JPH02290058A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPH02290058A
JPH02290058A JP1098015A JP9801589A JPH02290058A JP H02290058 A JPH02290058 A JP H02290058A JP 1098015 A JP1098015 A JP 1098015A JP 9801589 A JP9801589 A JP 9801589A JP H02290058 A JPH02290058 A JP H02290058A
Authority
JP
Japan
Prior art keywords
power supply
substrate
integrated circuit
semiconductor integrated
conductive layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1098015A
Other languages
Japanese (ja)
Inventor
Norihiko Kamiyama
神山 規彦
Katsuyoshi Hayashi
勝義 林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC IC Microcomputer Systems Co Ltd
Original Assignee
NEC IC Microcomputer Systems Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC IC Microcomputer Systems Co Ltd filed Critical NEC IC Microcomputer Systems Co Ltd
Priority to JP1098015A priority Critical patent/JPH02290058A/en
Publication of JPH02290058A publication Critical patent/JPH02290058A/en
Pending legal-status Critical Current

Links

Landscapes

  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To enhance the driving capacity by a method wherein two each of conductive layers for power supply line are contained in the grooves provided on the semiconductor substrate of a semiconductor integrated circuit containing a large power driving transistor(Tr) without increasing the area occupied by a power supply substrate from the driving Tr. CONSTITUTION:Conductive layers 190 for power supply line are formed through dielectric isolation from a P-type silicon substrate 11 of a semiconductor integrated circuit in the grooves provided on the substrate 11 through the intermediary of silicon oxide films 15. Besides, the other conductive layers 191 for power supply line are also formed through dielectric isolation from the conductive layers 190 on the layers 190 in the grooves 20 provided on the substrate 11 so as to be buried in the grooves 20 through the intermediary of the oxide films 15. Then, gate electrodes 12 of CMOS driving transistor(Tr) element, N-type diffused layers 16, an N well 17 and P type diffused layers 18 are respectively formed. In such a constitution, the driving capacity of the semiconductor integrated circuit in increased conductive capacity can be enhanced so that the power supply from the driving Tr element containing the conductive layers 190, 191 may not increase the occupied area by the substrate.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体集積回路に関し、特に大電力駆動トラン
ジスタを含む半導体集積回路に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor integrated circuit, and particularly to a semiconductor integrated circuit including a high power drive transistor.

〔従来の技術〕[Conventional technology]

第2図(a),(b)は従来の半導体集積回路の一例を
示ず部分平面図およびそのY−Y’線断面模式図である
FIGS. 2(a) and 2(b) are a partial plan view and a schematic cross-sectional view taken along the line Y--Y' of the conventional semiconductor integrated circuit.

信号線用導電M23および電源線用導電層29はそれぞ
れシリコン酸化膜25を介してP型シリコン基板21上
に延在ずるように形成される。ここで、P型シリコン基
板21及びNウエル27の領域にゲート電極22に路合
して設けたN型拡散層26及びP型拡散層28により相
補型MOSトランジスタ(以下CMOSトランジスタと
記す)を構成している。
The signal line conductive layer M23 and the power line conductive layer 29 are formed so as to extend on the P-type silicon substrate 21 via the silicon oxide film 25, respectively. Here, a complementary MOS transistor (hereinafter referred to as a CMOS transistor) is constructed by an N-type diffusion layer 26 and a P-type diffusion layer 28 which are provided in the region of the P-type silicon substrate 21 and the N-well 27 in conjunction with the gate electrode 22. are doing.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来の半導体集積回路においては最近大電流に
よる駆動能力の増大が要求されるようになり、これに伴
って電源線用導電層の厚膜化または線幅拡大化が必要と
なり基板占有面積の増大が目立つようになった。しかし
、縦方向の厚みを増大させると、電源線用導電層291
の上部を横断ずる信号線用導電層24には段差か牛しる
ようになるので断線事故が発生し易くなり、また横方向
に幅を拡けると、この断線事故の発生は防げるもののチ
ップ・サイズを大型化せしめる。
In the conventional semiconductor integrated circuits mentioned above, there has recently been a demand for increased drive capability with large currents, and along with this, it is necessary to thicken the conductive layer for the power supply line or increase the line width, resulting in an increase in the area occupied by the substrate. The increase became noticeable. However, if the vertical thickness is increased, the power line conductive layer 291
Since the conductive layer 24 for the signal line that crosses the top of the chip has a step or curve, it is easy for wire breakage to occur.Although increasing the width in the lateral direction can prevent the occurrence of wire breakage, Increase the size.

