外
側の部分Aがはみ出し部である。
Attach the chip 5 to the case 4 using the bonding wire 6
In a semiconductor device in which the sealing cap 1 is sealed at the contact portion 2 after connecting with the lead 3 at the contact portion 2, the sealing cap 1 is connected to the contact portion 2.
It has a part that protrudes outward. Figure 2 shows
2 is a plan view of the sealing cap 1 shown in FIG. 1, in which a portion A outside the close contact portion 2 is a protruding portion.

第3図は本発明の他の実施例の封止キャップ部の平面図
であり、はみ出し部Aを少なくすることによりキャップ
の面積を小さくすることができコストダウンを計れると
いう利点がある。
FIG. 3 is a plan view of a sealing cap portion according to another embodiment of the present invention. By reducing the protruding portion A, the area of the cap can be reduced, which has the advantage of reducing costs.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は封止キャップがケースとの
密着部よりも外側にはみ出した部分を有していることよ
り開封の際このはみ出した部分にニッパ−等をはさみこ
こからキャップを開けることができるため開封作業を容
易にする上、開封の際のチップへのキズ、ワイヤー切断
等のミスを減少させる効果がある。
As explained above, in the present invention, the sealing cap has a part that protrudes outward from the part that is in close contact with the case, so when opening the cap, the protruding part can be inserted with nippers or the like and the cap can be opened from there. This not only makes opening the package easier, but also reduces errors such as scratching the chip and cutting wires when opening the package.

の半導体装置用封止キャップの横断面図である。FIG. 2 is a cross-sectional view of a sealing cap for a semiconductor device.

1・・・・・・封止キャップ、2・・・・・・密着部、
3・・・・・・リード、4・・・・・・ケース、5・・
・・・・チップ、6・・・・・・ポンディングワイヤー
、A・・・・・・はみ出し部。
1...Sealing cap, 2...Tight part,
3...Lead, 4...Case, 5...
...Chip, 6...Ponding wire, A...Protrusion part.

代理人 弁理士  内 原   晋Agent Patent Attorney Susumu Uchihara

【図面の簡単な説明】[Brief explanation of the drawing]

Claims (1)

【特許請求の範囲】[Claims] 半導体素子を封入するセラミック容器の封止キャップを
該封止キャップの封止部よりも外側にケースと接触部を
もたないはみ出した部分を有するようにしたことを特徴
とする半導体装置用封止キャップ。
A seal for a semiconductor device, characterized in that a sealing cap of a ceramic container for enclosing a semiconductor element has a protruding portion outside the sealing portion of the sealing cap that does not have a contact portion with the case. cap.
JP63203621A 1988-08-15 1988-08-15 Sealing cap for semiconductor device Pending JPH0251256A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63203621A JPH0251256A (en) 1988-08-15 1988-08-15 Sealing cap for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63203621A JPH0251256A (en) 1988-08-15 1988-08-15 Sealing cap for semiconductor device

Publications (1)

Publication Number Publication Date
JPH0251256A true JPH0251256A (en) 1990-02-21

Family

ID=16477078

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63203621A Pending JPH0251256A (en) 1988-08-15 1988-08-15 Sealing cap for semiconductor device

Country Status (1)

Country Link
JP (1) JPH0251256A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0511538U (en) * 1991-07-18 1993-02-12 テイーデイーケイ株式会社 Electronic parts
US5502338A (en) * 1992-04-30 1996-03-26 Hitachi, Ltd. Power transistor device having collector voltage clamped to stable level over wide temperature range
US8243571B2 (en) 2008-10-02 2012-08-14 Panasonic Corporation Reproduced signal evaluating method, information recording medium, reproducing device, and recording device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0511538U (en) * 1991-07-18 1993-02-12 テイーデイーケイ株式会社 Electronic parts
US5502338A (en) * 1992-04-30 1996-03-26 Hitachi, Ltd. Power transistor device having collector voltage clamped to stable level over wide temperature range
US8243571B2 (en) 2008-10-02 2012-08-14 Panasonic Corporation Reproduced signal evaluating method, information recording medium, reproducing device, and recording device

Similar Documents

Publication Publication Date Title
JPH0251256A (en) Sealing cap for semiconductor device
JPH01161736A (en) Package for semiconductor device
JPS6297355A (en) Hermetic seal type semiconductor
KR920015521A (en) Semiconductor device and manufacturing method thereof
JPS61232641A (en) Semiconductor package
JP2674214B2 (en) Semiconductor device package
JPS6221250A (en) Resin-sealed semiconductor device and manufacture thereof
JPS62124756A (en) Semiconductor device
JPS6364046U (en)
JPS614251A (en) Semiconductor package
JPS6079749A (en) Semiconductor device
JPH024511Y2 (en)
JPS5827938U (en) semiconductor equipment
JPS62296448A (en) Package for semiconductor integrated circuit
JPH02129732U (en)
JPS6334275Y2 (en)
JPS58142940U (en) Metal caps for semiconductor devices
JPH0338640U (en)
JPH02106950A (en) Leadless chip carrier
JPS6169152A (en) Semiconductor device
JPS6333851A (en) Package for ic
JPH0238831A (en) Stem for semiconductor
JPS63300543A (en) Resin-sealed semiconductor device
JPH0160544U (en)
JPS62196852A (en) Semiconductor device