JPH0245945A - Circuit board - Google Patents

Circuit board

Info

Publication number
JPH0245945A
JPH0245945A JP19648288A JP19648288A JPH0245945A JP H0245945 A JPH0245945 A JP H0245945A JP 19648288 A JP19648288 A JP 19648288A JP 19648288 A JP19648288 A JP 19648288A JP H0245945 A JPH0245945 A JP H0245945A
Authority
JP
Japan
Prior art keywords
lead
circuit board
electrical characteristics
hoop
chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19648288A
Other languages
Japanese (ja)
Inventor
Shigeru Hirano
茂 平野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP19648288A priority Critical patent/JPH0245945A/en
Publication of JPH0245945A publication Critical patent/JPH0245945A/en
Pending legal-status Critical Current

Links

Landscapes

  • Wire Bonding (AREA)

Abstract

PURPOSE:To measure electrical characteristics of a mounted IC while a circuit board is in hoop shape by providing a lead for supporting the IC at the board and bonding or joining the lead for supporting the IC. CONSTITUTION:A metal conductor 3 other than a lead bonded to an external connection part of an IC is extended to an IC side in lead shape and the conductor 3 is joined to a dummy pad or a dummy bump 5. Electrical characteristics of the IC can be measured by applying a terminal for measuring electrical characteristics to a lead 2. Thus, electrical characteristics of the mounted IC chip can be measured in hoop shape.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明はフープ状回路基板の構造に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to the structure of a hoop-shaped circuit board.

[従来の技術] 従来の金属導体のみからなるフープ状基板本体1のリー
ド2は第8図に示すように全て工Cチップ4上のバンプ
あるいはパッド部に接合され、そのリード2は工Cチッ
プ4内外間の電気信号伝達の為に使われる。
[Prior Art] As shown in FIG. 8, all the leads 2 of the hoop-shaped substrate body 1 made of conventional metal conductors are bonded to bumps or pads on the engineered C chip 4. 4 Used for electrical signal transmission between inside and outside.

[発明が解決しようとする課題] しかし前述の従来技術では、ギヤングポンディング後、
工Cチップの電気特性をみる際、ICをリード部で切断
し、フープから取り出さなければICの電気特性を調べ
ることはできず、その後の工程では、量産性に秀れる、
というフープ形状の利点を生かすことができないという
問題点を有する。そこで本発明はこのような問題点を解
決するもので、その目的とするところは7−プ状のまま
で工Oの電気特性を測定するところにある。
[Problem to be solved by the invention] However, in the above-mentioned conventional technology, after gigantic bonding,
When looking at the electrical characteristics of a manufactured C chip, it is impossible to examine the electrical characteristics of the IC unless the IC is cut at the lead section and taken out from the hoop.
The problem is that the advantages of the hoop shape cannot be taken advantage of. The present invention is intended to solve these problems, and its purpose is to measure the electrical properties of a metal oxide while it is still in the 7-ply shape.

[課題を解決するための手段] (1)  本発明の回路基板は、ICの外部接続部と接
合するリードを有し金属導体のみよりなるフープ状回路
基板において、工Cの前記外部接続部と接合するリード
以外にも金属導体がリード状にIC側へ伸び、そのリー
ド状金属がIC上のダミーパッドあるいはダミーバンプ
と接合されていることを特徴とする。
[Means for Solving the Problems] (1) The circuit board of the present invention is a hoop-shaped circuit board made of only a metal conductor and having leads that connect to the external connection part of an IC. In addition to the leads to be joined, a metal conductor extends toward the IC in the form of a lead, and the lead-like metal is joined to a dummy pad or dummy bump on the IC.

(2)  前記リード状金属が工Cとモールド樹脂ある
いは接着剤により接合されていることを特徴とする。
(2) The lead-shaped metal is bonded to the workpiece C using a molding resin or an adhesive.

