JPH0236306A - Warp quantity measuring method for printed circuit board - Google Patents

Warp quantity measuring method for printed circuit board

Info

Publication number
JPH0236306A
JPH0236306A JP63185530A JP18553088A JPH0236306A JP H0236306 A JPH0236306 A JP H0236306A JP 63185530 A JP63185530 A JP 63185530A JP 18553088 A JP18553088 A JP 18553088A JP H0236306 A JPH0236306 A JP H0236306A
Authority
JP
Japan
Prior art keywords
data
circuit board
printed circuit
amount
measurement points
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63185530A
Other languages
Japanese (ja)
Inventor
Sukeyuki Hoshino
祐之 星野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP63185530A priority Critical patent/JPH0236306A/en
Publication of JPH0236306A publication Critical patent/JPH0236306A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To measure the warp quantity of the circuit board by measuring the distances between measurement points arranged on the printed circuit board at constant intervals and a distance measuring means and processing data on them. CONSTITUTION:The printed circuit board 1 is mounted on an X-Y table 7 and single or plural distance measuring means 8 are installed on the substrate 1. Then the table 7 is moved in an X and a Y direction to move the means 8 onto all the measurement points 4 arrayed on the substrate 1 at the constant intervals, the distances are measured, and the data on them are inputted to the storage device of an arithmetic unit. Here, an electronic component 2 is mounted on the board 1 and a fitting hole 3 is bored, so there is data which has a large variation quantity and varies abruptly as compared with data on adjacent measurement points 4, but the arithmetic unit discards the data like this and interpolates data which has a small variation quantity and varies smoothly and data at a standard measurement point to obtain a curve indicating the entire warp quantity of the board 1.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、電子部品が装着されたプリント回路基板の反
り量測定方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for measuring the amount of warpage of a printed circuit board on which electronic components are mounted.

〔発明の概要〕[Summary of the invention]

本発明は、電子部品が装着されたプリント回路基板に対
応する位置に設けた距離検出手段によりプリント回路基
板上に一定間隔に配置された測定点と距離検出手段間の
距離を測定し、そのデータを演算装置の記憶手段に入力
し、入力された各データを演算装置により処理すること
により、各測定点のプリント回路基板の反り量を測定す
る方法である。
The present invention measures the distance between measurement points arranged at regular intervals on the printed circuit board and the distance detection means using a distance detection means provided at a position corresponding to a printed circuit board on which electronic components are mounted, and uses the distance detection means to measure the distance between measurement points arranged at regular intervals on the printed circuit board and the distance detection means. In this method, the amount of warpage of the printed circuit board at each measurement point is measured by inputting the data into the storage means of the arithmetic device and processing each input data by the arithmetic device.

〔従来の技術〕[Conventional technology]

従来より、電子部品2(リード付部品、チップ部品を含
めて総称する。)が装着された状態のプリント回路基板
1を加工したり検査したりする装置として、第4図に示
すレーザはんだ付は装置、第5図に示すチップ部品装着
検査装置等が電子機器の製造工程に使用されている。
Conventionally, the laser soldering device shown in FIG. Devices such as the chip component mounting inspection device shown in FIG. 5 are used in the manufacturing process of electronic devices.

上述の両装置ともに、レーザ9、カメラ10等の光学機
器を使用しているために、プリント回路基板1上面の電
子部品2等の被写体に焦点を合わせる必要がある。
Since both of the above-mentioned devices use optical equipment such as a laser 9 and a camera 10, it is necessary to focus on an object such as the electronic component 2 on the top surface of the printed circuit board 1.

一般に、電子部品2が装着されたプリント回路基板1は
、はんだ付けのためにフローソルダ、リフロー炉等の各
種の加熱工程を経ており、加熱工程後筒6図に示すよう
な上反り、第7図に示すような下反りが生じ、この反り
量が一定値を越えると以下に説明するような不具合が生
ずる。
In general, the printed circuit board 1 on which the electronic component 2 is mounted is subjected to various heating processes such as flow soldering and reflow oven for soldering, and after the heating process the cylinder 6 is warped as shown in FIG. 7. A downward curvature as shown in FIG. 2 occurs, and if this amount of curvature exceeds a certain value, a problem as described below will occur.

