JPH0233366U - - Google Patents

Info

Publication number
JPH0233366U
JPH0233366U JP11288388U JP11288388U JPH0233366U JP H0233366 U JPH0233366 U JP H0233366U JP 11288388 U JP11288388 U JP 11288388U JP 11288388 U JP11288388 U JP 11288388U JP H0233366 U JPH0233366 U JP H0233366U
Authority
JP
Japan
Prior art keywords
electronic components
electrodes
electrically contacting
testing device
electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11288388U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11288388U priority Critical patent/JPH0233366U/ja
Publication of JPH0233366U publication Critical patent/JPH0233366U/ja
Pending legal-status Critical Current

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Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図はこの考案の一実施例による電子部品の
試験装置を示す正面図、第２図は従来の電子部品
の試験装置を示す正面図、第３図は従来の電極の
斜視図である。 図において、１は電子部品、３は電極、６はヒ
ートブロツクを示す。尚、図中、同一符号は同一
、又は相当部分を示す。 FIG. 1 is a front view of an electronic component testing device according to an embodiment of the invention, FIG. 2 is a front view of a conventional electronic component testing device, and FIG. 3 is a perspective view of a conventional electrode. In the figure, 1 is an electronic component, 3 is an electrode, and 6 is a heat block. In addition, in the figures, the same reference numerals indicate the same or corresponding parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 電子部品の電極に電気的に接触させて電子部品
の電気特性を試験する電子部品の試験装置におい
て、電子部品と電気的に接触させる為の電極の材
質を形状記憶合金で形成したことを特徴とする電
子部品の試験装置。 An electronic component testing device that tests the electrical properties of electronic components by electrically contacting the electrodes of the electronic components, characterized in that the material of the electrodes for electrically contacting the electronic components is made of a shape memory alloy. Test equipment for electronic components.
JP11288388U 1988-08-29 1988-08-29 Pending JPH0233366U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11288388U JPH0233366U (en) 1988-08-29 1988-08-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11288388U JPH0233366U (en) 1988-08-29 1988-08-29

Publications (1)

Publication Number Publication Date
JPH0233366U true JPH0233366U (en) 1990-03-02

Family

ID=31352227

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11288388U Pending JPH0233366U (en) 1988-08-29 1988-08-29

Country Status (1)

Country Link
JP (1) JPH0233366U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2021229714A1 (en) * 2020-05-13 2021-11-18

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2021229714A1 (en) * 2020-05-13 2021-11-18
WO2021229714A1 (en) * 2020-05-13 2021-11-18 三菱電機株式会社 Electronic device inspection device

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