JPH0224046B2 - - Google Patents

Info

Publication number
JPH0224046B2
JPH0224046B2 JP56185845A JP18584581A JPH0224046B2 JP H0224046 B2 JPH0224046 B2 JP H0224046B2 JP 56185845 A JP56185845 A JP 56185845A JP 18584581 A JP18584581 A JP 18584581A JP H0224046 B2 JPH0224046 B2 JP H0224046B2
Authority
JP
Japan
Prior art keywords
frequency
oscillation
piezoelectric
piece
oscillating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56185845A
Other languages
Japanese (ja)
Other versions
JPS5887907A (en
Inventor
Yoshiaki Karaki
Heiji Kurata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Matsushima Kogyo KK
Original Assignee
Matsushima Kogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushima Kogyo KK filed Critical Matsushima Kogyo KK
Priority to JP18584581A priority Critical patent/JPS5887907A/en
Publication of JPS5887907A publication Critical patent/JPS5887907A/en
Publication of JPH0224046B2 publication Critical patent/JPH0224046B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H3/00Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
    • H03H3/007Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
    • H03H3/02Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
    • H03H3/04Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks for obtaining desired frequency or temperature coefficient

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)

Description

【発明の詳細な説明】 本発明は、圧電振動子の蒸着周波数調整装置に
関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a deposition frequency adjustment device for a piezoelectric vibrator.

従来の音叉型水晶振動子の蒸着周波数調整方法
を第1図で説明する。真空室において先ず蒸着源
1を熱し、金属蒸気2を発生させマスク3で絞
り、音叉型水晶発振片(以下、発振片)4aの先
端に金属薄膜として付着させる(質量付加)。発
振回路5により単独発振している発振片4aは、
この質量付加により周波数が変化し、基準周波数
に達する。基準周波数に達すると、検出回路(カ
ウンター)6、制御回路7が作動し、遮閉板8が
金属蒸気2の発振片4aへの金属蒸気を遮断し、
周波数調整を終了する。発振片4,4a,4b…
…4nは蒸着源1の周囲を一定の距離で取囲んで
おり、周波数調整が終了と同時に1ピツチ進むよ
うになつている。同図において、4aは周波数調
整中の発振片、4b以後は周波数未調整の発振片
を示している。
A conventional method for adjusting the deposition frequency of a tuning fork type crystal resonator will be explained with reference to FIG. First, a vapor deposition source 1 is heated in a vacuum chamber to generate metal vapor 2, which is squeezed by a mask 3 and is deposited as a metal thin film on the tip of a tuning fork-shaped crystal oscillation piece (hereinafter referred to as an oscillation piece) 4a (mass addition). The oscillating piece 4a which is oscillating independently by the oscillating circuit 5 is
This mass addition causes the frequency to change and reach the reference frequency. When the reference frequency is reached, the detection circuit (counter) 6 and the control circuit 7 are activated, and the shielding plate 8 blocks the metal vapor 2 from flowing into the oscillation piece 4a.
Finish frequency adjustment. Oscillating pieces 4, 4a, 4b...
...4n surrounds the evaporation source 1 at a constant distance, and advances by one pitch at the same time as frequency adjustment is completed. In the figure, 4a indicates an oscillation piece whose frequency is being adjusted, and 4b and subsequent oscillation pieces show oscillation pieces whose frequency is not yet adjusted.

以上に述べた従来の蒸着周波数調整方法によれ
ば、1ピツチを1サイクルとすれば、1サイクル
に発振片1本単位の加工方法であり効率が低く、
さらには、蒸着用金属が銀(Ag)などの高価な
材料を使用しているにも拘らず、金属の蒸発領域
に1本の発振片を設けるだけであり(換言すれ
ば、発振片1本でも10本でも、消耗される金属蒸
気は同量ということになる。)、極めてムダの多い
方法であつた。もち論、発振片以外に付着する金
属を回収して再使用はするが、回収し再使用に要
する時間はムダになる。
According to the conventional evaporation frequency adjustment method described above, if one pitch is one cycle, one oscillation piece is processed in one cycle, and the efficiency is low.
Furthermore, even though the metal used for vapor deposition is an expensive material such as silver (Ag), only one oscillating piece is provided in the metal evaporation area (in other words, only one oscillating piece is provided in the metal evaporation area). However, even with 10 tubes, the same amount of metal vapor would be consumed.) This was an extremely wasteful method. Of course, the metal that adheres to things other than the oscillating piece can be collected and reused, but the time required to collect and reuse is wasted.