(1)第4図に示したレーザはんだ付は装置の場合は、
レーザ9のスポットがプリント回路基板1上の電子部品
2のはんだ付はポイントに焦点を結ばなくなり、加熱温
度が低下しはんだ付は不良が発生する。また、レーザ9
を斜め上より照射するため、レーザ9のスポットがプリ
ント回路基板1上の加熱ポイントからずれる。
(1) In the case of the laser soldering device shown in Figure 4,
The spot of the laser 9 is no longer focused on the soldering point of the electronic component 2 on the printed circuit board 1, and the heating temperature decreases, resulting in defective soldering. Also, laser 9
Since it is irradiated obliquely from above, the spot of the laser 9 is shifted from the heating point on the printed circuit board 1.

(2)第5図に示したチップ部品装着検査装置の場合は
、カメラ10の焦点が合わなくなるので、プリント回路
基板1上のチップ部品2の入力画像の画質が劣化し、チ
ップ装着状態の検査判定に誤りが生ずる。
(2) In the case of the chip component mounting inspection device shown in FIG. 5, since the camera 10 becomes out of focus, the quality of the input image of the chip component 2 on the printed circuit board 1 deteriorates, and the chip mounting state is inspected. An error occurs in the judgment.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

従来より、プリント回路基板の加熱による反りを防止す
る各種の工夫がなされており、例えば実開昭58−14
0662号公報によれば、プリント回路基板を自動はん
だ付けするフローソルダのプリント回路基板冷却工程に
反り矯正装置を設け、加熱によるプリント回路基板の反
りを防止している。また、例えば特開昭59−2949
2号公報によれば、表面にリード付部品を装着し、フロ
ーツルダニ程を経たプリント回路基板の裏面にチップ部
品を装着する工程で、予め反りのあったプリント回路基
板あるいはチップ装着工程で発生ずるプリント回路基板
の反りを防止または矯正するためにバックアップビンを
設けている゛。
In the past, various efforts have been made to prevent warping of printed circuit boards due to heating.
According to Japanese Patent No. 0662, a warpage straightening device is provided in the printed circuit board cooling process of a flow solder for automatically soldering printed circuit boards to prevent warping of the printed circuit board due to heating. Also, for example, JP-A-59-2949
According to Publication No. 2, in the process of attaching leaded components to the front surface and attaching chip components to the back side of a printed circuit board that has gone through a flow mite process, warped printed circuit boards or printed circuit boards that occur during the chip attachment process are removed. A backup bin is provided to prevent or correct warping of the circuit board.

しかしながら従来技術では、第7図に示すような下反り
のプリント回路基板の場合の反り防止または矯正は可能
であるが、第6図に示すような上反りのプリント回路基
板の場合の反り防止または矯正は不可能なので、上反り
のプリント回路基板では、上述したような不具合を解消
することは出来ない。
However, with the prior art, it is possible to prevent or correct warpage in the case of a downwardly warped printed circuit board as shown in FIG. 7, but it is not possible to prevent or correct warpage in the case of an upwardly warped printed circuit board as shown in FIG. Since correction is impossible, it is not possible to eliminate the above-mentioned problems with a warped printed circuit board.

〔課題を解決しようとする手段〕[Means to try to solve the problem]

