JPH022683U - - Google Patents

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Publication number
JPH022683U
JPH022683U JP7957388U JP7957388U JPH022683U JP H022683 U JPH022683 U JP H022683U JP 7957388 U JP7957388 U JP 7957388U JP 7957388 U JP7957388 U JP 7957388U JP H022683 U JPH022683 U JP H022683U
Authority
JP
Japan
Prior art keywords
timing
output
pattern
adjusts
comparator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7957388U
Other languages
Japanese (ja)
Other versions
JP2515914Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7957388U priority Critical patent/JP2515914Y2/en
Publication of JPH022683U publication Critical patent/JPH022683U/ja
Application granted granted Critical
Publication of JP2515914Y2 publication Critical patent/JP2515914Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図はこの考案の実施例を示すブロツク図、
第２図は従来のＩＣ試験装置のタイミング校正装
置を示すブロツク図である。 Figure 1 is a block diagram showing an embodiment of this invention.
FIG. 2 is a block diagram showing a conventional timing calibration device for an IC tester.

Claims (1)

【実用新案登録請求の範囲】 印加パターン出力端子の出力パターンをコンパ
レータで基準レベルと比較し、その比較結果を基
準タイミングで論理比較器へ出力して期待値と比
較し、その比較結果に応じて発生パターンのタイ
ミングを調整するＩＣ試験装置のタイミング校正
装置において、 上記論理比較器の出力を計数するカウンタが設
けられ、その計数値に応じて上記発生パターンの
タイミングを調整するようにしたＩＣ試験装置の
タイミング校正装置。[Claim for Utility Model Registration] The output pattern of the applied pattern output terminal is compared with a reference level by a comparator, the comparison result is output to a logic comparator at the reference timing and compared with the expected value, and according to the comparison result, A timing calibration device for an IC testing device that adjusts the timing of a generated pattern, wherein the IC testing device is provided with a counter that counts the output of the logic comparator, and adjusts the timing of the generated pattern according to the counted value. timing calibration device.
JP7957388U 1988-06-15 1988-06-15 IC tester timing calibration device Expired - Lifetime JP2515914Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7957388U JP2515914Y2 (en) 1988-06-15 1988-06-15 IC tester timing calibration device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7957388U JP2515914Y2 (en) 1988-06-15 1988-06-15 IC tester timing calibration device

Publications (2)

Publication Number Publication Date
JPH022683U true JPH022683U (en) 1990-01-09
JP2515914Y2 JP2515914Y2 (en) 1996-11-06

Family

ID=31304443

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7957388U Expired - Lifetime JP2515914Y2 (en) 1988-06-15 1988-06-15 IC tester timing calibration device

Country Status (1)

Country Link
JP (1) JP2515914Y2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002156414A (en) * 2000-11-16 2002-05-31 Advantest Corp Semiconductor device tester with timing calibration function
JP2003512630A (en) * 1999-10-19 2003-04-02 テラダイン・インコーポレーテッド Improved test and calibration circuit and method in automatic test equipment
JP4617401B1 (en) * 2009-09-10 2011-01-26 株式会社アドバンテスト Test apparatus and test method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012149955A (en) * 2011-01-18 2012-08-09 Yokogawa Electric Corp Semiconductor testing device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003512630A (en) * 1999-10-19 2003-04-02 テラダイン・インコーポレーテッド Improved test and calibration circuit and method in automatic test equipment
JP4689125B2 (en) * 1999-10-19 2011-05-25 テラダイン・インコーポレーテッド Improved test and calibration circuit and method in automatic test equipment
JP2002156414A (en) * 2000-11-16 2002-05-31 Advantest Corp Semiconductor device tester with timing calibration function
JP4617401B1 (en) * 2009-09-10 2011-01-26 株式会社アドバンテスト Test apparatus and test method
JP2011059110A (en) * 2009-09-10 2011-03-24 Advantest Corp Test apparatus and test method

Also Published As

Publication number Publication date
JP2515914Y2 (en) 1996-11-06

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