JPH0234505B2 - - Google Patents

Info

Publication number
JPH0234505B2
JPH0234505B2 JP57173334A JP17333482A JPH0234505B2 JP H0234505 B2 JPH0234505 B2 JP H0234505B2 JP 57173334 A JP57173334 A JP 57173334A JP 17333482 A JP17333482 A JP 17333482A JP H0234505 B2 JPH0234505 B2 JP H0234505B2
Authority
JP
Japan
Prior art keywords
circuit
subscriber
test
signal source
switch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57173334A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5963852A (ja
Inventor
Kazuo Saito
Masami Ito
Juichi Morikawa
Ryoichi Himeno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP17333482A priority Critical patent/JPS5963852A/ja
Publication of JPS5963852A publication Critical patent/JPS5963852A/ja
Publication of JPH0234505B2 publication Critical patent/JPH0234505B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
JP17333482A 1982-10-04 1982-10-04 加入者回路用試験引込回路 Granted JPS5963852A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17333482A JPS5963852A (ja) 1982-10-04 1982-10-04 加入者回路用試験引込回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17333482A JPS5963852A (ja) 1982-10-04 1982-10-04 加入者回路用試験引込回路

Publications (2)

Publication Number Publication Date
JPS5963852A JPS5963852A (ja) 1984-04-11
JPH0234505B2 true JPH0234505B2 (ko) 1990-08-03

Family

ID=15958499

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17333482A Granted JPS5963852A (ja) 1982-10-04 1982-10-04 加入者回路用試験引込回路

Country Status (1)

Country Link
JP (1) JPS5963852A (ko)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5498506A (en) * 1978-01-20 1979-08-03 Nec Corp Test system for subscriber lines

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5498506A (en) * 1978-01-20 1979-08-03 Nec Corp Test system for subscriber lines

Also Published As

Publication number Publication date
JPS5963852A (ja) 1984-04-11

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