そこで前記課題を解決するために本発明は、プリント回
路基板の加熱工程で発生する反りを防止または矯正する
のではなく、反りの発生したプリント回路基板の反り量
を測定し、その反り量にしたがって前記レーザはんだ付
は装置、チップ部品装着検査装置のレーザまたはカメラ
の焦点を自動調節するために、電子部品が装着されたプ
リント回路基板上部に設けた距離検出手段によりプリン
ト回路基板上に一定間隔に配置された測定点と距離検出
手段との間の距離を測定し、そのデータを演算装置の記
憶手段に入力し、入力された各データを前記演算装置に
より処理し、隣接する測定点間のデータの変化量を求め
、変化量が小さく且フ滑らかに変化するデータのみを演
算装置に取り込み、変化量が大きく且つ急激に変化する
データは切り捨て、切り捨てたデータを演算装置に取り
込んだ変化量の小さいデータにより補完することにより
、各測定点のプリン1へ回路基板の反り量を測定する方
法である。
Therefore, in order to solve the above-mentioned problems, the present invention does not prevent or correct the warpage that occurs during the heating process of the printed circuit board, but measures the amount of warpage of the printed circuit board where the warp has occurred, and according to the amount of warpage. In the laser soldering process, in order to automatically adjust the focus of the laser or camera of the chip component mounting inspection device, the laser soldering is performed at regular intervals on the printed circuit board using a distance detection means provided on the top of the printed circuit board on which electronic components are mounted. The distance between the placed measurement point and the distance detection means is measured, the data is input into the storage means of the calculation device, each input data is processed by the calculation device, and the data between adjacent measurement points is Calculate the amount of change in , import only data that has a small amount of change and that changes smoothly into the arithmetic device, discard data that has a large amount of change and change rapidly, and import the truncated data into the arithmetic device. This is a method of measuring the amount of warpage of the circuit board on the printed circuit board 1 at each measurement point by supplementing with data.

〔作用〕[Effect]

本発明は、上述したプリント回路基板反り量測定方法を
採用することにより、レーザはんだ付は装置またはチッ
プ部品装着検査装置のレーザまたはカメラの焦点をプリ
ント回路基板の反り量に合わせて自動調節し、常に最良
の焦点状態に合わせておくことができる。
The present invention adopts the method for measuring the amount of warpage of a printed circuit board as described above, and automatically adjusts the focus of the laser or camera of a laser soldering device or a chip component mounting inspection device according to the amount of warpage of the printed circuit board. You can always maintain the best focus.

〔実施例〕〔Example〕

第1図は、本発明の一実施例のプリント回路基板1の反
り量測定方法を説明する斜視図、第2図はプリント回路
基板1上の反り量を測定する測定点4の配置状態を示す
平面図、第3図は本発明の各測定点4での測定値とその
測定値に基づいて演算装置によりデータ処理を行ったプ
リント回路基板1の反り量を示す模式図である。
FIG. 1 is a perspective view illustrating a method for measuring the amount of warpage of a printed circuit board 1 according to an embodiment of the present invention, and FIG. 2 shows the arrangement of measurement points 4 for measuring the amount of warpage on the printed circuit board 1. The plan view and FIG. 3 are schematic diagrams showing the measured values at each measurement point 4 of the present invention and the amount of warpage of the printed circuit board 1, which is data processed by an arithmetic device based on the measured values.

第1図において、電子部品2の装着されたプリント回路
基41i、1はX−Yテーブル7上に載置され、プリン
ト回路基板1の上部に単数または複数の距離測定手段8
が設置される。距離測定手段8は例えばレーザ式変位セ
ンサ等が用いられ、単数の場合も複数の場合も、X−Y
テーブル7をX方向、X方向に移動させることにより、
第2図に示すようなプリント回路、基板1の全ての測定
点4の上部に距離測定手段8を移動することができ、各
測定点4の上部でプリント回路基板1から測定点4まで
の距離を測定し、そのデータを演算装置の記憶手段に入
力する。
In FIG. 1, a printed circuit board 41i, 1 with electronic components 2 mounted thereon is placed on an X-Y table 7, and one or more distance measuring means 8 are provided on the top of the printed circuit board 1.
will be installed. For example, a laser displacement sensor is used as the distance measuring means 8, and whether it is single or plural,
By moving the table 7 in the X direction,
The distance measuring means 8 can be moved above all the measuring points 4 of the printed circuit board 1 as shown in FIG. is measured and the data is input into the storage means of the arithmetic unit.

