JPH0249525Y2 - - Google Patents
Info
- Publication number
- JPH0249525Y2 JPH0249525Y2 JP16064483U JP16064483U JPH0249525Y2 JP H0249525 Y2 JPH0249525 Y2 JP H0249525Y2 JP 16064483 U JP16064483 U JP 16064483U JP 16064483 U JP16064483 U JP 16064483U JP H0249525 Y2 JPH0249525 Y2 JP H0249525Y2
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- fitting hole
- receiving plate
- screw
- bit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000007689 inspection Methods 0.000 claims description 14
- 239000000463 material Substances 0.000 claims description 13
- 230000007246 mechanism Effects 0.000 claims description 8
- 238000004519 manufacturing process Methods 0.000 claims description 7
- 230000005611 electricity Effects 0.000 claims 1
- 238000005192 partition Methods 0.000 description 11
- 238000012360 testing method Methods 0.000 description 4
- 230000005856 abnormality Effects 0.000 description 3
- 238000007790 scraping Methods 0.000 description 3
- 230000002950 deficient Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 230000032258 transport Effects 0.000 description 1
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16064483U JPS6068405U (ja) | 1983-10-19 | 1983-10-19 | ねじ頭部の工具嵌合穴検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16064483U JPS6068405U (ja) | 1983-10-19 | 1983-10-19 | ねじ頭部の工具嵌合穴検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6068405U JPS6068405U (ja) | 1985-05-15 |
| JPH0249525Y2 true JPH0249525Y2 (en:Method) | 1990-12-27 |
Family
ID=30353278
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16064483U Granted JPS6068405U (ja) | 1983-10-19 | 1983-10-19 | ねじ頭部の工具嵌合穴検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6068405U (en:Method) |
-
1983
- 1983-10-19 JP JP16064483U patent/JPS6068405U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6068405U (ja) | 1985-05-15 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN108512013B (zh) | 一种新能源汽车连接器扭簧插孔自动化装配设备 | |
| CN114988085A (zh) | 一种台式的高效零件螺纹检测机床 | |
| JPH0149889B2 (en:Method) | ||
| JPH0249525Y2 (en:Method) | ||
| CN218567535U (zh) | 一种旋转式多工位集成电路芯片测试工装 | |
| CN110207561B (zh) | 内牙通过检测设备 | |
| CN107728229A (zh) | 凸焊螺母自动化检测设备及控制方法 | |
| CN120064944A (zh) | 一种晶圆测试装置及晶圆测试方法 | |
| CN221528814U (zh) | 一种芯片检测用治具 | |
| JPS60500636A (ja) | 紙の引裂抵抗を測定する方法およびその方法を実施するための装置 | |
| CN118060213A (zh) | 一种储能电池的性能检测装置及其方法 | |
| US3878726A (en) | Device for sampling inspection | |
| CN117019692A (zh) | 一种螺纹通止测量的扭矩控制机构及其方法 | |
| KR101570126B1 (ko) | 코킹 장치 | |
| JPH0480347B2 (en:Method) | ||
| CN111257735B (zh) | 一种电气基板检测装置及检测方法 | |
| JPS6055228B2 (ja) | 自動溶接方法 | |
| CN222587328U (zh) | 一种测试用转动工装 | |
| CN211148013U (zh) | 一种端子机上的拉拔检测机构 | |
| CN114378644B (zh) | 找零装置、刀具异常检测系统及方法 | |
| WO2004059332A1 (en) | An ic transfer device | |
| CN114291558B (zh) | 一种汽车电源上盖综合检具及其检测方法 | |
| CN220329318U (zh) | 一种螺柱检测装置 | |
| CN223051138U (zh) | 一种端子压着不良检出装置 | |
| CN110686974A (zh) | 炭黑粒子强度测试仪 |