本発明は、以上の欠点を解消するものであり、
本発明の実施例を第2図の説明図により、以下詳
細に説明する。
The present invention solves the above drawbacks,
An embodiment of the present invention will be described in detail below with reference to the explanatory diagram of FIG.

第2図において、本発明は蒸着源10より蒸発
する金属蒸気11の蒸気領域内に複数個の発振片
12(12a〜12n個で通常は連結リング状に
230〜250本)を配し、マスク13に設ける開口1
4,15により絞られる金属蒸気の蒸発領域内
に、開口14の領域には先発する発振片12a
を、開口15の領域には後発の発振片12b,1
2cを配し、先発する発振片12aが設定周波数
に入つたときに、検出回路17により制御回路を
作動させ、遮閉板19により発振片12a側の金
属蒸気を遮断し、発振回路16aを明けると同時
に、後発する発振片12b,12c側の金属蒸気
を遮断し、発振片1本分(1ピツチ)すすませ
る、以上からなる圧電振動子の蒸着周波数調整方
法である。
In FIG. 2, the present invention includes a plurality of oscillating pieces 12 (12a to 12n, usually in a connected ring shape) in a vapor region of metal vapor 11 evaporated from a vapor deposition source 10.
230 to 250) and the opening 1 provided in the mask 13.
In the evaporation area of the metal vapor narrowed down by the openings 14 and 15, the oscillating piece 12a is placed in the opening 14.
In the area of the opening 15, the subsequent oscillation pieces 12b, 1
2c, when the leading oscillating piece 12a reaches the set frequency, the detection circuit 17 activates the control circuit, the shielding plate 19 blocks the metal vapor on the oscillating piece 12a side, and the oscillating circuit 16a is opened. At the same time, the metal vapor on the side of the oscillating pieces 12b and 12c generated later is blocked, and the vapor deposition frequency is adjusted by one oscillating piece (one pitch).

本発明はまた、以上の製造方法に関し、真空室
下において、蒸着源10を中心にリング状に同一
ピツチで配設された発振片12,12a〜12n
と、該発振片12と該蒸着源10との中間に設け
るマスク板13と、該蒸着源10よりの金属蒸気
11を遮断する遮閉板19と、前記発振片12を
発振させながら設定周波数を検出する発振回路1
6および検出回路17と、該発振片12が設定値
に入つたときに遮閉板19を作動させ、金属蒸気
を遮断させるための制御回路18を有する蒸着周
波数調整装置の、前記マスク板19には開口1
4,15を有し、該開口14,15のうち1個所
の開口14は発振片12a1本分の蒸着面積を有
し、他の開口15は発振片12b,12cの2本
分の蒸着面積を有しており、発振片12aには単
独に発振回路16a、検出回路17a、制御回路
18a、遮閉板19aを、発振片12bおよび発
振片12cには各々単独に発振回路16b,16
cと検出回路17b,17cを、発振片12b,
12c共有に制御回路18a、遮閉板19bとを
設ける、以上の構成からなる蒸着周波数調整装置
に関するものである。
The present invention also relates to the above manufacturing method, in which the oscillating pieces 12, 12a to 12n are arranged in a ring shape at the same pitch around the vapor deposition source 10 in a vacuum chamber.
A mask plate 13 is provided between the oscillating piece 12 and the evaporation source 10, a shielding plate 19 blocks metal vapor 11 from the evaporating source 10, and a set frequency is set while the oscillating piece 12 is oscillated. Oscillation circuit 1 to detect
6 and a detection circuit 17, and a control circuit 18 for operating a shielding plate 19 to shut off metal vapor when the oscillation piece 12 reaches a set value. is opening 1
4 and 15, one of the openings 14 and 15 has a vapor deposition area for one oscillation piece 12a, and the other opening 15 has a vapor deposition area for two oscillation pieces 12b and 12c. The oscillating piece 12a has an oscillating circuit 16a, a detection circuit 17a, a control circuit 18a, and a shielding plate 19a, and the oscillating piece 12b and 12c each have an oscillating circuit 16b, 16 independently.
c and the detection circuits 17b, 17c, the oscillation piece 12b,
The present invention relates to a vapor deposition frequency adjustment device having the above configuration, in which a control circuit 18a and a shielding plate 19b are provided in common with 12c.