プリント回路基板1には電子部品2が装着されており、
また、プリント回路基板1を機器の取りつけ具等に取り
つけるために使用される穴3、あるいはその他の用途に
使用される穴3があけられている。そして、この電子部
品2および穴3が測定点4の位置に来た場合、各測定点
4の位置に対応した距離測定手段8からプリント回路基
板1表面までの距離のデータは第3図の模式図に実線5
で示したような形で得られる。第2図および第3図にお
いて、プリント回路基板1の端部にあり、電子部品2の
装着されていない測定点4を基準測定点4aとし、基準
測定点4aのデータを実線5aとした場合、測定点4に
電子部品2がある場合のデータは、基準測定点4aのデ
ータの実線5aより小さな実線5bとなる。逆に、測定
点4に穴3がある場合のデータは、基準測定点4aのデ
ータの実線5aより大きな実線5cとなる。また、電子
部品2および穴3がなく、プリント回路基板1の反りの
みがある場合は、測定点4のデータは実線5dとなる。
An electronic component 2 is mounted on a printed circuit board 1.
Further, holes 3 are provided to be used for attaching the printed circuit board 1 to a device mount or the like, or for other purposes. When the electronic component 2 and the hole 3 come to the position of the measurement point 4, the data of the distance from the distance measuring means 8 to the surface of the printed circuit board 1 corresponding to the position of each measurement point 4 is shown in the schematic diagram of FIG. Solid line 5 in the figure
It can be obtained in the form shown. In FIGS. 2 and 3, when the measurement point 4 located at the end of the printed circuit board 1 and where no electronic component 2 is mounted is taken as the reference measurement point 4a, and the data of the reference measurement point 4a is taken as the solid line 5a, The data when the electronic component 2 is present at the measurement point 4 becomes a solid line 5b, which is smaller than the solid line 5a of the data at the reference measurement point 4a. Conversely, the data when the hole 3 is present at the measurement point 4 becomes a solid line 5c, which is larger than the solid line 5a of the data at the reference measurement point 4a. Furthermore, when there is no electronic component 2 or hole 3, and there is only warpage of the printed circuit board 1, the data at the measurement point 4 becomes a solid line 5d.

演算装置では記憶手段に入力された各測定点4のデータ
を演算処理を行い、第3図に実線5b、5cで示される
ような隣接する測定点4のデータに比較して変化量が大
きく且つ急激に変化したデータを切り捨て、データを切
り捨てた測定点4のデータを実線5dで示されるような
変化量が小さく且つ滑らかに変化したデータと基準測定
点4aより得た実線5aに示すデータにより補完し、第
3図に点線6の曲線で示したようなプリント回路基板1
全体の反り49得る。そして、点線6の曲線で示される
プリント回路基板1の反り量のデータにより、第4図に
示すレーザはんだ付は装置のレーザ9の焦点および第5
図に示すチップ部品装着検査装置のレンズ10の焦点を
自動調節し、常に最良の焦点状態に合わせる。
The arithmetic device performs arithmetic processing on the data of each measurement point 4 inputted to the storage means, and determines whether the amount of change is large compared to the data of adjacent measurement points 4 as shown by solid lines 5b and 5c in FIG. Data that changed rapidly is discarded, and the data at measurement point 4 where the data was discarded is supplemented with data that changes smoothly and with a small amount of change as shown by solid line 5d, and data shown as solid line 5a obtained from reference measurement point 4a. 3, a printed circuit board 1 as shown by the curve of dotted line 6 in FIG.
A total warpage of 49 is obtained. Based on the data of the amount of warpage of the printed circuit board 1 shown by the curve of the dotted line 6, the laser soldering shown in FIG.
The focus of the lens 10 of the chip component mounting inspection apparatus shown in the figure is automatically adjusted to always maintain the best focus state.

本発明の距離測定手段8は実施例で説明したレーザ式変
位センサ以外に超音波センサ、光学式センサ、静電式セ
ンサ等も使用可能であり、いずれの距離測定手段8を使
用しても同様な結果が得られる。
As the distance measuring means 8 of the present invention, in addition to the laser displacement sensor described in the embodiment, an ultrasonic sensor, an optical sensor, an electrostatic sensor, etc. can also be used, and any distance measuring means 8 can be used in the same way. results.

