JPH0250455A - Semiconductor wafer carrier - Google Patents
Semiconductor wafer carrierInfo
- Publication number
- JPH0250455A JPH0250455A JP63201261A JP20126188A JPH0250455A JP H0250455 A JPH0250455 A JP H0250455A JP 63201261 A JP63201261 A JP 63201261A JP 20126188 A JP20126188 A JP 20126188A JP H0250455 A JPH0250455 A JP H0250455A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- carrier
- suction chuck
- sensor
- chuck
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 14
- 238000001514 detection method Methods 0.000 claims abstract description 4
- 230000007723 transport mechanism Effects 0.000 claims description 4
- 235000012431 wafers Nutrition 0.000 abstract description 48
- 230000007246 mechanism Effects 0.000 abstract description 5
- 238000000034 method Methods 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
- 230000002950 deficient Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体ウェハの搬送装置に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a semiconductor wafer transport device.
従来、この種のウェハ搬送装置は、キャリアを載せた台
が上下に動いて位置決めを行った後、ウェハ間に真空吸
着チャックを入れ、ウェハを真空吸着によってキャリア
外へ搬出する機構を備えるのが通常である。Conventionally, this type of wafer transfer device has a mechanism in which a stage on which a carrier is placed moves up and down to position it, and then a vacuum suction chuck is inserted between the wafers to transport the wafer out of the carrier by vacuum suction. Normal.
しかし、上述した従来のウェハ搬送装置では、真空吸着
チャックをウェハ間に入れる際、ウェハがキャリア内の
スロット間にまたがって入っていたり、或いはキャリア
のガタ等によりウェハが正しい位置にない場合には、チ
ャックとウェハとが相互に干渉して真空吸着チャックに
過負荷がかかり搬送不良を招くことがあり、最悪の場合
にはウェハが割れ製品不良をおこすばかりでなく、搬送
装置そのものの復旧のために多くの工数を必要とするよ
うな事態が生じる。However, with the above-mentioned conventional wafer transfer device, when the vacuum suction chuck is inserted between the wafers, if the wafer is inserted between the slots in the carrier, or if the wafer is not in the correct position due to play in the carrier, etc. , the chuck and wafer may interfere with each other, overloading the vacuum suction chuck and causing transport failure.In the worst case, the wafer may break, resulting in a defective product, and it may be necessary to restore the transport equipment itself. A situation arises that requires a large amount of man-hours.
本発明の目的は、上記の情況に鑑み、真空吸着チャック
機能をもつウェハの搬出機構にウェハとの相互干渉によ
る過負荷が生じることなき半導体ウェハの搬送装置を提
供することである。SUMMARY OF THE INVENTION In view of the above circumstances, it is an object of the present invention to provide a semiconductor wafer transfer device that does not cause overload on a wafer transfer mechanism having a vacuum suction chuck function due to mutual interference with the wafer.
本発明によれば、半導体ウェハの搬送装置は、。 According to the present invention, there is provided a semiconductor wafer transport device.
キャリア内に半導体ウェハを収納または搬出するウェハ
吸着チャックと、前記吸着チャックの先端部に設けられ
吸着チャックと半導体ウェハとの相互干渉を検知するセ
ンサと、前記センサの検知信号により吸着チャックの動
作を制御する搬送機構制御手段とを含んで構成される。A wafer suction chuck for storing or transporting a semiconductor wafer in a carrier; a sensor provided at the tip of the suction chuck to detect mutual interference between the suction chuck and the semiconductor wafer; and a detection signal from the sensor to control the operation of the suction chuck. and a transport mechanism control means for controlling the transport mechanism.
次に本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
第1図は本発明の一実施例を示す半導体ウェハ搬送装置
の断面図である0本実施例によれば、キャリア1に収納
されたウェハ2の出し入れは、モータ3の回転をボール
・ネジ4を介してキャリア・テーブル5へ伝達して上下
の位置決めをした後、基体6上のウェハ吸着チャック7
をaからbの方向へスライドさせることによって行われ
る。このウェハ吸着チャック7の先端には超音波または
反射型の光センサ等を用いたウェハ・センサ8が設けら
れ、ウェハ・チャック7とウェハ2と間に生じる干渉を
検知して搬送装置の運転が自動制御される。FIG. 1 is a cross-sectional view of a semiconductor wafer transfer device showing an embodiment of the present invention. According to this embodiment, the rotation of a motor 3 is used to take in and out a wafer 2 stored in a carrier 1 using a ball screw 4. The wafer is transferred to the carrier table 5 via the carrier table 5 for vertical positioning, and then the wafer suction chuck 7 on the base 6
This is done by sliding the button from a to b. A wafer sensor 8 using an ultrasonic or reflective optical sensor is provided at the tip of the wafer suction chuck 7, and detects interference between the wafer chuck 7 and the wafer 2 to control the operation of the transfer device. Automatically controlled.
