JPH0240539Y2 - - Google Patents

Info

Publication number
JPH0240539Y2
JPH0240539Y2 JP1984098373U JP9837384U JPH0240539Y2 JP H0240539 Y2 JPH0240539 Y2 JP H0240539Y2 JP 1984098373 U JP1984098373 U JP 1984098373U JP 9837384 U JP9837384 U JP 9837384U JP H0240539 Y2 JPH0240539 Y2 JP H0240539Y2
Authority
JP
Japan
Prior art keywords
contact
plunger
contact pins
plunger contact
sleeve
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1984098373U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6114383U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9837384U priority Critical patent/JPS6114383U/ja
Publication of JPS6114383U publication Critical patent/JPS6114383U/ja
Application granted granted Critical
Publication of JPH0240539Y2 publication Critical patent/JPH0240539Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
JP9837384U 1984-06-29 1984-06-29 コンタクトプロ−ブ Granted JPS6114383U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9837384U JPS6114383U (ja) 1984-06-29 1984-06-29 コンタクトプロ−ブ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9837384U JPS6114383U (ja) 1984-06-29 1984-06-29 コンタクトプロ−ブ

Publications (2)

Publication Number Publication Date
JPS6114383U JPS6114383U (ja) 1986-01-28
JPH0240539Y2 true JPH0240539Y2 (zh) 1990-10-29

Family

ID=30657916

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9837384U Granted JPS6114383U (ja) 1984-06-29 1984-06-29 コンタクトプロ−ブ

Country Status (1)

Country Link
JP (1) JPS6114383U (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6652326B2 (en) * 2000-07-13 2003-11-25 Rika Electronics International, Inc. Contact apparatus particularly useful with test equipment
WO2007066382A1 (ja) * 2005-12-06 2007-06-14 Unitechno Inc. 両端変位型コンタクトプローブ

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5150617Y2 (zh) * 1971-12-07 1976-12-04

Also Published As

Publication number Publication date
JPS6114383U (ja) 1986-01-28

Similar Documents

Publication Publication Date Title
JP3414593B2 (ja) 導電性接触子
US7271606B1 (en) Spring-based probe pin that allows kelvin testing
KR101920855B1 (ko) 검사용 소켓
KR20170000572A (ko) 전자 디바이스 테스트용 탐침 장치
JPH0240539Y2 (zh)
JPH0521020Y2 (zh)
KR200260960Y1 (ko) 칩 검사용 탐침장치
JP3165648B2 (ja) 導電性接触子構造
KR200182523Y1 (ko) 검사용 탐침장치
JPH0323577Y2 (zh)
KR200345867Y1 (ko) 검사용 탐침장치
JPH0532774Y2 (zh)
JPH0566243A (ja) Lsi評価用治具
KR102693799B1 (ko) 컨택터 및 그를 갖는 테스트용 소켓
JPS6080772A (ja) プロ−ブニ−ドル
JP2556129B2 (ja) フレキシブルプローブカード
JP2651430B2 (ja) カード式コンタクトプローブ
JPH0219745Y2 (zh)
JPS6236137Y2 (zh)
KR0119738Y1 (ko) 점 접촉형 반도체 디바이스 테스트 소켓
JPH045011Y2 (zh)
JPS6217728Y2 (zh)
JPH0532773Y2 (zh)
JPS6230293Y2 (zh)
JPS631250Y2 (zh)