本発明の圧電振動子の具体的な蒸着周波数調整
方法の実施例を以上の蒸着周波数調整装置を用い
て説明すると、発振片12aが、マスク板13の
開口14の前にくると、発振回路16aが発振片
12aに接続され、発振片12b,12cはそれ
ぞれ発振回路16b,16cに接続される。発振
片12aは発振回路16aにより発振し、発振回
路16aの出力は検出回路17aで検出され、発
振周波数が設定周波数以上の周波数の時は制御回
路18aにより遮閉板19aが開かれ周波数調整
がされる。発振片12b,12cも発振回路16
b,16cにより発振し検出回路17b,17c
により制御回路18bに信号が送られる。制御回
路18bは発振片12b,12cのいずれも発振
周波数が第2の設定周波数(先の設定周波数より
若干高く設定され、あとで周波数調整ができるよ
うにしてある。)以上の時は遮閉板19bが開か
れる。発振片12aが周波数調整され設定周波数
になると遮閉板19aが閉じ、同時に19bも閉
じ発振回路16a,16bが接続を解かれ、発振
片1本分(1ピツチ)進ませ次の12bの周波数
調整が行われる。ここで発振片12aが当初から
設定周波数以下の時は不良であるので遮閉板19
aは開かず周波数調整はされない。また、発振片
12b,12cが当初から第2の設定周波数以下
であるときは遮閉板19bは開かず、もしくは発
振片12aが周波数調整される以前に先に第2の
設定周波数に達した時はその時点で遮閉板19b
が閉じてしまい、発振片12b,12cが過剰に
周波数調整されて不良となるのを防ぐようになつ
ている。以上に示すように発振片12aが周波数
調整されている間に同時に発振片12b,12c
にも蒸着することで、発振片12b,12cの予
備周波数調整ができる。
A specific embodiment of the method for adjusting the evaporation frequency of a piezoelectric vibrator of the present invention will be described using the above-mentioned evaporation frequency adjustment apparatus. When the oscillation piece 12a comes in front of the opening 14 of the mask plate 13, is connected to the oscillating piece 12a, and the oscillating pieces 12b and 12c are connected to oscillating circuits 16b and 16c, respectively. The oscillation piece 12a is oscillated by an oscillation circuit 16a, the output of the oscillation circuit 16a is detected by a detection circuit 17a, and when the oscillation frequency is higher than the set frequency, the control circuit 18a opens the shielding plate 19a to adjust the frequency. Ru. The oscillation pieces 12b and 12c also have an oscillation circuit 16.
Detection circuits 17b, 17c are oscillated by b, 16c.
A signal is sent to the control circuit 18b. The control circuit 18b operates as a shield plate when the oscillation frequency of both the oscillating pieces 12b and 12c is equal to or higher than the second set frequency (which is set slightly higher than the previous set frequency so that the frequency can be adjusted later). 19b will be opened. When the frequency of the oscillating piece 12a is adjusted and reaches the set frequency, the shielding plate 19a closes, and at the same time 19b also closes and the oscillating circuits 16a and 16b are disconnected, advancing one oscillating piece (1 pitch) and adjusting the frequency of the next 12b. will be held. Here, if the oscillating piece 12a is below the set frequency from the beginning, it is defective, so the shielding plate 19
A is not opened and frequency adjustment is not performed. Further, when the oscillating pieces 12b and 12c are below the second set frequency from the beginning, the shielding plate 19b does not open, or when the oscillating piece 12a reaches the second set frequency first before the frequency is adjusted. At that point, the shielding plate 19b
This is to prevent the oscillating pieces 12b and 12c from becoming defective due to excessive frequency adjustment. As shown above, while the frequency of the oscillating piece 12a is being adjusted, the oscillating pieces 12b and 12c are
Preliminary frequency adjustment of the oscillating pieces 12b and 12c can be performed by vapor-depositing the oscillator on the oscillating pieces 12b and 12c.