第2図は本発明の他の実施例を示す半導体ウェハ搬送装
置の斜視図である。本実施例によれば、ウェハ吸着チャ
ック7がaの方向へスライドし、ウェハ2をとりに行く
際、ウェハ吸着チャック7とウェハ2とに干渉が生じた
場合には、ウェハ吸着7にはbの方向へ向う力が加わり
ウェハ吸着チャック7をbの方向へ動かすようにしたも
のである。この動きは過負荷センサ10で検知されてエ
ラー信号が出される。どの程度の負荷でセンサが検知す
るかは吸着チャック7の端部に取付けられたスプリング
9で調整される。FIG. 2 is a perspective view of a semiconductor wafer transfer device showing another embodiment of the present invention. According to this embodiment, when the wafer suction chuck 7 slides in the direction a and goes to pick up the wafer 2, if interference occurs between the wafer suction chuck 7 and the wafer 2, the wafer suction chuck 7 is A force in the direction b is applied to move the wafer suction chuck 7 in the direction b. This movement is detected by the overload sensor 10 and an error signal is generated. The amount of load that the sensor detects is adjusted by a spring 9 attached to the end of the suction chuck 7.
以上説明したように、本発明によれば、半導体ウェハと
真空チャックの干渉を検知する機構成いは過負荷検知機
構が取り入れられ未然に搬出機構の動作不良の発生が防
止されるので、ウェハ収納および搬出動作をきわめてス
ムーズ化することができる。As explained above, according to the present invention, a mechanical configuration for detecting interference between a semiconductor wafer and a vacuum chuck or an overload detection mechanism is incorporated to prevent malfunctions of the unloading mechanism. And the unloading operation can be made extremely smooth.
第1図は本発明の一実施例を示すウェハ搬送装置の断面
図、第2図は本発明の他の実施例を示すウェハ搬送装置
の斜視図である。
1・・・キャリア、2・・・半導体ウェハ、3・・・モ
ータ、4・・・ボール・ネジ、5・・・キャリア・テー
ブル、6・・・基体、7・・・ウェハ吸着チャック、8
・・・ウェハ・センサ、9・・・スプリング、10・・
・過負荷センサ。FIG. 1 is a sectional view of a wafer transport device showing one embodiment of the present invention, and FIG. 2 is a perspective view of a wafer transport device showing another embodiment of the invention. DESCRIPTION OF SYMBOLS 1... Carrier, 2... Semiconductor wafer, 3... Motor, 4... Ball screw, 5... Carrier table, 6... Base, 7... Wafer adsorption chuck, 8
...Wafer sensor, 9...Spring, 10...
・Overload sensor.
Claims (1)
ハ吸着チャックと、前記吸着チャックの先端部に設けら
れ吸着チャックと半導体ウェハとの相互干渉を検知する
センサと、前記センサの検知信号により吸着チャックの
動作を制御する搬送機構制御手段とを含むことを特徴と
する半導体ウェハの搬送装置。A wafer suction chuck for storing or transporting a semiconductor wafer in a carrier; a sensor provided at the tip of the suction chuck to detect mutual interference between the suction chuck and the semiconductor wafer; and a detection signal from the sensor to control the operation of the suction chuck. 1. A semiconductor wafer transport device, comprising: a transport mechanism control means for controlling a transport mechanism.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63201261A JPH0250455A (en) | 1988-08-12 | 1988-08-12 | Semiconductor wafer carrier |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63201261A JPH0250455A (en) | 1988-08-12 | 1988-08-12 | Semiconductor wafer carrier |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0250455A true JPH0250455A (en) | 1990-02-20 |
Family
ID=16438014
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63201261A Pending JPH0250455A (en) | 1988-08-12 | 1988-08-12 | Semiconductor wafer carrier |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0250455A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100269412B1 (en) * | 1993-02-16 | 2000-10-16 | 마쓰바 구니유키 | Transfer device |
CN103646904A (en) * | 2013-11-08 | 2014-03-19 | 上海华力微电子有限公司 | Mechanical arm |
CN105983978A (en) * | 2015-01-09 | 2016-10-05 | 力晶科技股份有限公司 | Detection device and detection method for mechanical arm |
US9685362B2 (en) | 2014-02-19 | 2017-06-20 | International Business Machines Corporation | Apparatus and method for centering substrates on a chuck |
-
1988
- 1988-08-12 JP JP63201261A patent/JPH0250455A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100269412B1 (en) * | 1993-02-16 | 2000-10-16 | 마쓰바 구니유키 | Transfer device |
CN103646904A (en) * | 2013-11-08 | 2014-03-19 | 上海华力微电子有限公司 | Mechanical arm |
US9685362B2 (en) | 2014-02-19 | 2017-06-20 | International Business Machines Corporation | Apparatus and method for centering substrates on a chuck |
US9997385B2 (en) | 2014-02-19 | 2018-06-12 | International Business Machines Corporation | Centering substrates on a chuck |
US10224225B2 (en) | 2014-02-19 | 2019-03-05 | International Business Machines Corporation | Centering substrates on a chuck |
CN105983978A (en) * | 2015-01-09 | 2016-10-05 | 力晶科技股份有限公司 | Detection device and detection method for mechanical arm |
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