はカメラの焦点をプリント回路基板の反り量に合わせて
自動調節し、常に最良の焦点状態に合わせることにより
以下に示すような効果が得られる。
automatically adjusts the focus of the camera according to the amount of warpage of the printed circuit board, and by always setting the best focus, the following effects can be obtained.

(1)レーザはんだ付は装置の場合は、レーザのスポッ
トがプリント回路基板上の電子部品のはんだ付はポイン
トに焦点を結び、最適な加熱温度ではんだ付けが行われ
る。また、レーザを斜め上より照射を行ってもレーザの
スポットがプリント回路基板上の加熱ポイントからずれ
ることがなくなり、あわせて高品質の電子機器が生産さ
れる。
(1) In the case of laser soldering equipment, the laser spot focuses on the soldering point of electronic components on the printed circuit board, and soldering is performed at the optimal heating temperature. Furthermore, even if the laser is irradiated obliquely from above, the laser spot will not deviate from the heating point on the printed circuit board, and high-quality electronic devices can be produced.

(2)チップ部品装着検査装置の場合は、カメラの焦点
が合うので、プリント回路基板上のチップ部品の入力画
像の画質が劣化せず、チップ装着状態の検査判定が正確
になる。
(2) In the case of a chip component mounting inspection device, since the camera is focused, the quality of the input image of the chip component on the printed circuit board does not deteriorate, and the inspection judgment of the chip mounting state becomes accurate.

〔発明の効果〕〔Effect of the invention〕

本発明は、上述したプリント回路基板反り量測定方法を
採用することにより、レーザはんだ付は装置またはチッ
プ部品装着検査装置のレーザまた
The present invention employs the method for measuring the amount of warpage of a printed circuit board as described above.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例のプリント回路基板の反り量
測定方法を説明する斜視図、第2図は本発明のプリント
回路基板の反り量を測定するプリント回路基板の測定点
の配置状態をを示す平面図、第3図は本発明の各測定点
での測定値とその測定値に基づいて演算装置によりデー
タ処理を行ったプリント回路基板の反り量を示す模式図
、第4図はレーザはんだ付は装置の斜視図、第5図はチ
ップ部品装着検査装置の斜視図、第6図はプリント回路
基板の上反り状態を示す側面図、第7図はプリント回路
基板の正反り状態を示す側面図である。 1・・・・・プリント回路基板 2・・・・・電子部品 3・・・・・穴 4・・・・・測定点 5・・・・・実線 6・・・・・点線 7・・・・・X−Yテーブル 8・・・・・距離測定手段 9・ ・ ・ ・ ・レーザ 本滑案の測定・唐乞ポを模式図 第3図 レープ゛はんた′イすけ茨置糾視図 第4図 穴3 2電子部品 7X−Yテープ2し 2ド、所菓乞言釉月する斜行訂冴 第1図 本考察のう刷子、膏芝示f千面図 第2図 茨着積査茨置糾祖図 第5図 ? 4二は辷りイ人だ邑伯11面図 第6 図 \ 正反 リ イメ(態、1uす■7う図 M7  図
FIG. 1 is a perspective view illustrating a method for measuring the amount of warpage of a printed circuit board according to an embodiment of the present invention, and FIG. 2 is an arrangement of measurement points on the printed circuit board for measuring the amount of warpage of a printed circuit board of the present invention. FIG. 3 is a schematic diagram showing the measured values at each measurement point of the present invention and the amount of warpage of a printed circuit board processed by a calculation device based on the measured values. FIG. Laser soldering is a perspective view of the equipment, Figure 5 is a perspective view of the chip component mounting inspection equipment, Figure 6 is a side view showing the upwardly warped state of the printed circuit board, and Figure 7 is the right warped state of the printed circuit board. FIG. 1... Printed circuit board 2... Electronic component 3... Hole 4... Measurement point 5... Solid line 6... Dotted line 7... .. Figure 4 Hole 3 2 Electronic parts 7 X-Y tape 2 Diagram 5 of the Ibaraki Keizozu? 42 is a walking person. 11th page of Ebaku Figure 6 \ Separately reversed image (state, 1usu ■ 7U figure M7 figure