以上、本発明によれば、発明者のデータによつ
ても従来に比較して、加工能力として60%の向
上、金属蒸気の使用として1/2の節約を図ること
ができる。なお、本発明は、発振片が金属蒸気の
蒸発領域内に配設されれば、実施例の3本に限ら
ず、他の応用は可能である。また、発振片の種類
も、実施例の音叉型水晶発振片に限ることなく、
本発明の製造方法、装置の実施は可能である。
As described above, according to the present invention, according to the inventor's data, compared to the conventional method, processing capacity can be improved by 60%, and metal vapor usage can be reduced by 1/2. It should be noted that the present invention is not limited to the three oscillation pieces in the embodiment, but can be applied in other ways as long as the oscillation pieces are disposed within the metal vapor evaporation region. Furthermore, the type of oscillation piece is not limited to the tuning fork type crystal oscillation piece of the embodiment.
It is possible to implement the manufacturing method and apparatus of the present invention.

また本発明によれば、蒸着される全ての発振片
の発振周波数を測定し監視するので、蒸着しすぎ
による周波数調整不良の発生がない。
Further, according to the present invention, since the oscillation frequencies of all the oscillation pieces to be vapor-deposited are measured and monitored, there is no occurrence of frequency adjustment failure due to excessive vapor-deposition.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の周波数調整方法の実施例を示す
説明図。第2図は本発明の実施例を示す説明図。 1……蒸着源、2……金属蒸気、3……マス
ク、4……発振片、5……発振回路、6……検出
回路、7……制御回路、8……遮閉板、10……
蒸着源、11……金属蒸気、12……発振片、1
3……マスク、14,15……開口、16……発
振回路、17……検出回路、18……制御回路、
19……遮閉板。
FIG. 1 is an explanatory diagram showing an example of a conventional frequency adjustment method. FIG. 2 is an explanatory diagram showing an embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... Vapor deposition source, 2... Metal vapor, 3... Mask, 4... Oscillation piece, 5... Oscillation circuit, 6... Detection circuit, 7... Control circuit, 8... Shielding plate, 10... …
Vapor deposition source, 11... Metal vapor, 12... Oscillation piece, 1
3... Mask, 14, 15... Aperture, 16... Oscillation circuit, 17... Detection circuit, 18... Control circuit,
19...Blocking plate.

Claims (1)