C実施例] 第1図は本発明の実施例を示すフープ状基板とICチッ
プのギヤングボンディング後の平面図であって、第2図
はその断面図である。1はフープ状基板本体、2はリー
ド、3はIC支持用リード4は工Cチップ、5はリード
側もしくはバンプ側に設けられたバンプである。IC,
チップ4とリード2、工C支持用リード6はバンプ5を
介して接合されている。第3図は第1図で示した基板を
フープ状のままで電気特性が測定できるようにリード2
を切断した平面図である。ICの電気特性はり−ド2に
電気特性測定用端子を当てることにより測定でき、また
、工Cチップ4はIC支持用リード6によりフープ状の
基板本体1に固定されている。したがってフープ状のま
まで実装したIOの電気特性をみることができる。
C Embodiment] FIG. 1 is a plan view of a hoop-shaped substrate and an IC chip after gigantic bonding, showing an embodiment of the present invention, and FIG. 2 is a cross-sectional view thereof. 1 is a hoop-shaped substrate main body, 2 is a lead, 3 is an IC supporting lead 4 is an engineered C chip, and 5 is a bump provided on the lead side or the bump side. IC,
The chip 4, the leads 2, and the leads 6 for supporting the workpiece C are connected via bumps 5. Figure 3 shows how to measure the electrical characteristics of the board shown in Figure 1 while keeping it in a hoop shape.
FIG. The electrical characteristics of the IC can be measured by applying an electrical characteristics measuring terminal to the beam 2, and the IC chip 4 is fixed to the hoop-shaped substrate body 1 by IC supporting leads 6. Therefore, the electrical characteristics of the IO mounted in the hoop shape can be observed.

第4図は本発明の他の実施例を示す平面図で、第5図は
その断面図である。6はモールド樹脂又は接着剤である
。IC支持用リード3は工Cチップ5とモールド樹脂又
は接着剤6で固着されており、電気特性を測定する際、
ICチップ4はIC支持用リード6によりフープ状の基
板本体1に固定されている為、7−プ状のままで実装し
たICの電気特性を調べることができる。またモールド
樹脂6でICチップ4と工C支持用リード6を固着する
際、第6図に示す様に、モールド樹脂で工Cチップ5の
全体を覆えば、工Cチップ5と工C支持用リード6を固
着する工程と一般的なモールド樹脂コートの工程が同時
に行うことができるので作業能率が向上し、更にリード
2の工C側かモールド樹脂6で覆われることにより、工
0チップ4を電気特性測定のため、リード2を切断した
際リード2の機械的強度を向上させることができる。
FIG. 4 is a plan view showing another embodiment of the present invention, and FIG. 5 is a sectional view thereof. 6 is molding resin or adhesive. The IC support lead 3 is fixed to the engineered C chip 5 using mold resin or adhesive 6, and when measuring electrical characteristics,
Since the IC chip 4 is fixed to the hoop-shaped substrate body 1 by the IC supporting leads 6, the electrical characteristics of the mounted IC can be examined while the IC chip 4 remains in the hoop shape. Furthermore, when fixing the IC chip 4 and the lead 6 for supporting the workpiece C with the mold resin 6, as shown in FIG. The process of fixing the lead 6 and the general mold resin coating process can be performed at the same time, improving work efficiency.Furthermore, since the process C side of the lead 2 is covered with the mold resin 6, the process 0 chip 4 can be easily removed. When the lead 2 is cut for measuring electrical characteristics, the mechanical strength of the lead 2 can be improved.

第7図は本発明における工C支持用リード3の他の形状
例を示す。第7図に示す様にIC支持用リード3の形状
、大きさ、位置はICを支持するという目的を達するも
のであれば任意でよい。
FIG. 7 shows another example of the shape of the lead 3 for supporting the workpiece C in the present invention. As shown in FIG. 7, the shape, size, and position of the IC supporting lead 3 may be arbitrary as long as it achieves the purpose of supporting the IC.

[発明の効果] 以上述べたように本発明によれば、金属導体のみよりな
る7一ブ状回路基板において、基板が10支持用リード
を有し、そのIC支持用リードを工Oへ接合もしくは接
着することにより、回路基板がフープ状のままで、実装
した工0チップの電気特性を測定でき、量産性の向上が
はかられる。
[Effects of the Invention] As described above, according to the present invention, in a 7-tube-shaped circuit board made only of metal conductors, the board has 10 supporting leads, and the IC supporting leads are joined or connected to the IC. By adhering, the electrical characteristics of the mounted chip can be measured while the circuit board remains hoop-shaped, improving mass productivity.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の回路基板の一実施例を示す正面図。 第2図は第1図の主要断面図。 第3図は第1図のリード切断後の平面図。 第4図は本発明の回路基板の他の実施例を示す平面図。 第5図は第4図の主要断面図。 第6図は第4図においてICチップとIC支持用リード
を接合する接合の他の実施例を示す主要断面図。 第7図は本発明におけるIC支持用リードの形状に関す
る他の実施例を示す平面図。 第8図は従来例の回路基板を示す平面図。 1・・・・・・・・・フープ状基板本体2・・・・・・
・・・リード 3・・・・・・・・・工C支持用リード4・・・・・・
・・・ICチップ 5 ・・・ ・・・ ・・・ ノ(ン プロ・・・・・
・・・・モールド樹脂または接着剤以上 出願人 セイコーエプソン株式会社 代理人 弁理士 鈴木喜三部(他1名)口 口 口 第 ■ 図 第2図 第9図 ζ 第2 図 口 口 口 第7図
FIG. 1 is a front view showing an embodiment of the circuit board of the present invention. FIG. 2 is a main sectional view of FIG. 1. FIG. 3 is a plan view of the lead shown in FIG. 1 after being cut. FIG. 4 is a plan view showing another embodiment of the circuit board of the present invention. FIG. 5 is a main sectional view of FIG. 4. FIG. 6 is a main cross-sectional view showing another embodiment of joining the IC chip and the IC support lead in FIG. 4. FIG. 7 is a plan view showing another embodiment of the shape of the IC supporting lead in the present invention. FIG. 8 is a plan view showing a conventional circuit board. 1... Hoop-shaped substrate body 2...
...Lead 3......Work C support lead 4...
・・・IC chip 5 ・・・ ・・・ ノ(ノ)・・・
... Mold resin or adhesive or more Applicant Seiko Epson Co., Ltd. Agent Patent attorney Kizobe Suzuki (and 1 other person) 口口口 No. 2 Figure 9 ζ 2 Figure 口口 7 figure