Claims (1)

【特許請求の範囲】[Claims]  電子部品が装着されたプリント回路基板に対応する位
置に距離検出手段を設け、該距離検出手段により前記プ
リント回路基板上に一定間隔に配置された測定点と前記
距離検出手段間の距離を測定し、そのデータを演算装置
の記憶手段に入力し、該記憶手段に入力された各データ
を前記演算装置により処理し、前記測定点のデータのう
ちの隣接する前記測定点間のデータの変化量を求め、変
化量が小さく且つ滑らかに変化するデータのみを前記演
算装置に取り込み、変化量が大きく且つ急激に変化する
データは切り捨て、切り捨てたデータを前記演算装置に
取り込んだ変化量の小さいデータにより補完することに
より、前記各測定点のプリント回路基板の反り量を測定
する方法。
Distance detecting means is provided at a position corresponding to a printed circuit board on which electronic components are mounted, and the distance detecting means measures the distance between measurement points arranged at regular intervals on the printed circuit board and the distance detecting means. , the data is input to a storage means of a calculation device, each data input to the storage device is processed by the calculation device, and the amount of change in data between adjacent measurement points among the data of the measurement points is calculated. Only data that changes smoothly and with a small amount of change is taken into the arithmetic unit, data that has a large amount of change and changes rapidly is discarded, and the truncated data is supplemented with data that has a small amount of change taken into the arithmetic unit. A method for measuring the amount of warpage of the printed circuit board at each measurement point.
JP63185530A 1988-07-27 1988-07-27 Warp quantity measuring method for printed circuit board Pending JPH0236306A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63185530A JPH0236306A (en) 1988-07-27 1988-07-27 Warp quantity measuring method for printed circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63185530A JPH0236306A (en) 1988-07-27 1988-07-27 Warp quantity measuring method for printed circuit board

Publications (1)

Publication Number Publication Date
JPH0236306A true JPH0236306A (en) 1990-02-06

Family

ID=16172415

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63185530A Pending JPH0236306A (en) 1988-07-27 1988-07-27 Warp quantity measuring method for printed circuit board

Country Status (1)

Country Link
JP (1) JPH0236306A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0440310A (en) * 1990-06-05 1992-02-10 Dainippon Printing Co Ltd Size measuring instrument for disk cartridge
JPH05189699A (en) * 1992-01-16 1993-07-30 Hino Motors Ltd Collision alarming device
US6343503B1 (en) * 1998-12-08 2002-02-05 Samsung Electronics Co., Ltd. Module appearance inspection apparatus
JP2013071284A (en) * 2011-09-27 2013-04-22 Hitachi High-Tech Instruments Co Ltd Screen printing machine and screen printing method
JP2016090323A (en) * 2014-10-31 2016-05-23 日置電機株式会社 Probing apparatus, circuit board inspection device, and probing method
JP2018200937A (en) * 2017-05-26 2018-12-20 株式会社Fuji Counter substrate operation device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0440310A (en) * 1990-06-05 1992-02-10 Dainippon Printing Co Ltd Size measuring instrument for disk cartridge
JPH05189699A (en) * 1992-01-16 1993-07-30 Hino Motors Ltd Collision alarming device
US6343503B1 (en) * 1998-12-08 2002-02-05 Samsung Electronics Co., Ltd. Module appearance inspection apparatus
JP2013071284A (en) * 2011-09-27 2013-04-22 Hitachi High-Tech Instruments Co Ltd Screen printing machine and screen printing method
JP2016090323A (en) * 2014-10-31 2016-05-23 日置電機株式会社 Probing apparatus, circuit board inspection device, and probing method
JP2018200937A (en) * 2017-05-26 2018-12-20 株式会社Fuji Counter substrate operation device

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