JPH0236152U - - Google Patents

Info

Publication number
JPH0236152U
JPH0236152U JP11379888U JP11379888U JPH0236152U JP H0236152 U JPH0236152 U JP H0236152U JP 11379888 U JP11379888 U JP 11379888U JP 11379888 U JP11379888 U JP 11379888U JP H0236152 U JPH0236152 U JP H0236152U
Authority
JP
Japan
Prior art keywords
sample
cooling
transported
spray chamber
cooled
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11379888U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0731495Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988113798U priority Critical patent/JPH0731495Y2/ja
Publication of JPH0236152U publication Critical patent/JPH0236152U/ja
Application granted granted Critical
Publication of JPH0731495Y2 publication Critical patent/JPH0731495Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Electron Tubes For Measurement (AREA)
  • Electron Sources, Ion Sources (AREA)
JP1988113798U 1988-08-30 1988-08-30 高周波誘導結合プラズマ質量分析計 Expired - Lifetime JPH0731495Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988113798U JPH0731495Y2 (ja) 1988-08-30 1988-08-30 高周波誘導結合プラズマ質量分析計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988113798U JPH0731495Y2 (ja) 1988-08-30 1988-08-30 高周波誘導結合プラズマ質量分析計

Publications (2)

Publication Number Publication Date
JPH0236152U true JPH0236152U (enrdf_load_stackoverflow) 1990-03-08
JPH0731495Y2 JPH0731495Y2 (ja) 1995-07-19

Family

ID=31353958

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988113798U Expired - Lifetime JPH0731495Y2 (ja) 1988-08-30 1988-08-30 高周波誘導結合プラズマ質量分析計

Country Status (1)

Country Link
JP (1) JPH0731495Y2 (enrdf_load_stackoverflow)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS539081A (en) * 1976-07-12 1978-01-27 Oce Van Der Grinten Nv Light conditioning device for gas discharge lamp
JPS58111248A (ja) * 1981-12-23 1983-07-02 Hitachi Ltd 質量分析計の直接試料導入装置
JPS62131359U (enrdf_load_stackoverflow) * 1986-02-13 1987-08-19

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS539081A (en) * 1976-07-12 1978-01-27 Oce Van Der Grinten Nv Light conditioning device for gas discharge lamp
JPS58111248A (ja) * 1981-12-23 1983-07-02 Hitachi Ltd 質量分析計の直接試料導入装置
JPS62131359U (enrdf_load_stackoverflow) * 1986-02-13 1987-08-19

Also Published As

Publication number Publication date
JPH0731495Y2 (ja) 1995-07-19

Similar Documents

Publication Publication Date Title
JPH05251038A (ja) プラズマイオン質量分析装置
JPH0696724A (ja) 誘導結合プラズマ質量分析装置
JP3902380B2 (ja) Ｉｃｐ分析装置
JPH0236152U (enrdf_load_stackoverflow)
JP2003194723A (ja) プラズマトーチ
JPH01176358U (enrdf_load_stackoverflow)
JP2005031020A (ja) 液体導入プラズマトーチ
Ng et al. A dual microwave-induced plasma system with direct solution introduction for atomic emission spectrometry
JPH0366147U (enrdf_load_stackoverflow)
JPS6451259U (enrdf_load_stackoverflow)
JPH0587779A (ja) スプレ―チヤンバ―
JPH03100353U (enrdf_load_stackoverflow)
JPH0542611Y2 (enrdf_load_stackoverflow)
JPH0366146U (enrdf_load_stackoverflow)
JPH0340748U (enrdf_load_stackoverflow)
JPH05190136A (ja) 高周波誘導結合プラズマ分析装置
JPS6436964U (enrdf_load_stackoverflow)
JPH04104449A (ja) 高周波誘導プラズマ質量分析計
JPS6423867U (enrdf_load_stackoverflow)
JPH0340749U (enrdf_load_stackoverflow)
JPH046117Y2 (enrdf_load_stackoverflow)
JPS6451258U (enrdf_load_stackoverflow)
JPH0316656U (enrdf_load_stackoverflow)
JPH0542610Y2 (enrdf_load_stackoverflow)
JPS63308857A (ja) 誘導結合プラズマ・質量分析計