又駆動トランジスタ素子に供給する電源線用導電WI2
90,291.は、設計上電源専用導電W!29029
]の配置が逆になった場合、そこまでの配線の引き廻し
が必要となりチツプ ザイズを大型化せしめるので高集
積化が困難となる。
Also, conductive wire WI2 for power supply line to supply to the drive transistor element.
90,291. Is a conductive W only for power supply by design! 29029
] If the layout is reversed, it will be necessary to route the wiring to that point, increasing the chip size and making it difficult to achieve high integration.

本発明の目的は、信号線用導電層の信頼性および高集積
化を向上させる大電流容量の電源線用導電層を備えた半
導体集積回路を提供することである。
An object of the present invention is to provide a semiconductor integrated circuit including a conductive layer for a power supply line with a large current capacity that improves the reliability and high integration of the conductive layer for a signal line.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の半導体集積回路は、半導体基板と、前記半導体
基板」二に形成される駆動トランジスタ素子と、前記ト
ランジスタ素子の周辺に配置される信号線用導電層およ
び電源線用導電層とを含んで成り、前記電源線用導電層
は前記1・ランジスタ素子形成領域の近傍の半導体基板
上に設けた講内に、前記半導体基板と第1の絶縁膜て絶
縁分離され且つ第2の絶縁膜を介して2層に形成される
A semiconductor integrated circuit of the present invention includes a semiconductor substrate, a drive transistor element formed on the semiconductor substrate, and a signal line conductive layer and a power line conductive layer disposed around the transistor element. The conductive layer for the power supply line is insulated and separated from the semiconductor substrate by a first insulating film, and is insulated from the semiconductor substrate by a second insulating film, and is insulated from the semiconductor substrate in a region provided on the semiconductor substrate near the transistor element formation region. It is formed into two layers.

〔実施例〕〔Example〕

次に、本発明について図面を参照して説明する第1図(
a).(b)は本発明の=一実施例の部分平面図および
そのx−x′線断面模式は1てある。
Next, FIG. 1 (
a). (b) is a partial plan view of one embodiment of the present invention and a schematic cross-sectional view taken along the line xx'.

第1図(a).(b)に示すように、本発明の半導体集
積回路は、電源線用導電層190をP型シリコン基板1
コ十.に設けた講20内にシリコン酸化膜]5を介しシ
リコン基板1−1と絶縁分離して形成する。電源線用導
電層191は、P型シリコン基板]]上に設けた溝20
内にある電源線用導電層190上にシリコン酸化膜15
を介し′ル:源線用導電層190と絶縁分離して講20
を埋めるように形成する。また12.16.17および
18はC−MOS駆動トランジスタ素子のゲート電極、
N型拡散層、NウェルおよびP型拡散層をそれぞれ示し
、従来例と同様にしてCMOSトランジスタを構成する
。このように電源線用導電膜層を基板内に収納した配線
構造では、大電流駆動に耐え得るように導電膜厚または
膜層幅を基板上の他の横造物とは無関係に大きく設定て
きる。又異なった電源線用導電膜層が必ず存在するため
、駆動トランジスタの位置,方向を気にせず容易に供給
することができる。
Figure 1(a). As shown in (b), in the semiconductor integrated circuit of the present invention, a conductive layer 190 for a power supply line is formed on a P-type silicon substrate 1.
Ko ten. A silicon oxide film 5 is formed in the groove 20 provided in the silicon substrate 1-1 to be insulated and isolated from the silicon substrate 1-1. The conductive layer 191 for the power supply line is a groove 20 provided on a P-type silicon substrate]
A silicon oxide film 15 is formed on the conductive layer 190 for the power supply line inside the
Through the conductive layer 190 for the source line and insulated and separated from the conductive layer 190.
Form to fill. 12.16.17 and 18 are gate electrodes of C-MOS drive transistor elements;
An N-type diffusion layer, an N-well, and a P-type diffusion layer are shown, respectively, and a CMOS transistor is constructed in the same manner as in the conventional example. In such a wiring structure in which a conductive film layer for a power line is housed within a substrate, the conductive film thickness or film layer width can be set large regardless of other horizontal structures on the board in order to withstand large current drive. . Furthermore, since there are always different conductive film layers for power supply lines, supply can be easily performed without worrying about the position and direction of the drive transistor.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明によれば半導体基板に設け
た溝内に少なくとも2本からなる電源線用導電層が収納
され駆動トランジスタからの電源が基板占有面積を拡大
することなく通電能力が高められるので、駆動能力の著
しく大きな半導体集積回路の高集積化をきわめて容易に
達成することができる。
As explained above, according to the present invention, a conductive layer for power supply lines consisting of at least two wires is housed in a groove provided in a semiconductor substrate, so that the power supply from the drive transistor can be increased in current carrying capacity without expanding the area occupied by the substrate. Therefore, it is possible to extremely easily achieve high integration of semiconductor integrated circuits with extremely large driving capabilities.