【特許請求の範囲】 1 蒸着源を中心にリング状に同一ピツチで配設
された圧電発振片と、該圧電発振片と蒸着源との
中間に設けるマスク板と、該蒸着源よりの金属蒸
気を遮断する遮閉板と、前記圧電発振片を発振さ
せながら設定周波数を検出する発振回路および検
出回路と、圧電発振片が設定値に入つたときに遮
閉板を作動させ金属蒸気を遮断する制御回路とを
有する圧電発振片の蒸着周波数調整装置におい
て、 前記マスク板には少なくとも2箇所の開口を有
し、該開口のうち1箇所は圧電発振片1本分の蒸
着面積を先発側に設け、後発側の他の開口には、
少なくとも圧電発振片2本分の蒸着面積を設けて
なり、 先発側の圧電発振片には単独に第1発振回路、
前記圧電発振片の周波数が第1周波数になつたこ
とを検出する第1検出回路、及び前記第1検出回
路の検出信号にもとづいて前記圧電発振片の周波
数が前記第1周波数以上のとき前記先発側の開口
を開き、前記第1周波数以下のとき前記先発側の
開口を閉じるよう第1遮閉板を制御する第1制御
回路を接続してなり、 後発側の複数の圧電発振片には個々の第2発振
回路、前記圧電発振片の周波数が前記第1周波数
より高い第2周波数になつたことを検出する第2
検出回路を接続するとともに前記第2検出回路の
検出信号にもとづいて前記後発側の複数の圧電発
振片の周波数のすべてが前記第2周波数以上のと
き前記後発側の開口を開き、いずれか1本の圧電
発振片の周波数が前記第2周波数以下のとき前記
後発側の開口を閉じるよう前記第2遮閉板を制御
する共通の第2制御回路を接続してなる圧電振動
子の蒸着周波数調整装置。
[Scope of Claims] 1 Piezoelectric oscillating pieces arranged in a ring shape at the same pitch around the evaporation source, a mask plate provided between the piezoelectric oscillating pieces and the evaporation source, and a metal vapor emitted from the evaporation source. an oscillation circuit and a detection circuit that detect a set frequency while oscillating the piezoelectric oscillation piece; and a shielding plate that operates to cut off metal vapor when the piezoelectric oscillation piece reaches the set value. In the vapor deposition frequency adjusting device for piezoelectric oscillation pieces having a control circuit, the mask plate has at least two openings, one of the openings having a vapor deposition area for one piezoelectric oscillation piece on the starting side. , other openings on the later side include;
A vapor deposition area for at least two piezoelectric oscillation pieces is provided, and the first piezoelectric oscillation piece has a first oscillation circuit,
a first detection circuit that detects that the frequency of the piezoelectric oscillation piece has reached a first frequency; and a first detection circuit that detects that the frequency of the piezoelectric oscillation piece is equal to or higher than the first frequency based on a detection signal of the first detection circuit; A first control circuit is connected to the first control circuit for controlling a first shielding plate to open an opening on the first side and close an opening on the first side when the frequency is lower than the first frequency, and a plurality of piezoelectric oscillation pieces on the second side are individually connected to each other. a second oscillation circuit for detecting that the frequency of the piezoelectric oscillation piece has reached a second frequency higher than the first frequency;
When a detection circuit is connected and all of the frequencies of the plurality of piezoelectric oscillation pieces on the second generation side are equal to or higher than the second frequency based on the detection signal of the second detection circuit, the opening on the second generation side is opened; A deposition frequency adjustment device for a piezoelectric vibrator, which is connected to a common second control circuit that controls the second shielding plate to close the opening on the latter side when the frequency of the piezoelectric oscillating piece is equal to or lower than the second frequency. .
JP18584581A 1981-11-19 1981-11-19 Method and apparatus for adjusting vapor-deposition frequency for piezoelectric oscillator Granted JPS5887907A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18584581A JPS5887907A (en) 1981-11-19 1981-11-19 Method and apparatus for adjusting vapor-deposition frequency for piezoelectric oscillator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18584581A JPS5887907A (en) 1981-11-19 1981-11-19 Method and apparatus for adjusting vapor-deposition frequency for piezoelectric oscillator

Publications (2)

Publication Number Publication Date
JPS5887907A JPS5887907A (en) 1983-05-25
JPH0224046B2 true JPH0224046B2 (en) 1990-05-28

Family

ID=16177880

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18584581A Granted JPS5887907A (en) 1981-11-19 1981-11-19 Method and apparatus for adjusting vapor-deposition frequency for piezoelectric oscillator

Country Status (1)

Country Link
JP (1) JPS5887907A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51118981A (en) * 1975-04-11 1976-10-19 Seiko Instr & Electronics Ltd Frequency regulator of bending piez/-electric oscillator
JPS5375887A (en) * 1976-12-17 1978-07-05 Seiko Instr & Electronics Ltd Frequency adjuster of vibrator

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51118981A (en) * 1975-04-11 1976-10-19 Seiko Instr & Electronics Ltd Frequency regulator of bending piez/-electric oscillator
JPS5375887A (en) * 1976-12-17 1978-07-05 Seiko Instr & Electronics Ltd Frequency adjuster of vibrator

Also Published As

Publication number Publication date
JPS5887907A (en) 1983-05-25

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