Claims (2)

【特許請求の範囲】[Claims] (1)ICの外部接続部と接合するリードを有し、金属
導体のみよりなるフープ状回路基板において、ICの前
記外部接続部と接合するリード以外にも金属導体がリー
ド状にIC側に伸び、そのリード状金属がIC上のダミ
ーパットあるいはダミーバンプと接合されていることを
特徴とする回路基板。
(1) In a hoop-shaped circuit board that has a lead that connects to the external connection part of the IC and is made only of metal conductors, in addition to the lead that connects to the external connection part of the IC, the metal conductor extends in the form of a lead toward the IC side. A circuit board characterized in that the lead-shaped metal is bonded to a dummy pad or dummy bump on an IC.
(2)前記リード状金属がICとモールド樹脂あるいは
接着剤により接合されていることを特徴とする請求項1
記載の回路基板。
(2) Claim 1 characterized in that the lead-shaped metal is bonded to the IC using a mold resin or an adhesive.
The circuit board described.
JP19648288A 1988-08-06 1988-08-06 Circuit board Pending JPH0245945A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19648288A JPH0245945A (en) 1988-08-06 1988-08-06 Circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19648288A JPH0245945A (en) 1988-08-06 1988-08-06 Circuit board

Publications (1)

Publication Number Publication Date
JPH0245945A true JPH0245945A (en) 1990-02-15

Family

ID=16358521

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19648288A Pending JPH0245945A (en) 1988-08-06 1988-08-06 Circuit board

Country Status (1)

Country Link
JP (1) JPH0245945A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02155248A (en) * 1988-12-07 1990-06-14 Nec Corp Structure of tab
JPH09199532A (en) * 1996-01-12 1997-07-31 Nec Corp Mounting method and mounting structure of semiconductor circuit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02155248A (en) * 1988-12-07 1990-06-14 Nec Corp Structure of tab
JPH09199532A (en) * 1996-01-12 1997-07-31 Nec Corp Mounting method and mounting structure of semiconductor circuit

Similar Documents

Publication Publication Date Title
JP3207738B2 (en) Resin-sealed semiconductor device and method of manufacturing the same
WO2005017968A3 (en) Semiconductor device package and method for manufacturing same
JPH0394459A (en) Semiconductor chip module and manufacture thereof
JPS6353959A (en) Lead frame for semiconductor device and manufacture thereof
JPH02278740A (en) Packaging of semiconductor device
JPH0245945A (en) Circuit board
JPS62142341A (en) Semiconductor device and manufacture thereof
JPH0582977B2 (en)
JPH04157758A (en) Printed circuit board
KR100783638B1 (en) semiconductor chip package of stack type
JPH10223638A (en) Semiconductor device and its mounting method
JPS5854507B2 (en) Lead frame manufacturing method
JPH01124227A (en) Semiconductor device
JPH08181165A (en) Semiconductor integrated circuit
JPH04174548A (en) Lead frame
JP2001068582A (en) Semiconductor device and manufacture thereof
KR940004278Y1 (en) Cot package
JPH03116745A (en) Resin-sealed semiconductor device
JPH0287641A (en) Semiconductor integrated circuit
JPS6060743A (en) Lead frame
JPH0574867A (en) Tab tape
JPS6355963A (en) Gold bump forming method
JPH0595023A (en) Lead frame for semiconductor-integratedcircuit sealing device use
JPH056951A (en) Semiconductor device and manufacturing method thereof
JPH03240251A (en) Method of repairing defective semiconductor chip