図(a>,(b)は従来の半導体集積回路の部分平面図
およびそのY−Y′線断面模式図である。
Figures (a) and (b) are a partial plan view of a conventional semiconductor integrated circuit and a schematic cross-sectional view taken along the line Y-Y'.

1]..2].・・P型シリコン基板、1.2.22・
ゲート電極、1.3, 23,  1.4., 2/I
・・・信号線用導電層、15,25・・・シリコン酸化
膜、1626・・N型拡散層、17.27・・Nウェル
、18,2 s −.− p型拡散層、]−90.1.
91.  290  291−・・・電源線用導電層、
2o・・溝。
1]. .. 2].・・P-type silicon substrate, 1.2.22・
Gate electrode, 1.3, 23, 1.4. , 2/I
...Conductive layer for signal line, 15,25...Silicon oxide film, 1626...N type diffusion layer, 17.27...N well, 18,2 s -. - p-type diffusion layer, ]-90.1.
91. 290 291-- Conductive layer for power supply line,
2o...groove.

代理人 弁理士  内 原  習Agent: Patent Attorney: Shu Uchihara

【図面の簡単な説明】[Brief explanation of drawings]

Claims (1)

【特許請求の範囲】[Claims] 半導体基板の一主面に設けた相補型MOSトランジスタ
を有する半導体集積回路において、前記相補型トランジ
スタの近傍の前記半導体基板に設けた溝と、前記溝の内
側表面に設けた絶縁膜と、前記第1の絶縁膜の表面に設
けた第1の導電層と、前記第1の導電層の表面に設けた
第2の絶縁膜と、前記第2の絶縁膜の表面に設けた第2
の導電層とを備えて前記相補型トランジスタの電源配線
を形成することを特徴とする半導体集積回路。
In a semiconductor integrated circuit having a complementary MOS transistor provided on one main surface of a semiconductor substrate, a groove provided in the semiconductor substrate near the complementary transistor, an insulating film provided on an inner surface of the groove, a first conductive layer provided on the surface of the first insulating film; a second insulating film provided on the surface of the first conductive layer; and a second conductive layer provided on the surface of the second insulating film.
A semiconductor integrated circuit comprising a conductive layer to form a power supply wiring for the complementary transistor.
JP1098015A 1989-04-17 1989-04-17 Semiconductor integrated circuit Pending JPH02290058A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1098015A JPH02290058A (en) 1989-04-17 1989-04-17 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1098015A JPH02290058A (en) 1989-04-17 1989-04-17 Semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPH02290058A true JPH02290058A (en) 1990-11-29

Family

ID=14207996

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1098015A Pending JPH02290058A (en) 1989-04-17 1989-04-17 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPH02290058A (en)

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