JPH0225163Y2 - - Google Patents
Info
- Publication number
- JPH0225163Y2 JPH0225163Y2 JP1980010534U JP1053480U JPH0225163Y2 JP H0225163 Y2 JPH0225163 Y2 JP H0225163Y2 JP 1980010534 U JP1980010534 U JP 1980010534U JP 1053480 U JP1053480 U JP 1053480U JP H0225163 Y2 JPH0225163 Y2 JP H0225163Y2
- Authority
- JP
- Japan
- Prior art keywords
- output
- flaw
- signal
- flaw detection
- frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 claims description 36
- 238000004364 calculation method Methods 0.000 description 11
- 238000012360 testing method Methods 0.000 description 9
- 238000005070 sampling Methods 0.000 description 8
- 238000009826 distribution Methods 0.000 description 7
- 238000001228 spectrum Methods 0.000 description 7
- 230000008859 change Effects 0.000 description 6
- 238000004458 analytical method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000005284 excitation Effects 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 230000003321 amplification Effects 0.000 description 2
- 238000000605 extraction Methods 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 238000010183 spectrum analysis Methods 0.000 description 2
- 230000004913 activation Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1980010534U JPH0225163Y2 (US20040232935A1-20041125-M00001.png) | 1980-01-31 | 1980-01-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1980010534U JPH0225163Y2 (US20040232935A1-20041125-M00001.png) | 1980-01-31 | 1980-01-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS56112669U JPS56112669U (US20040232935A1-20041125-M00001.png) | 1981-08-31 |
| JPH0225163Y2 true JPH0225163Y2 (US20040232935A1-20041125-M00001.png) | 1990-07-11 |
Family
ID=29607188
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1980010534U Expired JPH0225163Y2 (US20040232935A1-20041125-M00001.png) | 1980-01-31 | 1980-01-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0225163Y2 (US20040232935A1-20041125-M00001.png) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4982384A (US20040232935A1-20041125-M00001.png) * | 1972-12-09 | 1974-08-08 | ||
| JPS53140088A (en) * | 1977-05-13 | 1978-12-06 | Mitsubishi Heavy Ind Ltd | Flaw detection using eddy current |
-
1980
- 1980-01-31 JP JP1980010534U patent/JPH0225163Y2/ja not_active Expired
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4982384A (US20040232935A1-20041125-M00001.png) * | 1972-12-09 | 1974-08-08 | ||
| JPS53140088A (en) * | 1977-05-13 | 1978-12-06 | Mitsubishi Heavy Ind Ltd | Flaw detection using eddy current |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS56112669U (US20040232935A1-20041125-M00001.png) | 1981-08-31 |
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